Burn-in mitigation and associated imaging systems and methods

1. A method comprising:

applying a first bias signal to a sensor array of an imaging device to increase a temperature of the sensor array to facilitate burn-in mitigation;

during the applying, setting a clock rate associated with the sensor array and a readout circuit coupled to the sensor array to a first rate;

after the applying, setting the clock rate to a second rate different from the first rate;

reducing the temperature of the sensor array; and

after the reducing the temperature, determining whether a burn-in is present in the sensor array.

2. The method of claim 1 , further comprising receiving user input associated with the burn-in mitigation, wherein the applying is performed in response to the user input.

3. The method of claim 1 , wherein the applying is performed in response to a power on of the imaging device.

4. The method of claim 1 , further comprising determining whether the burn-in is present in at least a portion of the sensor array, wherein the applying is performed to remove the burn-in, and wherein the determining whether the burn-in is present comprises determining whether the burn-in has been removed.

5. The method of claim 4 , further comprising:

in response to determining the burn-in has been removed, applying a second bias signal different from the first bias signal; and

capturing, by the sensor array with the second bias signal applied, an image.

6. The method of claim 5 , wherein the first bias signal is associated with a first bias level, and wherein the second bias signal is associated with a second bias level lower than the first bias level.

7. The method of claim 4 , further comprising:

in response to determining that the burn-in is present, applying a first load voltage to the sensor array to increase the temperature of the sensor array; and

in response to determining that the burn-in has been removed, applying a second load voltage to the sensor array, wherein the second load voltage is different from the first load voltage.

8. The method of claim 4 , further comprising, in response to determining the burn-in has not been removed, repeating the applying, the reducing, and the determining whether the burn-in has been removed.

9. The method of claim 1 , further comprising capturing, by the sensor array, radiation associated with a high-irradiance source, wherein the burn-in is associated with the radiation, wherein the high-irradiance source comprises the Sun, wherein the sensor array is off during the capturing, and wherein the sensor array comprises a plurality of microbolometers.

10. An imaging device comprising:

a sensor array configured to capture images of a scene; and

a processing circuit configured to:

apply a first bias signal to the sensor array to increase a temperature of the sensor array to a first temperature for burn-in mitigation;

reduce the temperature of the sensor array;

after reducing the temperature, determine whether a burn-in is present in the sensor array; and

apply a second bias signal different from the first bias signal in response to determining that the burn-in is not present; and

the sensor array is configured to capture, with the second bias signal applied, an image.

11. The imaging device of claim 10 , wherein the processing circuit is further configured to receive user input associated with the burn-in mitigation, and wherein the processing circuit is configured to apply the first bias signal in response to the user input.

12. The imaging device of claim 10 , wherein the processing circuit is further configured to determine, prior to applying the first bias signal, that the burn-in is present in at least a portion of the sensor array, and wherein the processing circuit is configured to apply the first bias signal based on determining that the burn-in is present.

13. An imaging device comprising:

a sensor array configured to capture images of a scene; and

a processing circuit configured to:

apply a first bias signal to the sensor array to increase a temperature of the sensor array to a first temperature for burn-in mitigation;

reduce the temperature of the sensor array;

after reducing the temperature, determine whether a burn-in is present in the sensor array;

apply a first load voltage to the sensor array in response to a determination that the burn-in is present; and

apply a second load voltage to the sensor array in response to a determination that the burn-in is not present, wherein the second load voltage is different from the first load voltage.

14. The imaging device of claim 10 , wherein, in response to a determination that the burn-in is present:

the processing circuit is configured to apply the first bias signal to the sensor array to increase the temperature of the sensor array to the first temperature;

the sensor array is configured to reduce from the first temperature to a second temperature; and

the processing circuit is configured to determine whether the burn-in has been removed.

15. The imaging device of claim 10 , further comprising a clock generator configured to:

during applying of the first bias signal, set a clock rate associated with the sensor array to a first rate; and

after the applying, setting the clock rate associated with the sensor array to a second rate higher than the first rate.

16. The imaging device of claim 15 , wherein the clock rate is associated with a readout circuit coupled to the sensor array.

17. The imaging device of claim 10 , wherein the sensor array is configured to capture radiation associated with a high-irradiance source when the sensor array is off, and wherein the burn-in is associated with the radiation.

18. The imaging device of claim 10 , further comprising a microbolometer focal plane array comprising the sensor array and a readout circuit, and wherein the microbolometer focal plane array comprises an uncooled microbolometer focal plane array.

19. The imaging device of claim 13 , further comprising a clock generator configured to:

set a clock rate associated with the sensor array to a first rate in response to a determination that the burn-in is present; and

set the clock rate associated with the sensor array to a second rate higher than the first rate in response to a determination that the burn-in is not present.

20. The imaging device of claim 13 , wherein the processing circuit is further configured to apply a second bias signal having a voltage level lower than a voltage level of the first bias signal in response to a determination that the burn-in is not present.