IP Library Granted Patent US 12,399,044
Granted Patent B2
US 12,399,044 · App. 17/985,694 · Granted Aug 26, 2025

Diagnostic coverage improvements in redundant sensor element fault detection architectures

Inventor: Joe Bergeron (Greensboro, NC)
Assignee: Analog Devices, Inc.
G01D21/02G06F11/00G05B23/0221
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,399,044
App. No.
17/985,694
Granted
Aug 26, 2025
Kind
B2
Abstract

Aspects of the present disclosure provide apparatuses for minimizing the impacts of differences in sensor measurements while sensors are being used. An apparatus in accordance with an aspect of the present disclosure may comprise a first sensor, a second sensor, a combiner, coupled to the first sensor and the second sensor, and a comparator, coupled to the first sensor and the second sensor, wherein the combiner and comparator modify a dynamic limit of the apparatus based at least in part on a first uncertainty in a first output of the first sensor and a second uncertainty in a second output of the second sensor.

Claims (27)

1. An apparatus, comprising:

a first sensor configured to output a first output;

a second sensor configured to output a second output;

a combiner, coupled to the first sensor and the second sensor; and

a comparator, coupled to the first sensor and the second sensor,

wherein the combiner and comparator are mutually configured to modify a dynamic limit of the apparatus based at least in part on a first uncertainty in the first output of the first sensor and a second uncertainty in the second output of the second sensor, by averaging the first output and the second output, and adding one or more faults detected in the first uncertainty and the second uncertainty, to increase an operating range for detecting uncertainties outputted by the first sensor and/or the second sensor.

2. The apparatus of claim 1 , wherein the comparator compares an average of the first output and the second output against a threshold.

3. The apparatus of claim 2 , wherein the first uncertainty in the first output is determined at least in part by one or more of a first noise error, a first uncertainty error, a first scale error, a first quantization error, and a first sensor uncertainty.

4. The apparatus of claim 3 , wherein the second uncertainty in the second output is determined at least in part by one or more of a second noise error, a second uncertainty error, a second scale error, a second quantization error, and a second sensor uncertainty.

5. The apparatus of claim 4 , wherein the dynamic limit is based at least in part on an input to the first sensor and the second sensor.

6. The apparatus of claim 5 , wherein the dynamic limit is modified as the input deviates from a nominal value.

7. The apparatus of claim 1 , further comprising a first averager coupled to the first sensor.

8. The apparatus of claim 7 , wherein the first averager averages a plurality of first outputs of the first sensor.

9. The apparatus of claim 8 , wherein the combiner averages an output of the first averager.

10. The apparatus of claim 7 , further comprising a second averager coupled to the second sensor.

11. The apparatus of claim 10 , wherein the second averager averages a plurality of second outputs of the second sensor.

12. The apparatus of claim 11 , wherein the combiner averages an output of the first averager and an output of the second averager.

13. An integrated sensor, comprising:

a first sensor configured to output a first output;

a second sensor configured to output a second output;

a combiner, coupled to the first sensor and the second sensor; and

a comparator, coupled to the first sensor and the second sensor, wherein the combiner and comparator are mutually configured to modify a dynamic limit of the apparatus based at least in part on a first uncertainty in the first output of the first sensor and a second uncertainty in the second output of the second sensor, by averaging the first output and the second output, and adding one or more faults detected in the first uncertainty and the second uncertainty, to increase an operating range for detecting uncertainties outputted by the first sensor and/or the second sensor.

14. The integrated sensor of claim 13 , wherein the comparator compares an average of the first output and the second output against a threshold.

15. The integrated sensor of claim 14 , wherein the first uncertainty in the first output is determined at least in part by one or more of a noise error, an uncertainty error, a scale error, a quantization error, and a sensor uncertainty.

16. The integrated sensor of claim 13 , wherein the dynamic limit is based at least in part on an input to the first sensor and the second sensor.

17. The integrated sensor of claim 13 , further comprising a first averager coupled to the first sensor.

18. The integrated sensor of claim 17 , wherein the combiner averages an output of the first averager.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 2, 2023
From: BERGERON, JOE
To: ANALOG DEVICES, INC.
Reel/Frame 063837/0561 →
Continuity (1)
Related Publication 20240159578A1 · May 16, 2024
References Cited (26)
US 5710776A · Tomlinson · 1998 [cited by examiner]
US 5761090A · Gross · 1998 [cited by examiner]
US 5774378A · Yang · 1998 [cited by examiner]
US 6741919B1 · Schuster · 2004 [cited by examiner]
US 6757579B1 · Pasadyn · 2004 [cited by examiner]
US 11914357B1 · Nguyen · 2024 [cited by examiner]
US 12163867B1 · Vilim · 2024 [cited by examiner]
US 20060085102A1 · Doel · 2006 [cited by examiner]
US 20090198408A1 · Salman · 2009 [cited by examiner]
US 20110125419A1 · Bechhoefer · 2011 [cited by examiner]
US 20130293217A1 · Moiseev · 2013 [cited by examiner]
US 20150169393A1 · Shibuya · 2015 [cited by examiner]
US 20150351670A1 · Vanslyke · 2015 [cited by examiner]
US 20170370985A1 · Rachmawati · 2017 [cited by examiner]
US 20180031428A1 · Uno · 2018 [cited by examiner]
US 20180307218A1 · Lavid Ben Lulu · 2018 [cited by examiner]
US 20190235482A1 · Subramaniyan · 2019 [cited by examiner]
US 20210149465A1 · Hiltner · 2021 [cited by examiner]
US 20210335059A1 · Dixit · 2021 [cited by examiner]
US 20220051017A1 · Choi · 2022 [cited by examiner]
US 20220162998A1 · Lee · 2022 [cited by examiner]
US 20220171376A1 · Kim · 2022 [cited by examiner]
US 20220176547A1 · Smith · 2022 [cited by examiner]
US 20230195413A1 · Kastrup · 2023 [cited by examiner]
US 20230400508A1 · Freese · 2023 [cited by examiner]
US 20240308660A1 · Strihagen · 2024 [cited by examiner]