SYSTEMS AND METHODS OF PIXEL CALIBRATION BASED ON IMPROVED REFERENCE VALUES
What is disclosed are systems and methods of compensation of images produced by active matrix light emitting diode device (AMOLED) and other emissive displays. The electrical output of a pixel is compared with a reference value to adjust an input for the pixel. In some embodiments an integrator is used to integrate a pixel current and a reference current using controlled integration times to generate values for comparison.
1 - 23 . (canceled)
24 . A method of driving an emissive display system having pixels, each pixel having alight-emitting device, the method comprising:
driving a pixel with use of a comparison between an electrical signal received from the pixel and a reference.
25 . The method of claim 24 , wherein said reference comprises a reference signal.
26 . The method of claim 25 , wherein said reference signal comprises an analog reference signal.
27 . The method of claim 25 , wherein said reference signal comprises one of a reference current and a reference voltage.
28 . The method of claim 24 , wherein said reference comprises a reference charge.
29 . The method of claim 24 , wherein said reference comprises a digital reference value.
30 . The method of claim 24 , wherein said driving the pixel comprises providing a programming input for the pixel.
31 . The method of claim 30 , wherein said driving the pixel comprises updating calibration data for compensating said programming input for the pixel.
32 . The method of claim 24 , wherein said driving the pixel comprises adjusting an input for the pixel repeatedly until, at a final value of the adjusted input for the pixel, said comparison results in a predefined comparison value.
33 . The method of claim 32 , further comprising updating calibration data to compensate a programming of the pixel with use of the final value of the adjusted input for the pixel.
34 . The method of claim 24 , wherein said comparison between the electrical signal received from the pixel and the reference comprises integrating the electrical signal received from the pixel.
35 . The method of claim 24 , wherein said comparison between the electrical signal received from the pixel and the reference comprises sampling the electrical signal received from the pixel.
36 . The method of claim 24 , wherein the reference comprises a reference signal, and wherein said comparison between the electrical signal received from the pixel and the reference comprises integrating the reference signal.
37 . The method of claim 36 , wherein the reference signal is integrated for an integration time based on an expected magnitude of the electrical signal received from the pixel.
38 . The method of claim 24 , wherein said comparison between the electrical signal received from the pixel and the reference comprises combining the electrical signal received from the pixel with the reference.
39 . The method of claim 24 , wherein the reference comprises a reference signal, and wherein said comparison between the electrical signal received from the pixel and the reference comprises integrating the electrical signal received from the pixel, integrating the reference signal, and combining the integrated electrical signal and the integrated reference signal in an integrator.
40 . The method of claim 24 , wherein said comparison between the electrical signal received from the pixel and the reference comprises sampling the electrical signal received from the pixel and, in a capacitor, combining the sampled electrical signal and the reference.
41 . The method of claim 40 , wherein said reference comprises an analog reference value, and wherein said comparison between the electrical signal received from the pixel and the reference comprises charging the capacitor to the analog reference value.
42 . The method of claim 24 , further comprising determining a value of the reference with use of an expected magnitude of the electrical signal received from the pixel.
43 . The method of claim 24 , further comprising prior to said driving the pixel with use of said comparison, measuring the electrical signal received from the pixel.