Probes for electrical testing in defect detection systems

1. A probe comprising:

a substrate defining a contact surface and a substrate recess at a distal end of the substrate, wherein the substrate is planar between the distal end and an opposite proximal end;

a plurality of fingers disposed on the contact surface, wherein the fingers extend beyond the distal end of the substrate and across the substrate recess, and wherein the fingers are spaced apart from the substrate as the fingers extend across the substrate recess; and

an assembly configured to hold the substrate and the fingers, wherein the assembly defines an assembly recess that surrounds less than an entirety of the substrate, and wherein the substrate is positioned in the assembly recess at a downward angle from the proximal end of the substrate whereby the substrate is spaced apart from the assembly in the assembly recess.

2. The probe of claim 1 , wherein the fingers are fabricated of BeCu.

3. The probe of claim 1 , wherein the substrate is ceramic.

4. The probe of claim 1 , wherein the assembly defines an aperture and further comprises a limiter disposed in the aperture, wherein the limiter is configured to extend into the assembly recess and restrict flexing of the substrate through contact with the substrate.

5. The probe of claim 4 , wherein the limiter is fabricated of metal.

6. The probe of claim 1 , further comprising an electrical connector in electrical communication with the plurality of fingers, wherein the electrical connector is disposed in the assembly.

7. The probe of claim 1 , further comprising at least one spring disposed between the substrate and the assembly in the assembly recess.

8. The probe of claim 1 , wherein the substrate recess extends into the substrate from the contact surface by 25 μm to 100 μm.

9. The probe of claim 1 , wherein the fingers extend beyond the distal end of the substrate from 50 μm to 200 μm.

10. The probe of claim 1 , wherein each of the fingers has a width from 10 μm to 20 μm.

11. The probe of claim 1 , wherein the fingers each have a thickness extending from the contact surface from 30 μm to 150 μm.

12. The probe of claim 1 , wherein each of the fingers has a conical or frustoconical cross section having a first outer surface and a second outer surface opposite the first outer surface, wherein the second outer surface is wider than the first outer surface.

13. The probe of claim 1 , wherein a distance between the fingers and the substrate in the substrate recess is greater than zero and less than 1 mm.

14. A method comprising:

contacting an electrical device with a probe that includes a plurality of fingers disposed on a substrate;

flexing the fingers within a substrate recess of the substrate;

flexing the fingers and the substrate within an assembly recess of an assembly configured to hold the fingers and the substrate, wherein the assembly surrounds less than an entirety of the substrate, wherein the substrate is positioned in the assembly recess at a downward angle from an end of the substrate opposite the fingers, and wherein the substrate is planar between an end with the fingers and the end opposite the fingers prior to the flexing; and

receiving measurements of an electrical test of the electrical device using the probe.

15. The method of claim 14 , wherein the fingers are fabricated of BeCu.

16. The method of claim 14 , further comprising applying tension between the substrate and the assembly using at least one spring in the assembly recess disposed between the substrate and the assembly.

17. The method of claim 14 , wherein the fingers are flexed from 25 μm to 100 μm across the substrate recess.

18. The method of claim 14 , wherein the substrate is flexed up to 50 μm across the assembly recess.

19. The method of claim 14 , wherein the electrical device is a screen.

20. The method of claim 14 , wherein the electrical device is a flat panel display.