IP Library Granted Patent US 12,499,176
Granted Patent B2
US 12,499,176 · App. 17/990,569 · Granted Dec 16, 2025

High throughput characterization of aggregate particles

Inventors: Ray Anthony Nagatani, Jr. (San Francisco, CA); Allen Richard Zhao (Mountain View, CA); Antonio Raymond Papania-Davis (Oakland, CA); Weishi Yan (Oakland, CA); Jeffrey Bush (Los Altos, CA); Charles Stephen Spirakis (Mountain View, CA); Brian Howell (Berkeley, CA)
Assignee: X Development LLC
G06F18/214G06F18/251
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Quick Facts
Patent No.
US 12,499,176
App. No.
17/990,569
Granted
Dec 16, 2025
Kind
B2
Abstract

Methods, systems, and apparatus, including computer programs encoded on computer storage media, for characterization of aggregate particles. A method includes obtaining, from a set of low fidelity sensors, first sensor data of a first portion of particles; obtaining, from a set of high fidelity sensors, second sensor data of the first portion of particles, the second sensor data comprising a higher fidelity representation of characteristics of the first portion of particles than the first sensor data; training a characterization model using the first sensor data and the second sensor data, the training comprising: providing, as training data to the characterization model, the second sensor data; and processing the second sensor data with the characterization model to correlate the first sensor data with the second sensor data. The first sensor data can indicate shape characteristics of each particle; and the second sensor data indicates a surface area of each particle.

Claims (54)

1 . A method comprising:

obtaining, from a set of low fidelity sensors, first sensor data of a first portion of particles;

obtaining, from a set of high fidelity sensors, second sensor data of the first portion of particles, the second sensor data comprising a higher fidelity representation of characteristics of the first portion of particles than the first sensor data;

training a characterization model using the first sensor data and the second sensor data, the training comprising:

providing, as training data to the characterization model, the second sensor data; and

processing the second sensor data with the characterization model to correlate the first sensor data with the second sensor data.

2 . The method of claim 1 , wherein:

the first sensor data indicates shape characteristics of each particle of the first portion of particles;

the second sensor data indicates a surface area of each particle of the first portion of particles; and

processing the second sensor data with the characterization model to correlate the first sensor data with the second sensor data comprises mapping the shape characteristics to the surface areas of the first portion of particles.

3 . The method of claim 1 , comprising:

determining, using the trained characterization model, characteristics of a second portion of particles, the determining comprising:

providing, to the characterization model, third sensor data of the second portion of particles, wherein the third sensor data is generated by the set of low-fidelity sensors; and

receiving, as output from the characterization model, data indicating characteristics of the second portion of particles.

4 . The method of claim 3 , wherein:

the third sensor data indicates shape characteristics of the second portion of particles; and

receiving, as output from the characterization model, the data indicating the characteristics of the second portion of particles comprises receiving, as output from the characterization model, data indicating surface areas of the second portion of particles.

5 . The method of claim 3 , comprising:

obtaining the second sensor data of the first portion of particles at a first mass flow rate; and

obtaining the third sensor data of the second portion of particles at a second mass flow rate, the second mass flow rate being at least one hundred times the first mass flow rate.

6 . The method of claim 3 , wherein the second portion of particles includes a mass of particles that is at least one thousand times greater than the mass of the first portion of particles.

7 . The method of claim 1 , wherein the set of low fidelity sensors include at least one of an ultrasound sensor, a depth camera, a multi-camera array, monochrome camera, a line scanner.

8 . The method of claim 1 , wherein the set of high fidelity sensors include at least one of a laser scanner, a stereoscopic camera, a LiDAR sensor, a spectrometer.

9 . The method of claim 1 , wherein each of the low fidelity sensors has a spatial resolution of one millimeter or greater.

10 . The method of claim 1 , wherein each of the high fidelity sensors has a spatial resolution of one millimeter or less.

11 . The method of claim 1 , wherein the set of low fidelity sensors is arranged in a ring, each sensor in the ring having a same elevation and being configured to generate low fidelity sensor data from measurement of particles passing through the ring.

12 . The method of claim 1 , wherein the set of high fidelity sensors is arranged in a ring, each sensor in the ring having a same elevation and being configured to generate high fidelity sensor data from measurement of particles passing through the ring.

13 . The method of claim 1 , wherein the set of low fidelity sensors and the set of high fidelity sensors are arranged in a ring, each sensor in the ring having a same elevation, the low fidelity sensors interspersed with the high fidelity sensors in the ring.

14 . The method of claim 1 , wherein each sensor of the set of low fidelity sensors aligns with a sensor of the set of high fidelity sensors in a vertical direction with respect to gravity.

15 . A system comprising:

a set of high fidelity sensors;

a set of low fidelity sensors; and

one or more computers and one or more storage devices on which are stored instructions that are operable, when executed by the one or more computers, to cause the one or more computers to perform operations comprising:

obtaining, from the set of low fidelity sensors, first sensor data of a first portion of particles

obtaining, from the set of high fidelity sensors, second sensor data of the first portion of particles, the second sensor data comprising a higher fidelity representation of characteristics of the first portion of particles than the first sensor data;

training a characterization model using the first sensor data and the second sensor data, the training comprising:

providing, as training data to the characterization model, the second sensor data; and

processing the second sensor data with the characterization model to correlate the first sensor data with the second sensor data.

16 . The system of claim 15 , wherein: the first sensor data indicates shape characteristics of each particle of the first portion of particles;

the second sensor data indicates a surface area of each particle of the first portion of particles; and

processing the second sensor data with the characterization model to correlate the first sensor data with the second sensor data comprises mapping the shape characteristics to the surface areas of the first portion of particles.

17 . The system of claim 15 , the operations comprising:

determining, using the trained characterization model, characteristics of a second portion of particles, the determining comprising:

providing, to the characterization model, third sensor data generated from measurement of the second portion of particles by the set of low-fidelity sensors; and

receiving, as output from the characterization model, data indicating characteristics of the second portion of particles.

18 . The system of claim 17 , wherein:

the third sensor data indicates shape characteristics of the second portion of particles; and receiving, as output from the characterization model, the data indicating the characteristics of the second portion of particles comprises receiving, as output from the characterization model, data indicating surface areas of the second portion of particles.

19 . The system of claim 17 , wherein the second portion of particles includes a mass of particles that is at least one hundred times greater than the mass of the first portion of particles.

20 . A non-transitory computer storage medium encoded with instructions that, when executed by one or more computers, cause the one or more computers to perform operations comprising:

obtaining, from a set of low fidelity sensors, first sensor data of a first portion of particles

obtaining, from a set of high fidelity sensors, second sensor data of the first portion of particles, the second sensor data comprising a higher fidelity representation of characteristics of the first portion of particles than the first sensor data;

training a characterization model using the first sensor data and the second sensor data, the training comprising:

providing, as training data to the characterization model, the second sensor data; and

processing the second sensor data with the characterization model to correlate the first sensor data with the second sensor data.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE INVENTOR'S NAME OF RAY JR. ANTHONY NAGATANI TO RAY ANTHONY NAGATANI JR. PREVIOUSLY RECORDED ON REEL 62729 FRAME 571. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. . Recorded Nov 6, 2025
From: NAGATANI, RAY ANTHONY, JR.; ZHAO, ALLEN RICHARD; PAPANIA-DAVIS, ANTONIO RAYMOND; YAN, WEISHI; BUSH, JEFFREY; SPIRAKIS, CHARLES STEPHEN; HOWELL, BRIAN
To: X DEVELOPMENT LLC
Reel/Frame 073481/0677 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 17, 2023
From: NAGATANI, RAY JR. ANTHONY; ZHAO, ALLEN RICHARD; PAPANIA-DAVIS, ANTONIO RAYMOND; YAN, WEISHI; BUSH, JEFFREY; SPIRAKIS, CHARLES STEPHEN; HOWELL, BRIAN
To: X DEVELOPMENT LLC
Reel/Frame 062729/0571 →
Continuity (1)
Related Publication 20240169030A1 · May 23, 2024
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