Surface inspection sensor
View Patent ↗Various surface and structural defects are currently inspected visually. This method is labor intensive, requiring large maintenance man hours, and is prone to errors. To streamline this process, herein is described an automated inspection system and apparatus based on several optical technologies that drastically reduces inspection time, provides accurate detection of defects, and provides a digital map of the location of defects. The technology uses a sensor that includes a pattern projection generator for generating a pattern image on the structural surface and a camera for detecting the pattern image generated by the pattern projection generator on the structural surface. Furthermore, the technology utilizes an image processing and correction apparatus for performing a pattern image and structural surface defect map correction and generate a distortion corrected defect map for a surface scan area on the structure that is incident on the sensor.
1. A multi-modal inspection apparatus for detecting surface and structural defects in a structure, comprising:
a structure having a structural surface;
a plurality of position registration devices;
a sensor capable of moving along the structural surface for detecting surface and structural defects in the structural surface such that the sensor is located adjacent to the plurality of position registration devices,
wherein the sensor includes a pattern projection generator for generating a pattern image on the structural surface and a camera for detecting the pattern image generated by the pattern projection generator on the structural surface;
and
a processor operatively connected to the sensor and the plurality of position registration devices for processing information from the sensor and the plurality of position registration devices and providing a map of any defects in the structural surface.
2. The multi-modal inspection apparatus, as in claim 1 , wherein the plurality of position registration devices is further comprised of:
an accelerometer-based sensor;
an inertial mass sensor; or
a magnetometer.
3. The multi-modal inspection apparatus, as in claim 1 , wherein the plurality of position registration devices is further comprised of:
a plurality of distance measurement sensors located adjacent to the sensor.
4. The multi-modal inspection apparatus, as in claim 3 , wherein the plurality of position registration devices is further comprised of:
a plurality of stationary ground makers; and
a plurality of height markers located adjacent to the plurality of stationary ground makers,
wherein the plurality of stationary ground makers and the plurality of height markers are located adjacent to the plurality of distance measurement sensors.
5. The multi-modal inspection apparatus, as in claim 3 , wherein the plurality of distance measurement sensors is further comprised of:
an ultrasonic range distance measurement finder;
an optical distance measurement sensor located on the sensor;
an accelerometer-based sensor located on the sensor;
an inertial mass sensor located on the sensor; or
a wireless positioning-based sensor located adjacent to the sensor.
6. The multi-modal inspection apparatus, as in claim 1 , wherein the pattern projection generator is further comprised of:
a light source;
a plurality of optics located adjacent to the light source; and
a pattern generation filter located adjacent to the plurality of optics.
7. The multi-modal inspection apparatus, as in claim 1 , wherein the processor is further comprised of:
an image processing and correction apparatus for performing a pattern image and structural surface defect map correction and generating a distortion corrected defect map for a surface scan area on the structure that is incident on the sensor,
wherein the image processing and correction apparatus performs the following;
determine if a distortion is detected in the pattern image,
detect and generate a structural surface defect map,
upon determining that a distortion is detected in the pattern image, perform the pattern image correction,
upon performing the pattern image correction, perform the structural surface defect map correction, and
generate the distortion corrected defect map for a surface scan area on the structure that is incident on the sensor based upon the pattern image correction and the structural surface defect map correction.
8. A method of constructing a multi-modal inspection apparatus for detecting surface and structural defects in a structure, comprising:
providing a structure having a structural surface;
providing a plurality of position registration devices;
providing a sensor capable of moving along the structural surface for detecting surface and structural defects in the structural surface such that the sensor is located adjacent to the plurality of position registration devices,
wherein the sensor includes a pattern projection generator for generating a pattern image on the structural surface and a camera for detecting the pattern image generated by the pattern projection generator on the structural surface;
and
providing a processor operatively connected to the sensor and the plurality of position registration devices for processing information from the sensor and the plurality of position registration devices and providing a map of any defects in the structural.
9. The method, as in claim 8 , wherein the plurality of position registration devices is further comprised of:
an accelerometer-based sensor;
an inertial mass sensor; or
a magnetometer.
10. The method, as in claim 8 , wherein the plurality of position registration devices is further comprised of:
a plurality of distance measurement sensors located adjacent to the sensor.
11. The method, as in claim 10 , wherein the plurality of position registration devices is further comprised of:
a plurality of stationary ground makers; and
a plurality of height markers located adjacent to the plurality of stationary ground makers,
wherein the plurality of stationary ground makers and the plurality of height markers are located adjacent to the plurality of distance measurement sensors.
12. The method, as in claim 10 , wherein the plurality of distance measurement sensors is further comprised of:
an ultrasonic range distance measurement finder;
an optical distance measurement sensor located on the sensor;
an accelerometer-based sensor located on the sensor;
an inertial mass sensor located on the sensor; or
a wireless positioning-based sensor located adjacent to the sensor.
13. The method, as in claim 8 , wherein the pattern projection generator is further comprised of:
a light source;
plurality of optics located adjacent to the light source; and
a pattern generation filter located adjacent to the plurality of optics.
14. The method, as in claim 8 , wherein the processor is further comprised of:
providing an image processing and correction apparatus for performing a pattern image and structural surface defect map correction and generating a distortion corrected defect map for a surface scan area on the structure that is incident on the sensor,
wherein the image processing and correction apparatus performs the following;
determine if a distortion is detected in the pattern image,
detect and generate a structural surface defect map,
upon determining that a distortion is detected in the pattern image, perform the pattern image correction,
upon performing the pattern image correction, perform the structural surface defect map correction, and
generate the distortion corrected defect map for a surface scan area on the structure that is incident on the sensor based upon the pattern image correction and the structural surface defect map correction.
15. A structural surface sensing device, comprising:
a structure having a structural surface;
a plurality of position registration devices;
a sensor capable of moving along the structural surface for detecting surface and structural defects in the structural surface such that the sensor is located adjacent to the plurality of position registration devices,
wherein the sensor includes a pattern projection generator for generating a pattern image on the structural surface and a camera for detecting the pattern image generated by the pattern projection generator on the structural surface; and
a processor operatively connected to the sensor and the plurality of position registration devices for processing information from the sensor and the plurality of position registration devices and providing a map of any defects in the structural surface.
16. The structural surface sensing device, as in claim 15 , wherein the plurality of position registration devices is further comprised of:
an accelerometer-based sensor;
an inertial mass sensor; or
a magnetometer.
17. The structural surface sensing device, as in claim 15 , wherein the plurality of position registration devices is further comprised of:
a plurality of distance measurement sensors located adjacent to the sensor.
18. The structural surface sensing device, as in claim 17 , wherein the plurality of position registration devices is further comprised of:
a plurality of stationary ground makers; and
a plurality of height markers located adjacent to the plurality of stationary ground makers,
wherein the plurality of stationary ground makers and the plurality of height markers are located adjacent to the plurality of distance measurement sensors.
19. The structural surface sensing device, as in claim 17 , wherein the plurality of distance measurement sensors is further comprised of:
an ultrasonic range distance measurement finder;
an optical distance measurement sensor located on the sensor;
an accelerometer-based sensor located on the sensor;
an inertial mass sensor located on the sensor; or
a wireless positioning-based sensor located adjacent to the sensor.
20. The structural surface sensing device, as in claim 15 , wherein the processor is further comprised of:
an image processing and correction apparatus for performing a pattern image and structural surface defect map correction and generating a distortion corrected defect map for a surface scan area on the structure that is incident on the sensor,
wherein the image processing and correction apparatus performs the following;
determine if a distortion is detected in the pattern image,
detect and generate a structural surface defect map,
upon determining that a distortion is detected in the pattern image, perform the pattern image correction,
upon performing the pattern image correction, perform the structural surface defect map correction, and
generate the distortion corrected defect map for a surface scan area on the structure that is incident on the sensor based upon the pattern image correction and the structural surface defect map correction.