IP Library Granted Patent US 12,092,662
Granted Patent B2
US 12,092,662 · App. 17/910,362 · Granted Sep 17, 2024

Clamp-type AC voltage probe

Inventor: Masahiro Kawaguchi (Kyoto, JP)
Assignee: NIDEC READ CORPORATION
G01R15/16G01R1/04G01R1/06788G01R19/0084
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Quick Facts
Patent No.
US 12,092,662
App. No.
17/910,362
Granted
Sep 17, 2024
Kind
B2
Abstract

A clamp-type AC voltage probe includes: a clamp portion that clamps a cable to be measured; an electrode disposed to be opposed to the cable clamped by the clamp portion; a parallel circuit in which a capacitor and a resistance are connected in parallel, and one end of which is connected to the electrode; a resistance one end of which is connected to the other end of the parallel circuit and the other end of which is connected to a circuit ground; a capacitor one end of which is connected to the other end of the parallel circuit and the other end of which is connected to the circuit ground; and an amplifier an input terminal of which is connected to the one end or the other end of the parallel circuit, and that amplifies and outputs a signal input into the input terminal.

Claims (59)

1. A clamp-type AC voltage probe comprising:

a clamp portion that clamps a cable to be measured;

an electrode disposed to be opposed to the cable clamped by the clamp portion;

a parallel circuit in which a first capacitor and a first resistance are connected in parallel, and one end of which is connected to the electrode;

a second resistance one end of which is connected to the other end of the parallel circuit and the other end of which is connected to a circuit ground;

a second capacitor one end of which is connected to the other end of the parallel circuit and the other end of which is connected to a circuit ground; and

an amplifier an input terminal of which is connected to the one end or the other end of the parallel circuit, and that amplifies and outputs a signal input into the input terminal.

2. The clamp-type AC voltage probe according to claim 1 , wherein the input terminal of the amplifier is connected to the one end of the parallel circuit.

3. The clamp-type AC voltage probe according to claim 1 , wherein the first resistance has a resistance value that is larger than impedance of the first capacitor.

4. The clamp-type AC voltage probe according to claim 1 , wherein the input terminal of the amplifier has high impedance.

5. The clamp-type AC voltage probe according to claim 4 , wherein the amplifier has an FET.

6. The clamp-type AC voltage probe according to claim 1 , wherein

the clamp portion is made of an insulating material, and

the electrode is disposed inside the clamp portion and is disposed to be opposed to the cable via the insulating material.

7. The clamp-type AC voltage probe according to claim 1 , further comprising

a housing connected to the clamp portion and accommodating the parallel circuit, the second resistance, the second capacitor, and the amplifier,

wherein the housing includes an outer wall surface that is insulative and an inner wall surface that is conductive, and

the circuit ground is connected to the inner wall surface that is conductive.

8. The clamp-type AC voltage probe according to claim 7 , wherein

the clamp portion includes an accommodation space accommodating the electrode,

the clamp portion includes an outer wall surface that is insulative,

the accommodation space has an inner wall surface that is conductive except for at least a portion located between the electrode and the cable, and

the circuit ground is connected to the inner wall surface of the accommodation space that is conductive.

9. The clamp-type AC voltage probe according to claim 1 , wherein

the clamp portion clamps the cable by a pair of clamp arms,

at least one base end portion of the pair of clamp arms is pivotally supported by a shaft body,

the at least one clamp arm is swingable around the shaft body, and

the pair of clamp arms have screw holes capable of receiving a screw for fastening the pair of clamp arms, and the screw holes are formed in the vicinities of tips of the pair of clamp arms.

10. The clamp-type AC voltage probe according to claim 2 , wherein the first resistance has a resistance value that is larger than impedance of the first capacitor.

11. The clamp-type AC voltage probe according to claim 2 , wherein the input terminal of the amplifier has high impedance.

12. The clamp-type AC voltage probe according to claim 3 , wherein the input terminal of the amplifier has high impedance.

13. The clamp-type AC voltage probe according to claim 2 , wherein

the clamp portion is made of an insulating material, and

the electrode is disposed inside the clamp portion and is disposed to be opposed to the cable via the insulating material.

14. The clamp-type AC voltage probe according to claim 3 , wherein

the clamp portion is made of an insulating material, and

the electrode is disposed inside the clamp portion and is disposed to be opposed to the cable via the insulating material.

15. The clamp-type AC voltage probe according to claim 4 , wherein

the clamp portion is made of an insulating material, and

the electrode is disposed inside the clamp portion and is disposed to be opposed to the cable via the insulating material.

16. The clamp-type AC voltage probe according to claim 5 , wherein

the clamp portion is made of an insulating material, and

the electrode is disposed inside the clamp portion and is disposed to be opposed to the cable via the insulating material.

17. The clamp-type AC voltage probe according to claim 2 , further comprising

a housing connected to the clamp portion and accommodating the parallel circuit, the second resistance, the second capacitor, and the amplifier,

wherein the housing includes an outer wall surface that is insulative and an inner wall surface that is conductive, and

the circuit ground is connected to the inner wall surface that is conductive.

18. The clamp-type AC voltage probe according to claim 3 , further comprising

a housing connected to the clamp portion and accommodating the parallel circuit, the second resistance, the second capacitor, and the amplifier,

wherein the housing includes an outer wall surface that is insulative and an inner wall surface that is conductive, and

the circuit ground is connected to the inner wall surface that is conductive.

19. The clamp-type AC voltage probe according to claim 4 , further comprising

a housing connected to the clamp portion and accommodating the parallel circuit, the second resistance, the second capacitor, and the amplifier,

wherein the housing includes an outer wall surface that is insulative and an inner wall surface that is conductive, and

the circuit ground is connected to the inner wall surface that is conductive.

20. The clamp-type AC voltage probe according to claim 5 , further comprising

a housing connected to the clamp portion and accommodating the parallel circuit, the second resistance, the second capacitor, and the amplifier,

wherein the housing includes an outer wall surface that is insulative and an inner wall surface that is conductive, and

the circuit ground is connected to the inner wall surface that is conductive.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 9, 2022
From: KAWAGUCHI, MASAHIRO
To: NIDEC READ CORPORATION
Reel/Frame 061038/0157 →
Priority Claims (1)
JP 2020-044778 · Mar 13, 2020 · national
Continuity (1)
Related Publication 20230127522A1 · Apr 27, 2023
Cited By (1)
US 1,096,465