Electronic component testing apparatus, socket, and carrier
An electronic component testing apparatus that tests a DUT (device under test) disposed in a carrier includes: a test head including a socket; and an electronic component handling apparatus that presses the DUT in the carrier against the socket. The socket includes: contactors disposed to correspond to terminals of the DUT that are exposed to the socket via a first opening of the carrier; and a first wall projecting toward the carrier along a pressing direction of the DUT. The electronic component handling apparatus aligns the terminals with the contactors by pressing the DUT against the socket such that a first pressing mechanism of the carrier presses the DUT against the first wall.
1. An electronic component testing apparatus that tests a DUT (device under test), comprising: a carrier in which the DUT is disposed; a test head comprising a socket; and an electronic component handling apparatus that presses the DUT in the carrier against the socket, wherein the socket comprises: contactors disposed to correspond to terminals of the DUT that are exposed to the socket via a first opening of the carrier; and a first wall projecting toward the carrier along a pressing direction of the DUT, and the carrier comprises a first pressing mechanism that presses the DUT disposed on the socket against the first wall, and the electronic component handling apparatus aligns the terminals with the contactors by pressing the DUT against the socket such that the first pressing mechanism of the carrier presses the DUT against the first wall, the carrier presses the DUT, which is in contact with the first wall, against the first wall to increase contact force between the DUT and the first wall.
2. The electronic component testing apparatus according to claim 1 , wherein
the first wall enters an interior of the carrier through a second opening of the carrier when the electronic component handling apparatus presses the DUT into the socket.
3. A carrier used in the electronic component testing apparatus according to claim 2 comprising the second opening.
4. The electronic component testing apparatus according to claim 2 , wherein
the second opening is integrally formed with the first opening.
5. The electronic component testing apparatus according to claim 1 , wherein
the socket further comprises one of a guide pin and a guide hole that corresponds to the guide pin,
the carrier further comprises the other of the guide hole and the guide pin, and
the electronic component handling apparatus aligns the carrier with the socket by pressing the DUT to the socket and inserting the guide into the guide hole.
6. The electronic component testing apparatus according to claim 5 , wherein
the guide pin inserted into the guide hole contacts the first pressing mechanism such that the first pressing mechanism presses the DUT against the first wall.
7. The electronic component testing apparatus according to claim 1 , wherein
the first wall has a tapered shape inclined such that a width of the first wall becomes larger along the pressing direction from a tip of the first wall.
8. The electronic component testing apparatus according to claim 1 , wherein
the socket further comprises a second wall that extends in a direction different from a direction in which the first wall extends,
a second pressing mechanism presses the DUT disposed on the socket toward the second wall, and
the second wall enters an interior of the carrier through a third opening of the carrier when the electronic component handling apparatus presses the DUT against the socket.
9. The electronic component testing apparatus according to claim 1 , wherein
the socket further comprises:
a holder that holds the contactors; and
a moving member movably supported on the holder along the pressing direction, and
the first wall is disposed on the moving member.
10. The electronic component testing apparatus according to claim 1 , wherein
the first pressing mechanism comprises a lever and a spring that biases the lever.