Granted Patent B2

US 12,636,710 · App. 17/942,107 · Granted May 26, 2026

Inventors: Donald Thomas Streck (Florence, KY); Lem Linder (Florence, KY)

Assignee: Mazak Corporation

B23B29/244B23B7/04

Abstract

Claims (155)

1 . A machine tool having a Z axis, a X axis extending perpendicular to the Z axis, and a Y axis extending perpendicular to the Z axis and the X axis, the machine tool comprising:

an artifact;

a head including a rotatable workpiece holder, the head configured to rotate the workpiece holder around the Z axis;

a probe configured to be mounted to the workpiece holder;

tool holders for holding tools in spaced apart relation to one another;

a tool holder actuator operable to move the tool holders along the X axis and the Y axis relative to the workpiece holder;

a controller operably connected to the head, the probe, and the tool holder actuator;

a memory configured to store locations of calibration surfaces of the artifact;

the controller configured to:

calibrate the probe with respect to the Z, X, and Y axes by moving the probe and the artifact relative to one another to bring the probe and the artifact into contact with one another, wherein calibrating the probe includes:

determining a Z-axis offset value and a centerline of the probe along the X and Y axes using the stored locations of the calibration surfaces of the artifact and the relative movement of the probe and the artifact; and

determine a tool offset value for a tool of the tools received in the tool holders using data from calibrating the probe and by moving the probe and the tool holders relative to one another to bring the probe and the tool into contact with one another.

2 . The machine tool of claim 1 wherein the artifact is connected to the tool holders and the tool holder actuator is configured to move the artifact along at least one of the X axis and the Y axis;

wherein the head is operable to shift the rotatable workpiece holder along the Z axis; and

wherein the controller is configured to calibrate the probe by causing the tool holder actuator to shift the artifact along at least one of the X and Y axes and causing the head to shift the rotatable workpiece holder and the probe mounted thereto along the Z axis.

3 . The machine tool of claim 1 wherein the head includes:

a workpiece holding shaft, the rotatable workpiece holder associated with the workpiece holding shaft;

a workpiece supporting shaft; and

at least one drive operable to rotate the workpiece holding shaft and the workpiece supporting shaft around the Z axis, the at least one drive operable to axially shift the workpiece holding shaft and the workpiece supporting shaft relative to one another to adjust a position of the probe relative to the workpiece supporting shaft.

4 . The machine tool of claim 3 wherein the controller is configured to calibrate the probe by moving the probe and the artifact relative to one another including causing the at least one drive to axially shift the workpiece holding shaft relative to the workpiece supporting shaft to contact the probe and the artifact.

5 . The machine tool of claim 1 wherein the head includes a workpiece supporting shaft for rotating with the rotatable workpiece holder and a guide bushing configured to be releasably mounted to the workpiece supporting shaft and rotate therewith.

6 . The machine tool of claim 1

wherein moving the probe and the artifact relative to one another includes moving at least one of the probe and the artifact a distance along the Z-axis of the head; and

wherein the controller is configured to calibrate the probe including determining a Z-axis offset value of the probe based at least in part on the distance along the Z-axis and the location of the artifact stored in the memory.

7 . The machine tool of claim 1 wherein the controller is configured to calibrate the probe including determining a Z-offset value of the probe relative to the Z-axis of the head, the rotatable workpiece holder rotatable around the Z-axis of the head;

wherein the probe has a leading end surface portion and the calibration surfaces of the artifact includes an end surface portion; and

wherein the controller is configured to calibrate the probe including moving the probe and the artifact relative to one another to bring the leading end surface portion of the probe and the end surface portion of the artifact into contact with one another.

8 . The machine tool of claim 1 wherein the calibration surfaces of the artifact include a flat end surface portion and a cylindrical outer surface;

wherein the probe includes a flat leading surface portion and a flat side surface portion; and

wherein the controller is configured to calibrate the probe including moving the probe and the artifact to:

bring the flat leading surface portion of the probe and the flat end surface portion of the artifact into contact with one another; and

bring the flat side surface portion of the probe and the cylindrical outer surface of the artifact into contact with one another.

9 . The machine tool of claim 1 wherein one of the probe and the artifact includes a cylindrical surface and the other of the probe and the calibration surfaces of the artifact include a plurality of flat surfaces;

wherein the controller is configured to calibrate the probe by moving the probe and artifact relative to one another to bring the flat surfaces and the cylindrical surface into contact with one another and determining a centerline of the probe.

10 . The machine tool of claim 1 wherein the tool includes tools include a facing tool and a plurality of other tools;

wherein the controller is configured to determine the tool offset value including a master Z-axis tool offset value associated with the facing tool and tool offset values associated with the other tools;

wherein the controller is configured to determine the master Z-axis tool offset value for the facing tool by moving the probe and the facing tool relative to one another bring the probe and the facing tool into contact with one another; and

wherein the controller is configured to determine the tool offset values for the other tools by using the master Z-axis tool offset value and moving the probe and the other tools relative to one another to bring the probe and the other tools into contact with one another.

11 . The machine tool of claim 1 wherein the probe includes a radio frequency transmitter, the probe configured to cause the radio frequency transmitter to transmit radio frequency signals upon the probe contacting the artifact and the tool; and

a radio frequency receiver operatively connected to the controller and configured to receive the radio frequency signals.

12 . The machine tool of claim 1 further comprising a tool holder block including the tool holders.

13 . The machine tool of claim 1 further comprising a user interface operatively connected to the controller, the user interface configured to receive a user input; and

wherein the controller is configured to autonomously calibrate the probe and determine the tool offset value upon the user interface receiving the user input.

14 . The machine tool of claim 1 wherein the head includes a first head and a second head;

wherein the tool holders include a first tool holder array for machining a workpiece held by the first head and a second tool holder array for machining a workpiece held by the second head.

15 . A machine tool comprising:

an artifact;

a head including a rotatable workpiece holder;

a probe configured to be mounted to the workpiece holder;

a tool holder for holding a tool;

a tool holder actuator operable to move the tool holder;

a controller operably connected to the head, the probe, and the tool holder actuator, the controller configured to:

calibrate the probe by moving the probe and the artifact relative to one another to bring the probe and the artifact into contact with one another; and

determine a tool offset value for the tool using data from calibrating the probe and by moving the probe and the tool holder relative to one another to bring the probe and the tool into contact with one another;

wherein one of the probe and the artifact includes a cylindrical surface and the other of the probe and the artifact includes a plurality of flat surfaces;

wherein the controller is configured to calibrate the probe by moving the probe and artifact relative to one another to bring the flat surfaces and the cylindrical surface into contact with one another and determining a centerline of the probe;

wherein the controller is configured to calibrate the probe by moving the probe and the artifact relative to one another including:

turning the probe after bringing the flat surfaces and the cylindrical surface into contact with one another;

bringing the flat surfaces and the cylindrical surface into contact with one another after turning the probe;

wherein the controller is configured to determine a first centerline based at least in part upon moving the probe and artifact relative to one another before turning the probe;

wherein the controller is configured to determine a second centerline based at least in part upon moving the probe and artifact relative to one another after turning the probe; and

wherein determining the centerline of the probe includes determining the centerline based at least in part upon the first centerline and the second centerline.

16 . A method of preparing a machine tool to machine a workpiece, the machine tool having a Z axis, a X axis extending perpendicular to the Z axis, and a Y axis extending perpendicular to the Z axis and the X axis, the machine tool comprising:

a head;

an artifact in the machine tool;

a probe mounted to the head of the machine tool;

a rotatable workpiece holder of the head, the head configured to rotate the workpiece holder around the Z axis;

tool holders for holding tools in spaced apart relation to one another;

a tool holder actuator operable to move the tool holders along the X axis and the Y axis relative to the workpiece holder;

a memory configured to store locations of calibration surfaces of the artifact;

the method comprising:

determining a tool offset value for a tool of the tools received in the tool holders by moving the probe and the tool holders relative to one another to bring the probe and the tool into contact with one another; and

prior to determining the tool offset value, calibrating the probe with respect to the Z, X, and Y axes by moving the probe and the artifact relative to one another to bring the probe and the artifact into contact with one another, wherein calibrating the probe includes:

determining a Z-axis offset value and a centerline of the probe along the X and Y axes using the stored locations of the calibration surfaces of the artifact and the relative movement of the probe and the artifact.

17 . The method of claim 16 wherein moving the probe and artifact relative to one another includes moving at least one of the probe and the artifact a distance along the Z-axis of the head, the head operable to turn the probe around the Z-axis; and

wherein calibrating the probe includes determining the Z-axis offset value of the probe based at least in part upon the distance moved along the Z-axis of the head and a position of the artifact stored in a memory associated with the machine tool.

18 . The method of claim 16

wherein the calibration surfaces of the artifact include an end surface portion; and

wherein moving the probe and the artifact relative to one another comprises bringing a leading end surface of the probe and the end surface portion of the artifact into contact with one another.

19 . The method of claim 16 wherein the calibration surfaces of the artifact include a flat end surface portion and a cylindrical outer surface of the artifact;

wherein moving the probe and the artifact relative to one another comprises:

moving the probe and the artifact relative to one another to bring a flat leading surface portion of the probe and the flat end surface portion of the artifact into contact with one another; and

moving the probe and the artifact relative to one another to bring a flat side surface portion of the probe and the cylindrical outer surface of the artifact into contact with one another.

20 . The method of claim 16 wherein calibrating the probe includes determining a centerline of the probe;

wherein one of the probe and the artifact includes a cylindrical surface and the other of the probe and the artifact includes a plurality of flat surfaces;

wherein the calibration surfaces of the artifact include the cylindrical surface or the plurality of flat surfaces; and

wherein moving the probe and the artifact relative to one another includes moving the probe and the artifact relative to one another to bring the flat surfaces and the cylindrical surface into contact with one another.

21 . The method of claim 20 wherein moving the probe and the artifact relative to one another includes:

turning the probe after contacting each of the flat surfaces and the cylindrical surface; and

moving the probe and the artifact relative to one another to bring the flat surfaces and the cylindrical surface into contact with one another after turning the probe;

wherein determining the centerline of the probe includes:

determining a first centerline based at least in part upon moving the probe and artifact relative to one another before turning the probe; and

determining a second centerline based at least in part upon moving the probe and artifact relative to one another after turning the probe; and

determining the centerline of the probe based at least in part upon the first centerline and the second centerline.

22 . The method of claim 16 wherein moving the probe and the artifact relative to one another comprises:

shifting the artifact along at least one of the X-axis and the Y-axis to align a portion of the artifact with the probe, the X-axis perpendicular to the Y-axis; and

shifting the probe along the Z-axis into contact with the portion of the artifact.

23 . The method of claim 16 wherein the tools include a facing tool and a plurality of other tools;

wherein determining the tool offset value comprises:

determining a master Z-axis tool offset value relative to the Z-axis of the head by moving the probe and the facing tool relative to one another to bring the probe and the facing tool into contact with one another, the head operable to rotate the probe around the Z-axis; and

determining tool offset values for the other tools by using the master Z-axis tool offset value and moving the probe and the other tools relative to another to bring the probe and the other tools into contact with one another.

24 . The method of claim 16 further comprising:

shifting a workpiece holder of the head to an extended position to facilitate mounting of the probe to the workpiece holder;

shifting the workpiece holder from the extended position to a retracted position to shift a portion of the probe into a bore of the head and position a tip of the probe outside of the bore of the head; and

wherein moving the probe and the artifact relative to one another to bring the probe and the artifact into contact with one another includes moving the probe and the artifact relative to one another while the portion of the probe is in the bore of the head.

25 . The method of claim 16 wherein calibrating the probe includes the probe transmitting a first radio frequency signal upon contact between the probe and the artifact; and

wherein determining the tool offset value includes the probe transmitting a second radio frequency signal upon contact between the probe and the tool.

26 . The method of claim 16 wherein the head includes a first head and a second head;

wherein the tools include a first tool and a second tool;

wherein the probe includes a first probe mounted to the first head and a second probe mounted to the second head;

wherein calibrating the probe includes:

calibrating the first probe by moving the first probe and the artifact relative to one another to bring the first probe and the artifact into contact with one another; and

calibrating the second probe by moving the second probe and the artifact relative to one another to bring the second probe and the artifact into contact with one another; and

wherein determining the tool offset value for the tool includes:

determining a first tool offset value for the first tool by moving the first probe relative to the first tool to bring the first probe and the first tool into contact with one another; and

determining a second tool offset value for the second tool by moving the second probe relative to the second tool to bring the second probe and the second tool into contact with one another.

27 . A machine tool comprising:

a calibration member;

a head including a rotatable workpiece holder, the head including a drive operable to rotate the workpiece holder around a Z axis;

a probe of the head;

a tool holders for holding tools in spaced apart relation to one another;

a tool holder actuator operable to move the tool holders along an X axis perpendicular to the Z axis and a Y axis perpendicular to the Z and X axes;

wherein the tool holders are configured against movement along the Z axis;

a controller operably connected to the head and the tool holder actuator;

a memory of the controller operable to store location data of surface portions of the calibration member;

the controller configured to calibrate the probe by utilizing the location data of the surface portions of the calibration member and moving the probe and the calibration member relative to one another to bring the probe and the calibration member into contact with one another; and

the controller configured to determine a tool offset value for a tool of the tools held in the tool holders using data from calibrating the probe and by moving the probe and the tool holders relative to one another to bring the probe and the tool into contact with one another.

28 . The machine tool of claim 27 further comprising a second head;

wherein the probe is shiftable along an axis relative to the second head; and

wherein the controller is configured to calibrate the probe by moving the probe and the calibration member relative to one another including moving the probe and the calibration member relative to one another along the axis.

29 . The machine tool of claim 27 further comprising a machining area and a second head across the machining area from the head; and

wherein the head has a probe protecting configuration wherein the head covers at least a portion of the probe and a probe exposing configuration wherein the at least a portion of the probe is uncovered by the head and is accessible via the machining area.

30 . The machine tool of claim 27

wherein the controller is configured to calibrate the probe including determining a Z-axis offset value and a centerline of the probe relative to the Z-axis.

31 . The machine tool of claim 27 wherein the calibration member and probe have end surfaces and side surfaces; and

wherein the controller is configured to calibrate the probe by moving the probe and calibration member relative to one another to bring the side surfaces of the calibration member and the probe into contact with one another and determine a centerline of the probe.

32 . The machine tool of claim 27 wherein moving the probe and the calibration member relative to one another includes moving at least one of the probe and the calibration member a distance along the Z-axis of the head; and

wherein the controller is configured to calibrate the probe including determining a Z-axis offset value of the probe based at least in part on the distance along the Z-axis and the location data of the calibration member stored in the memory.

33 . The machine tool of claim 27 wherein the controller is configured to calibrate the probe including determining a Z-offset value of the probe relative to the Z-axis of the head, the rotatable workpiece holder rotatable around the Z-axis of the head;

wherein the probe has a leading end surface portion and the calibration member has an end surface portion; and

wherein the controller is configured to calibrate the probe including moving the probe and the calibration member relative to one another to bring the leading end surface portion of the probe and the end surface portion of the calibration member into contact with one another.

34 . The machine tool of claim 27 wherein the calibration member includes an end surface portion and an outer surface;

wherein the probe includes a leading surface portion and a side surface portion; and

wherein the controller is configured to calibrate the probe including moving the probe and the calibration member to:

bring the leading surface portion of the probe and the end surface portion of the calibration member into contact with one another; and

bring the side surface portion of the probe and the outer surface of the calibration member into contact with one another.

35 . The machine tool of claim 27 wherein one of the probe and the calibration member includes a cylindrical surface and the other of the probe and the calibration member includes a plurality of flat surfaces;

wherein the controller is configured to calibrate the probe by moving the probe and calibration member relative to one another to bring the flat surfaces and the cylindrical surface into contact with one another and determining a centerline of the probe.

36 . The machine tool of claim 27 wherein the tools include a facing tool and a plurality of other tools;

wherein the controller is configured to determine the tool offset value including a master Z-axis tool offset value associated with the facing tool and tool offset values associated with the other tools;

wherein the controller is configured to determine the master Z-axis tool offset value for the facing tool by moving the probe and the facing tool relative to one another bring the probe and the facing tool into contact with one another; and

wherein the controller is configured to determine the tool offset values for the other tools by using the master Z-axis tool offset value and moving the probe and the other tools relative to one another to bring the probe and the other tools into contact with one another.

37 . The machine tool of claim 27 further comprising a tool holder block including the tool holders.

38 . The machine tool of claim 27 further comprising a user interface operatively connected to the controller, the user interface configured to receive a user input; and

wherein the controller is configured to autonomously calibrate the probe and determine the tool offset value upon the user interface receiving the user input.

Assignments (2)

Continuity (1)

References Cited (77)