Multispectral impedance measurements across strings of interconnected cells

1. An impedance measurement device, comprising:

a processor communicatively coupled to a non-transitory computer readable media containing a program code, including:

a switching algorithm operable to control a switching circuit controlled by said switching algorithm under control of said processor to electrically connect a plurality of cells, said switching circuit switchable to electrically connect said plurality of cells (C 1 , C 2 , . . . C n ) in a series string of cells (C 1 s , C 2 s , . . . C ns ), or electrically connect said plurality of cells (C 1 , C 2 , . . . C n ) in a parallel string of cells (C 1 p , C 2 p , . . . C np ), or electrically connect all of said plurality of cells (C 1 , C 2 , . . . C n ) interconnected in a series string of cells (s) and/or in a parallel string of cells (p);

an impedance measurement algorithm operable to:

apply one or more of a high-fidelity stimulus signal, a mid-fidelity stimulus signal, or a low fidelity cell stimulus signal to one or more of said plurality of cells;

detect a response signal to said one or more of said high-fidelity stimulus signal, said mid-fidelity stimulus signal, or said low fidelity stimulus signal applied to one or more of said plurality of cells;

an impedance spectrum algorithm operable to:

process said response signal to said one or more of said high-fidelity stimulus signal, said mid-fidelity stimulus signal, or said low fidelity stimulus signal applied to one or more of said plurality of cells;

generate one or more of a high-fidelity impedance measurement spectrum, a mid-fidelity impedance measurement spectrum, or a low-fidelity impedance measurement spectrum; and

correspondingly generate one or more of a high-fidelity impedance measurement, a mid-fidelity impedance measurement, or a low-fidelity impedance measurement.

2. The device of claim 1 , wherein said plurality of cells can comprise a pack, a module, sub-module, or individual cells within a pack, a module or a sub-module.

3. The device of claim 1 , further comprising a cell condition assessment algorithm of said program code to assess a controlled in-use cell condition or a controlled rest cell condition of said plurality of cells.

4. The device of claim 1 , wherein said program code executable to:

generate a high-fidelity impedance measurement of said plurality of cells;

detect an anomalous condition in said plurality of cells based on a deviation of said high-fidelity impedance measurement to a preselected impedance measurement threshold; and

repeatedly perform a low-fidelity impedance measurement of said plurality of cells within said pack or said module to identify a cell string or a cell within said plurality of cells associated with said deviation of said high-fidelity impedance measurement to said preselected impedance measurement threshold.

5. The device of claim 1 , wherein said high-fidelity stimulus signal used to perform said high-fidelity impedance measurement includes a greater number of stimulus signal frequencies than said low-fidelity stimulus signal used to perform said low-fidelity impedance measurement.

6. The device of claim 5 , wherein performance of said high-fidelity impedance measurement of longer duration than said low-fidelity impedance measurement.

7. The device of claim 6 , wherein said high-fidelity stimulus signal includes eighteen stimulus frequencies commencing at about 0.0125 Hz through 1638.4 Hz over a duration of about 80 seconds or commencing at 0.025 HZ through 1638.4 Hz over a duration of about 40 seconds.

8. The device of claim 6 , wherein said mid-fidelity stimulus signal includes fifteen stimulus frequencies commencing at about 0.1 Hz through 1638.4 Hz over a duration of about 10 seconds or commencing at 0.2 HZ through 1638.4 Hz over a duration of about 5 seconds.

9. The device of claim 6 , wherein said low-fidelity stimulus signal includes eleven stimulus frequencies commencing at about 0.8 Hz through 1638.4 Hz over a duration of about 1 second.

10. The device of claim 1 , wherein said program code further executable to:

analyze said one or more of said high-fidelity impedance measurement spectrum, said mid-fidelity impedance measurement spectrum, or said low-fidelity impedance measurement spectrum; and

assess stability of said plurality of cells.

11. A method of using an impedance measurement device, comprising:

communicatively coupling a processor to a non-transitory computer readable media containing a program code;

operating a switching algorithm of said program code to control a switching circuit to electrically connect a plurality of cells, said switching circuit switchable to electrically connect said plurality of cells (C 1 , C 2 , . . . C n ) in a series string of cells (C 1 s , C 2 s , . . . C ns ), or electrically connect said plurality of cells (C 1 , C 2 , . . . C n ) in a parallel string of cells (C 1 p , C 2 p , . . . C np ), or electrically connect all of said plurality of cells (C 1 , C 2 , . . . C n ) interconnected in a series string of cells (s) and/or in a parallel string of cells (p);

operating an impedance measurement algorithm of said program code to:

apply one or more of a high-fidelity stimulus signal, a mid-fidelity stimulus signal, or a low fidelity cell stimulus signal to one or more of said plurality of cells;

detect a response signal to said one or more of said high-fidelity stimulus signal, said mid-fidelity stimulus signal, or said low fidelity stimulus signal applied to one or more of said plurality of cells;

operating an impedance spectrum algorithm of said program code to:

process said response signal to said one or more of said high-fidelity stimulus signal, said mid-fidelity stimulus signal, or said low fidelity stimulus signal applied to one or more of said plurality of cells;

generate one or more of a high-fidelity impedance measurement spectrum, a mid-fidelity impedance measurement spectrum, or a low-fidelity impedance measurement spectrum; and

correspondingly generate one or more of a high-fidelity impedance measurement, a mid-fidelity impedance measurement, or a low-fidelity impedance measurement.

12. The method of claim 11 , wherein said plurality of cells can comprise a pack, a module, sub-module, or individual cells within a pack, a module or a sub-module.

13. The method of claim 11 , further comprising operating a cell condition assessment algorithm of said program code to assess a controlled in-use cell condition or a controlled rest cell condition of said plurality of cells.

14. The method of claim 11 , further comprising:

generating said a high-fidelity impedance measurement of said plurality of cells;

detecting an anomalous condition in said plurality of cells based on a deviation of said high-fidelity impedance measurement to a preselected impedance measurement threshold; and

repeatedly performing a low-fidelity impedance measurement of said plurality of cells within said pack or said module to identify a cell string or a cell within said plurality of cells associated with said deviation of said high-fidelity impedance measurement to said preselected impedance measurement threshold.

15. The method of claim 11 , wherein said high-fidelity stimulus signal used to perform said high-fidelity impedance measurement includes a greater number of stimulus signal frequencies than said low-fidelity stimulus signal used to perform said low-fidelity impedance measurement.

16. The method of claim 15 , wherein performance of said high-fidelity impedance measurement of longer duration than said low-fidelity impedance measurement.

17. The method of claim 16 , wherein said high-fidelity stimulus signal includes eighteen stimulus frequencies commencing at about 0.0125 Hz through 1638.4 Hz over a duration of about 80 seconds or commencing at 0.025 HZ through 1638.4 Hz over a duration of about 40 seconds.

18. The method of claim 16 , wherein said mid-fidelity stimulus signal includes fifteen stimulus frequencies commencing at about 0.1 Hz through 1638.4 Hz over a duration of about 10 seconds or commencing at 0.2 HZ through 1638.4 Hz over a duration of about 5 seconds.

19. The method of claim 16 , wherein said low-fidelity stimulus signal includes eleven stimulus frequencies commencing at about 0.8 Hz through 1638.4 Hz over a duration of about 1 second.

20. The method of claim 11 , further comprising:

analyzing said one or more of said high-fidelity impedance measurement spectrum, said mid-fidelity impedance measurement spectrum, or said low-fidelity impedance measurement spectrum; and

assessing stability of said plurality of cells.