Acoustic wave device
An acoustic wave device includes a support substrate, a low-acoustic-velocity film on the support substrate, a piezoelectric layer on the low-acoustic-velocity film, an IDT electrode on the piezoelectric layer, and a high-acoustic-velocity film between the support substrate and the low-acoustic-velocity film. An acoustic velocity of a bulk wave propagating through the low-acoustic-velocity film is lower than an acoustic velocity of a bulk wave propagating through the piezoelectric layer. An acoustic velocity of a bulk wave propagating though the high-acoustic-velocity film is higher than an acoustic velocity of an acoustic wave propagating through the piezoelectric layer. Adhesion between the low-acoustic-velocity film and the support substrate is higher than adhesion between the high-acoustic-velocity film and the support substrate. The high-acoustic-velocity film is between portions of the support substrate and the low-acoustic-velocity film, and a portion of the low-acoustic-velocity film and a portion of the support substrate contact each other.
1. An acoustic wave device comprising:
a support substrate;
a low-acoustic-velocity film on the support substrate;
a piezoelectric layer on the low-acoustic-velocity film;
an IDT electrode on the piezoelectric layer; and
a high-acoustic-velocity film between the support substrate and the low-acoustic-velocity film; wherein
an acoustic velocity of a bulk wave propagating through the low-acoustic-velocity film is lower than an acoustic velocity of a bulk wave propagating through the piezoelectric layer;
an acoustic velocity of a bulk wave propagating though the high-acoustic-velocity film is higher than an acoustic velocity of an acoustic wave propagating through the piezoelectric layer;
adhesion between the low-acoustic-velocity film and the support substrate is higher than adhesion between the high-acoustic-velocity film and the support substrate; and
the high-acoustic-velocity film is between a portion of the support substrate and a portion of the low-acoustic-velocity film, and a portion of the low-acoustic-velocity film and a portion of the support substrate contact each other.
2. The acoustic wave device according to claim 1 , wherein the support substrate includes silicon and the high-acoustic-velocity film includes silicon nitride.
3. The acoustic wave device according to claim 1 , wherein the support substrate includes silicon and the low-acoustic-velocity film includes silicon oxide.
4. The acoustic wave device according to claim 1 , wherein the high-acoustic-velocity film is provided in a region where the IDT electrode is provided in plan view.
5. The acoustic wave device according to claim 4 , wherein the high-acoustic-velocity film is provided only in the region where the IDT electrode is provided in plan view.
6. The acoustic wave device according to claim 1 , wherein the high-acoustic-velocity film includes a portion outside of a region where the IDT electrode is provided in plan view and at least one through hole is provided in the portion outside the region.
7. The acoustic wave device according to claim 1 , wherein at least one through hole is provided in the high-acoustic-velocity film within a region where the IDT electrode is provided in plan view.
8. The acoustic wave device according to claim 1 , wherein the high-acoustic-velocity film overlaps all of a region where the IDT electrode is provided in plan view.
9. The acoustic wave device according to claim 1 , wherein one layer of the high-acoustic-velocity film is between the support substrate and the low-acoustic-velocity film.
10. An acoustic wave device comprising:
a support substrate;
a low-acoustic-velocity film on the support substrate;
a piezoelectric layer on the low-acoustic-velocity film;
an IDT electrode on the piezoelectric layer; and
a high-acoustic-velocity film between the support substrate and the low-acoustic-velocity film; wherein
the support substrate includes silicon;
the low-acoustic-velocity film includes at least one material selected from a group consisting of silicon oxide, tantalum oxide, and compounds obtained by adding fluorine, carbon or boron to silicon oxide;
the high-acoustic-velocity film includes at least one material selected from a group consisting of diamond-like carbon, aluminum nitride, silicon carbide, silicon nitride, silicon oxynitride, silicon, sapphire, lithium tantalate, lithium niobate, quartz, zirconia, cordierite, mullite, steatite, forsterite, magnesia, and diamond; and
the high-acoustic-velocity film is between a portion of the support substrate and a portion of the low-acoustic-velocity film, and a portion of the low-acoustic-velocity film and a portion of the support substrate directly contact each other on a surface of the support substrate on which the high-acoustic-velocity film is provided in a stacking direction of the support substrate, the high-acoustic-velocity film, and the low-acoustic-velocity film.
11. The acoustic wave device according to claim 10 , wherein the support substrate includes silicon and the high-acoustic-velocity film includes silicon nitride.
12. The acoustic wave device according to claim 10 , wherein the support substrate includes silicon and the low-acoustic-velocity film includes silicon oxide.
13. The acoustic wave device according to claim 10 , wherein the high-acoustic-velocity film is provided in a region where the IDT electrode is provided in plan view.
14. The acoustic wave device according to claim 13 , wherein the high-acoustic-velocity film is provided only in the region where the IDT electrode is provided in plan view.
15. The acoustic wave device according to claim 10 , wherein the high-acoustic-velocity film includes a portion outside of a region where the IDT electrode is provided in plan view and at least one through hole is provided in the portion outside the region.
16. The acoustic wave device according to claim 10 , wherein at least one through hole is provided in the high-acoustic-velocity film within a region where the IDT electrode is provided in plan view.
17. The acoustic wave device according to claim 10 , wherein the high-acoustic-velocity film overlaps all of a region where the IDT electrode is provided in plan view.
18. The acoustic wave device according to claim 10 , wherein one layer of the high-acoustic-velocity film is between the support substrate and the low-acoustic-velocity film.