IP Library › Granted Patent US 12,304,157
Granted Patent B2
US 12,304,157 · App. 18/047,908 · Granted May 20, 2025

In-situ monitoring and control of induction welding of thermoplastic composites using amorphous or nanocrystalline microwire temperature sensors and self-centering antennae rail system

Inventors: Brian Lee Clothier (Wichita, KS); Michael J. Bourke, III (Brighton, MI); Vladimir Malyshev (Moscow Region, RU)
Assignee: TSI Technologies LLC
B29C66/91216B29C66/7392B29C66/91221
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Quick Facts
Patent No.
US 12,304,157
App. No.
18/047,908
Granted
May 20, 2025
Kind
B2
Abstract

A thermoplastic composite welding microwire temperature measurement system broadly comprises a plurality of moveable antennae configured to transmit interrogation signals, a rail system including a motorized linear stage configured to move the antennae along a weld line, and a reader or processor configured to determine a position of the microwire temperature sensor and determine a welding temperature based on response signals of the sensor. The interrogation signal corresponds to two different maximum ramp current amplitudes to create two re-magnetization pulses non-overlapping in the time domain.

Claims (24)

1. A microwire temperature measurement system configured to determine a temperature of a microwire temperature sensor including at least first and second temperature range microwire elements, the microwire temperature measurement system comprising:

an antenna configured to be positioned near the microwire temperature sensor; and

a reader configured to transmit an instigation signal to the antenna so that the antenna generates an interrogation signal such that the microwire temperature sensor generates a response signal when the antenna is near the microwire temperature sensor, the instigation signal including a first maximum ramp current amplitude and a second maximum ramp current amplitude greater than the first maximum ramp amplitude so that the response signal includes a first re-magnetization pulse corresponding to the first temperature range microwire element and a second re-magnetization pulse corresponding to the second temperature range microwire element, the first and second re-magnetization pulses being non-overlapping in the time domain.

2. The microwire temperature measurement system of claim 1 , the interrogation signal spanning an interrogation period divided into a first portion corresponding to the first maximum ramp current amplitude of the instigation signal and a second portion after the first portion corresponding to the second maximum ramp current amplitude of the instigation signal.

3. The microwire temperature measurement system of claim 1 , wherein the reader is configured to select the first maximum ramp current amplitude and the second maximum ramp current amplitude in a calibration mode.

4. The microwire temperature measurement system of claim 1 , wherein the microwire temperature measurement system is part of a thermoplastic welding system.

5. The microwire temperature measurement system of claim 3 , wherein the reader is configured to, in the calibration mode, iteratively change the first maximum ramp current amplitude and a second maximum ramp current amplitude until a peak-to-peak interval in the time domain of the first re-magnetization pulse and second re-magnetization pulse is optimized.

6. The microwire temperature measurement system of claim 1 , the determined microwire sensor temperature being in one of three zones: a first zone at or below a Curie temperature of the first and second temperature range microwire elements, a second zone above the Curie temperature of the first temperature range microwire element and below the Curie temperature of the second temperature range microwire element, and a third zone at or above the Curie temperature of the second temperature range microwire element.

7. The microwire temperature measurement system of claim 1 , wherein the microwire temperature sensor further includes a reference microwire element, the response signal including a third re-magnetization pulse corresponding to the reference microwire element, the processor being further configured to normalize the response signal based on the third re-magnetization pulse.

8. The microwire temperature measurement system of claim 1 , wherein the instigation signal comprises a ramped alternating current having a triangular waveform and the first and second re-magnetization pulses are voltage pulses.

9. A thermoplastic welding microwire temperature measurement system configured to locate a microwire temperature sensor on a weld line via sensor interrogation, the thermoplastic welding microwire temperature measurement system comprising:

an antenna configured to be positioned near the microwire temperature sensor;

a reader configured to transmit an instigation signal to the antenna so that the antenna generates an interrogation signal such that the microwire temperature sensor generates a response signal when the antenna is near the microwire temperature sensor;

a motorized stage configured to move the antenna along the weld line; and

a processor configured to determine a position of the microwire temperature sensor based on the response signal.

10. The thermoplastic welding microwire temperature measurement system of claim 9 , the processor being further configured to instruct the motorized stage to move the antenna to the position of the microwire temperature sensor during a welding operation to take a temperature measurement via the microwire temperature sensor.

11. The thermoplastic welding microwire temperature measurement system of claim 9 , the processor being further configured to determine a center of the microwire temperature sensor based on at least two interrogations of the microwire temperature sensor by the antenna.

12. The thermoplastic welding microwire temperature measurement system of claim 11 , wherein the microwire temperature sensor includes a reference element, at least one of the two interrogations eliciting a response signal from the reference element.

13. The thermoplastic welding microwire temperature measurement system of claim 9 , wherein the response signal includes a re-magnetization pulse and the processor is further configured to integrate the re-magnetization pulse to determine the position.

14. The thermoplastic welding microwire temperature measurement system of claim 9 , wherein the response signal includes a plurality of re-magnetization pulses and the processor is further configured to integrate the plurality of re-magnetization pulses and average the integrals to determine the position.

15. The thermoplastic welding microwire temperature measurement system of claim 14 , wherein the processor is further configured to compare the average to a preset minimum threshold value to determine the position.

16. The thermoplastic welding microwire temperature measurement system of claim 9 , wherein the response signal includes a plurality of re-magnetization pulses and the processor is further configured to integrate the plurality of re-magnetization pulses, average the integrals, compare the average to a previous average to determine a difference, and compare the difference to a preset minimum threshold value to determine the position.

17. The thermoplastic welding microwire temperature measurement system of claim 9 , further comprising:

an additional antenna spaced from the antenna, the processor being further configured to instruct the motorized stage to advance the antenna past the microwire temperature sensor and move the additional antenna to the position of the microwire temperature sensor during a welding process to take a temperature measurement via the microwire temperature sensor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 25, 2023
From: CLOTHIER, BRIAN LEE; BOURKE, MICHAEL J., III; MALYSHEV, VLADIMIR
To: TSI TECHNOLOGIES LLC
Reel/Frame 063426/0326 →
Continuity (2)
Provisional Application 63360674 · Oct 20, 2021
Related Publication 20230117692A1 · Apr 20, 2023
References Cited (10)
US 4203544A · Guilgue · 1980 [cited by applicant]
US 5729291A · Tanaka et al. · 1998 [cited by applicant]
US 7794142B2 · Clothier et al. · 2010 [cited by applicant]
US 8192080B2 · Clothier · 2012 [cited by applicant]
US 8251581B2 · Clothier et al. · 2012 [cited by applicant]
US 8258441B2 · Clothier · 2012 [cited by applicant]
US 9126170B2 · Clothier · 2015 [cited by applicant]
US 9212955B2 · Clothier · 2015 [cited by applicant]
US 10687071B2 · Xu · 2020 [cited by examiner]
Antonenco et al.; Annealing induced evolution of structure and high frequency magnetic properties in nanocrystalline glass-coated microwires; published in Materials Science and Engineering A 304-306 in 2001, pp. 975 to … [cited by applicant]