IP Library Granted Patent US 11,827,515
Granted Patent B2
US 11,827,515 · App. 17/941,824 · Granted Nov 28, 2023

Substrate-free 2D tellurene

Inventors: Wenzhuo Wu (West Lafayette, IN); Yixiu Wang (West Lafayette, IN)
Assignee: Purdue Research Foundation
C01B19/02C30B7/10C30B7/105C30B29/02C30B29/60C30B30/00C01P2002/60C01P2002/74C01P2004/20
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Quick Facts
Patent No.
US 11,827,515
App. No.
17/941,824
Granted
Nov 28, 2023
Kind
B2
Abstract

The present disclosure generally relates to compositions comprising substrate-free 2D tellurene crystals, and the method of making and using the substrate-free 2D tellurene crystals. The 2D tellurene crystals of the present disclosure are characterized by an X-ray diffraction pattern (CuKα radiation, λ=1.54056 A) comprising a peak at 23.79 (2θ±0.1°) and optionally one or more peaks selected from the group consisting of 41.26, 47.79, 50.41, and 64.43 (2θ±0.1°).

Claims (7)

1. A method of preparing substrate-free 2D tellurene crystals, wherein the method comprises reacting sodium tellurite and hydrazine in an alkaline condition with the presence of polyvinylpyrrolidone (PVP) at a reaction temperature of 120-250° C., thus synthesizing substrate-free 2D tellurene crystals, wherein the 2D tellurene crystals are characterized by an X-ray diffraction pattern (CuKα radiation, λ=1.54056 A), wherein the X-ray diffraction pattern consists of five peaks from a range of 23.79 (29±0.1°) to 64.43 (29±0.1°) within an intensity range of 7.8% to 100%, and wherein the five peaks are ranked in an order of intensity from high to low by 23.79 (29±0.1°), 47.79 (29±0.1°), 41.26 (29±0.1°), 64.43 (29±0.1°), and 50.41 (29±0.1°).

2. The method of claim 1 , wherein a mole ratio of Na 2 TeO 3 /PVP is 10-100:1.

3. The method of claim 2 , wherein acetone is added to the as-synthesized 2D tellurene crystals to provide 2D tellurene crystals with a thickness of 0.5-10 nm.

4. The method of claim 2 , wherein NaOH is added to the as-synthesized 2D tellurene crystals to provide 2D tellurene crystals with a thickness of 0.5-10 nm.

5. The method of claim 1 , wherein the reaction time is at least 1 hours.

6. The method of claim 1 , wherein the 2D tellurene crystals are characterized by an X-ray diffraction pattern (CuKα radiation, λ=1.54056 A) comprising a peak at 23.79 (2θ±0.1°) and optionally one or more peaks selected from the group consisting of 41.26, 47.79, 50.41, and 64.43 (2θ±0.1°).

7. The method of claim 1 , wherein the alkaline condition has a pH>7.

Continuity (4)
Division 17008834 · Sep 1, 2020
Division 15995576 · Jun 1, 2018
Provisional Application 62521695 · Jun 19, 2017
Related Publication 20230002228A1 · Jan 5, 2023