Smart sampling for block family scan
A system can include a memory device and a processing device to perform operations that include determining a calibration scan frequency based on an amount of elapsed time since a previous write operation performed on the memory device, determining, based on the calibration scan frequency, whether one or more scan criteria are satisfied, responsive to determining that the one or more scan criteria are satisfied, identifying one or more block families, and calibrating one or more bin pointers of each of the identified block families, wherein the calibrating comprises: for each of the identified block families, updating each of the one or more bin pointers of the identified block family based on a data state metric of at least one block of the identified block family.
1. A system comprising:
a memory device; and
a processing device, operatively coupled with the memory device, to perform operations comprising:
determining a calibration scan frequency based on an amount of elapsed time since a previous write operation was performed on the memory device;
determining, based on the calibration scan frequency, whether one or more scan criteria are satisfied;
responsive to determining that the one or more scan criteria are satisfied, identifying one or more block families; and
scanning one or more bin pointers of each of the identified one or more block families, wherein the scanning the one or more bin pointers comprises: for each of the identified one or more block families, updating each of the one or more bin pointers of the identified block family based on a data state metric of at least one block of the identified block family.
2. The system of claim 1 , the operations further comprising:
identifying at least one second block family of the identified block families, the at least one second block family having an error rate greater than a threshold error rate; and
prioritizing the at least one second block family in the scanning.
3. The system of claim 2 , wherein prioritizing the at least one second block family causes one or more bin pointers of the at least one second block family to be scanned prior to scanning one or more bin pointers of at least one other block family of the identified block families.
4. The system of claim 2 , wherein prioritizing the at least one second block family comprises:
adding the at least one second block family to a list of prioritized block families, wherein block families in the list are scanned prior to block families not in the list.
5. The system of claim 1 , wherein the one or more scan criteria are based on a power state associated with the memory device, and wherein the one or more scan criteria are further based on a determination that the memory device is in an idle power state.
6. The system of claim 1 , wherein the one or more scan criteria are satisfied in response to a host system associated with the memory device transitioning to an active power state from at least one of a sleep state or low power state.
7. The system of claim 1 , wherein the one or more scan criteria comprise a scan frequency, and wherein the scan frequency is determined based on a write workload characterized by a number of write requests received form a host system associated with the memory device.
8. The system of claim 7 , wherein the write workload comprises one or more of: a rate at which the write requests are received from the host system or an amount of data written by the write requests received from the host system.
9. The system of claim 1 , wherein the one or more scan criteria comprise a scan frequency based on a number of program/erase cycles associated with the memory device.
10. The system of claim 1 , wherein the one or more scan criteria comprise a scan frequency based on one or more of a read error rate of the memory device or a raw bit error rate (RBER) of the memory device.
11. The system of claim 10 , wherein the operations further comprise:
in response to an increase of at least a threshold amount in the read error rate of the memory device, prioritizing, in the scanning, one or more block families associated with a block being currently scanned.
12. The system of claim 11 , wherein prioritizing comprises scanning the one or more block families associated with the block currently being scanned prior to scanning one or more other block families.
13. The system of claim 1 , wherein each block family comprises a plurality of blocks of the memory device that have been programmed within a corresponding time window.
14. The system of claim 1 , wherein the identifying the one or more block families comprises:
identifying at least one first voltage bin, wherein each first voltage bin is associated with a plurality of read level offsets; and
identifying, according to a block family creation order, an oldest block family from a plurality of associated with the first voltage bin, wherein the identified block families comprise the oldest block family.
15. The system of claim 14 , wherein updating each of the one or more bin pointers comprises:
determining one or more values of the data state metric based on at least one block of the oldest block family;
identifying a second voltage bin based on the one or more values of the data state metric; and
associating the oldest block family with the second voltage bin.
16. A method comprising:
determining, by a computing device, a calibration scan frequency based on an amount of elapsed time since a previous write operation was performed on a memory device;
determining, based on the calibration scan frequency, whether one or more scan criteria are satisfied;
responsive to determining that the one or more scan criteria are satisfied, identifying one or more block families; and
scanning one or more bin pointers of each of the identified one or more block families, wherein the scanning the one or more bin pointers comprises: for each of the identified one or more block families, updating each of the one or more bin pointers of the identified block family based on a data state metric of at least one block of the identified block family.
17. The method of claim 16 , further comprising:
identifying at least one second block family of the identified block families, the at least one second block family having an error rate greater than a threshold error rate; and
prioritizing the at least one second block family in the scanning.
18. The method of claim 17 , wherein prioritizing the at least one second block family causes one or more bin pointers of the at least one second block family to be scanned prior to scanning one or more bin pointers of at least one other block family of the identified block families.
19. A non-transitory machine-readable storage medium storing instructions that cause a processing device to perform operations comprising:
determining a calibration scan frequency based on an amount of elapsed time since a previous write operation was performed on a memory device;
determining, based on the calibration scan frequency, whether one or more scan criteria are satisfied;
responsive to determining that the one or more scan criteria are satisfied, identifying one or more block families; and
scanning one or more bin pointers of each of the identified one or more block families, wherein the scanning the one or more bin pointers comprises: for each of the identified one or more block families, updating each of the one or more bin pointers of the identified block family based on a data state metric of at least one block of the identified block family.
20. The non-transitory machine-readable storage medium of claim 19 , the operations further comprising:
identifying at least one second block family of the identified block families, the at least one second block family having an error rate greater than a threshold error rate; and
prioritizing the at least one second block family in the scanning.