Product target quality control system
A process includes receiving a target quality value, receiving a measured quality value, receiving a source quality value, and sending a source control instruction. The source control instruction is based at least in part on the target quality value, the measured quality value, and the source quality value. The target quality value, the measured quality value, the source quality value, and the source control instruction are communicated via the communication port. The measured quality value is generated by an inspection device configured to inspect a sample. The source quality value is associated with a quality level of a first group of samples. The target quality value indicates a desired quality value of an output group of samples. The source control instruction causes a source selecting device to select one of a plurality of groups of samples, each group having identified quality characteristics.
1. A method, comprising:
(a) receiving a target quality value, wherein the target quality value represents a desired average quality value of a plurality of samples directed to a collector;
(b) receiving a measured quality value from an inspection device, wherein the measured quality value is generated at least in part by the inspection device in response to inspecting a first sample, and wherein the first sample is directed to the collector;
(c) reading a source quality value from a memory unit, wherein the source quality value indicates an average quality value of a plurality of samples included in a first sample source; and
(d) sending a source control instruction to the first sample source, wherein the source control instruction causes a second sample from the first sample source to be inspected by the inspection device and directed toward the collector, wherein the source control instruction is based at least in part on the target quality value, the measured quality value, and the source quality value.
2. The method of claim 1 , where steps (a) through (d) are performed by a computing device.
3. The method of claim 2 , wherein the computing device comprises:
a processing circuit;
the memory unit; and
a communication port, wherein the target quality value, the measured quality value, the source quality value, and the source control instruction are communicated via the communication port.
4. The method of claim 3 , wherein the communication port is a wireless communication port.
5. The method of claim 3 , wherein the communication port is a wired communication port.
6. The method of claim 1 , wherein the inspection device is configured to inspect the first sample.
7. The method of claim 1 , wherein the source quality value is written to the memory unit.
8. The method of claim 1 , wherein the target quality value is created by a system user.
9. The method of claim 1 , wherein the source control instruction causes a source selecting device to select one of a plurality of groups of samples, wherein each of the plurality of groups of samples have identified quality characteristics.
10. The method of claim 9 , wherein the source selecting device comprises: a first input port, a second input port, an output port, and a means for causing a first sample that enters through a first input port to pass through to the output port and causing a second sample that enters through the second input port to not pass through the output port.
11. The method of claim 1 , further comprising:
(e) sending a second source control instruction in response to at least one of: a second target quality value, a second measured quality value, or a second source quality value.
12. The method of claim 1 , where the measured quality value is generated by an optical inspector unit.
13. The method of claim 1 , wherein the source control instruction is received by a source selecting device, and wherein the source selecting device causes samples from at least one of a plurality of sources of samples to flow into a product inspection flow.
14. The method of claim 1 , wherein the target quality value includes a plurality of target quality values, and wherein the plurality of target quality values is any one of the following: shape quality, surface contour quality, hole quality, pest quality, size quality, moisture level, oil content, fat content, or mycotoxin content.
15. The method of claim 1 , wherein an alert message is sent if the target quality value is not achieved.
16. The method of claim 12 , wherein the optical inspector unit is a 3D in-flight optical inspector unit.
17. The method of claim 12 , wherein the inspector unit is located outside of a processing line, and wherein the processing line includes a source selecting device.
18. The method of claim 1 , wherein measured quality value is generated by any one of the following: an optical sensor, a moisture sensor, a microtoxin sensor, a thermometer sensor, an acidity sensor, a microwave sensor, a pressure sensor, a level sensor, an ultrasonic sensor, a flow sensor, a viscosity sensor, a conductance/impedance sensor, an electronic nose (sniffing) sensor, an X-ray sensor, a multi spectral (visual/non visual) sensor, a weight sensor, a refractometer sensor, a tenderometer sensor, a firmness sensor, or a hardness sensor.
19. The method of claim 1 , wherein the source control instruction is generated utilizing machine learning.
20. The method of claim 1 , wherein the source control instruction is received by multiple devices, and wherein the source control instruction causes one or more of the multiple devices to output a sample to a processing line.
21. A method, comprising:
(a) receiving a target quality value, wherein the target quality value represents a desired average quality value of a plurality of samples directed to a collector;
(b) receiving a measured quality value from an inspection device, wherein the measured quality value is generated at least in part by the inspection device in response to inspecting a sample;
(c) receiving a source quality value from a memory unit, wherein the source quality value indicates an average quality value of a plurality of samples included in a first sample source; and
(d) sending a source control instruction to the first sample source, wherein the source control instruction causes a sample from the first sample source to be inspected by the inspection device and directed toward the collector, wherein the source control instruction is based at least in part on the target quality value, the measured quality value, and the source quality value, and wherein the measured quality value is not measured during manufacturing of the sample.