Performing memory testing using error correction code values
A system includes a memory component and a processing device operatively coupled with the memory component. The processing device performs a test of the memory component by generating an error correction code (ECC) value for an initial operation of the test based on an address in the memory component on which the initial operation of the test is performed, generating ECC values for subsequent operations of the test, and reporting the ECC value generated for the last of the subsequent operations of the test in an event log. The ECC value for each respective subsequent operation of the test is generated based on an address in the memory component on which that respective subsequent operation of the test is performed, and the ECC value generated for the operation of the test that was performed immediately before that respective subsequent operation.
1. An apparatus, comprising:
a memory component; and
a processing device, operatively coupled with the memory component, to perform a test of blocks of memory cells of the memory component by:
generating an error correction code (ECC) value for an initial operation of the test based on an address in the memory component on which the initial operation of the test is performed;
generating ECC values for subsequent operations of the test, wherein the ECC value for each respective subsequent operation of the test is generated based on:
an address in the memory component on which that respective subsequent operation of the test is performed; and
the ECC value generated for the operation of the test that was performed immediately before that respective subsequent operation; and
reporting the ECC value generated for the last of the subsequent operations of the test in an event log; and
wherein the processing device is further to:
skip a block of the blocks of memory cells of the memory component while performing the test of the memory component, wherein the skipped block is a block of memory cells of the memory component used to store system data, wherein the system data includes data associated with manufacture of the memory component; and
report the skipped block of the blocks of memory cells in the event log after the block was skipped during the test;
wherein only the ECC value generated for the last of the subsequent operations of the test and the skipped block of the block of memory cells are reported in the event log.
2. The apparatus of claim 1 , wherein the ECC values for the initial operation and subsequent operations of the test are generated using a cyclic redundancy check (CRC) table.
3. The apparatus of claim 2 , wherein the CRC table includes the addresses in the memory component on which the initial operation and subsequent operations of the test are performed.
4. The apparatus of claim 1 , wherein the ECC values for the initial operation and subsequent operations of the test are generated using a cyclic redundancy check (CRC) function.
5. The apparatus of claim 1 , wherein the addresses in the memory component on which the initial operation and subsequent operations of the test are performed are logical addresses.
6. A method, comprising:
generating an error correction code (ECC) value for an initial operation of a test performed on blocks of memory cells of a memory component of a memory sub-system, wherein the ECC value is generated based on an address in the memory component on which the initial operation of the test is performed;
generating ECC values for subsequent operations of the test, wherein the ECC value for each respective subsequent operation of the test is generated based on:
an address in the memory component on which that respective subsequent operation of the test is performed; and
the ECC value generated for the operation of the test that was performed immediately before that respective subsequent operation;
comparing only the ECC value generated for the last of the subsequent operations of the test to an ECC value in an event log of the memory sub-system;
skipping a block of the blocks of memory cells of the memory component while performing the test on the memory component, wherein the skipped block is a block of memory cells of the memory component used to store system data, wherein the system data includes data programmed to the memory component during manufacture of the memory sub-system; and
reporting only the skipped block of the blocks of memory cells in the event log after the block was skipped during the test.
7. The method of claim 6 , wherein the method includes validating the test based on a result of the comparison.
8. The method of claim 6 , wherein the method includes invalidating the test based on a result of the comparison.
9. The method of claim 6 , wherein the method includes simulating, by a host system, the test after the test is performed on the blocks of memory cells of the memory component of the memory sub-system.
10. An apparatus, comprising:
an event log;
a memory component; and
a processing device, operatively coupled with the memory component, to:
perform a test of blocks of memory cells of the memory component by:
generating an error correction code (ECC) value for an initial operation of the test based on an address in the memory component on which the initial operation of the test is performed;
generating ECC values for subsequent operations of the test, wherein the ECC value for each respective subsequent operation of the test is generated based on:
an address in the memory component on which that respective subsequent operation of the test is performed; and
the ECC value generated for the operation of the test that was performed immediately before that respective subsequent operation;
validate the test using an ECC value in the event log and only the ECC value generated for the last of the subsequent operations of the test;
skip a block of the blocks of memory cells of the memory component while performing the test of the memory component, wherein the skipped block is a block of memory cells of the memory component used to store system data, wherein the system data includes data associated with, and programmed to the memory component during, manufacture of the memory component; and
report only the skipped block of the blocks of memory cells in the event log after the block was skipped during the test.
11. The apparatus of claim 10 , wherein validating the test using only the ECC value generated for the last of the subsequent operations of the test comprises validating the test without using the ECC value generated for the initial operation of the test and any of the ECC values generated for the subsequent operations of the test prior to the last of the subsequent operations of the test.
12. The apparatus of claim 10 , wherein the processing device is to validate the test responsive to the ECC value in the event log and the ECC value generated for the last of the subsequent operations of the test being a same value.
13. The apparatus of claim 10 , wherein the processing device is to invalidate the test using the ECC value in the event log and only the ECC value generated for the last of the subsequent operations of the test.
14. The apparatus of claim 13 , wherein the processing device is to invalidate the test responsive to the ECC value in the event log and the ECC value generated for the last of the subsequent operations of the test being different values.
15. The apparatus of claim 10 , wherein validating the test comprises validating that the initial operation and subsequent operations of the test were performed on correct addresses in the memory component.
16. The apparatus of claim 10 , wherein validating the test comprises validating that the initial operation and subsequent operations of the test were performed in a correct sequence.