IP Library › Granted Patent US 12,034,437
Granted Patent B2
US 12,034,437 · App. 18/024,086 · Granted Jul 9, 2024

Signal transmission device, electronic device and vehicle

Inventors: Takeshi Kikuchi (Kyoto, JP); Masato Nishinouchi (Kyoto, JP); Akio Sasabe (Kyoto, JP); Daiki Yanagishima (Kyoto, JP)
Assignee: Rohm Co., Ltd.
H03K17/18H02P29/0241
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Quick Facts
Patent No.
US 12,034,437
App. No.
18/024,086
Granted
Jul 9, 2024
Kind
B2
Abstract

A signal transmission device that transmits a driving signal for a power transistor from a primary circuit system to a secondary circuit system while isolating between the primary and secondary circuit systems includes: a first fault detection circuit configured to detect a fault in the primary circuit system; a second fault detection circuit configured to detect a fault in the secondary circuit system; a first signal transmission path configured to transmit the result of detection by the second fault detection circuit from the secondary circuit system to the primary circuit system while isolating between the primary and secondary circuit systems; and a self-test circuit configured to perform a self-test on each of the first fault detection circuit, the second fault detection circuit, and the first signal transmission path.

Claims (40)

1. A signal transmission device configured to transmit a driving signal for a power transistor from a primary circuit system to a secondary circuit system while isolating between the primary and secondary circuit systems, comprising:

a first fault detection circuit configured to detect a fault in the primary circuit system;

a second fault detection circuit configured to detect a fault in the secondary circuit system;

a first signal transmission path configured to transmit a result of detection by the second fault detection circuit from the secondary circuit system to the primary circuit system while isolating between the primary and secondary circuit systems; and

a self-test circuit configured to perform a self-test on each of the first fault detection circuit, the second fault detection circuit, and the first signal transmission path.

2. The signal transmission device according to claim 1 , wherein

the self-test circuit includes a second signal transmission path configured to transmit a result of the self-test on the second fault detection circuit from the secondary circuit system to the primary circuit system while isolating between the primary and secondary circuit systems.

3. The signal transmission device according to claim 1 , wherein

when

a self-test instruction transmission period from the primary circuit system to the secondary circuit system is represented by Ta,

a self-test period with respect to the second fault detection circuit is represented by Te,

a protection retention period after cancellation of fault detection in the secondary circuit system is represented by Tf, and

a total self-test period is represented by Tg,

then a maximum value of Ta+Te+Tf is less than a minimum value of Tg.

4. The signal transmission device according to claim 1 , wherein

when

a self-test instruction transmission period from the primary circuit system to the secondary circuit system is represented by Ta,

a fault detection masking period of the second fault detection circuit is represented by Tb,

a self-test result transmission period from the secondary circuit system to the primary circuit system is represented by Tc, and

a self-test period with respect to the first fault detection circuit is represented by Td,

then a maximum value of Ta+Tb+Tc is less than a minimum value of Td.

5. The signal transmission device according to claim 1 , wherein

when

a fault detection masking period of the second fault detection circuit is represented by Tb, and

a self-test period with respect to the second fault detection circuit is represented by Te,

then a maximum value of Tb is less than a minimum value of Te.

6. The signal transmission device according to claim 1 , wherein

the self-test circuit is configured to transmit a self-test instruction from the primary circuit system to the secondary circuit system by driving an off signal for the power transistor with a number of pulses different than in ordinary operation.

7. The signal transmission device according to claim 1 , wherein

the self-test circuit is configured to transmit a self-test instruction from the primary circuit system to the secondary circuit system by driving an off signal for the power transistor with a pulse period different than in ordinary operation.

8. The signal transmission device according to claim 1 , wherein

a first chip having integrated therein circuit elements of the primary circuit system,

a second chip having integrated therein circuit elements of the secondary circuit system, and

a third chip having integrated therein an isolating element configured to isolate between the primary and secondary circuit systems

are sealed in a single package.

9. An electronic device comprising:

a power transistor; and

a gate driver IC configured to drive a gate of the power transistor,

wherein the gate driver IC is the signal transmission device according to claim 1 .

10. A vehicle comprising the electronic device according to claim 9 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 1, 2023
From: KIKUCHI, TAKESHI; NISHINOUCHI, MASATO; SASABE, AKIO; YANAGISHIMA, DAIKI
To: ROHM CO., LTD.
Reel/Frame 062847/0423 →
Priority Claims (1)
JP 2020-163734 · Sep 29, 2020 · national
Continuity (1)
Related Publication 20230327662A1 · Oct 12, 2023
Cited By (1)
US 12,395,167