HIGH EFFICIENCY STRESS HISTORY MODELLING AND COMPENSATION

1 . A method of compensating for degradation of pixels of a display panel including organic light emitting devices (OLED), said method comprising:

determining a stress history model for the pixels generating model parameters including a drive level power factor which linearizes the correction drive level versus accumulated stress in the model;

storing the correction parameters in a memory of the display;

maintaining a stress history of the pixels of the display according to the stress history model with use of the model parameters;

generating stress history corrected drive levels for the pixels with use of said parameters generating corrected drive levels for the pixels; and

displaying images on the display with use of the corrected drive levels.

2 . The method of claim 1 , wherein determining stress history comprises:

testing populations of pixels of each color for the type of display panel and determining a drive level power factor for each population of pixels.

3 . The method of claim 2 , wherein the stress history model defines stress as a summation of drive levels raised to the power factor, up to some constant factor.

4 . The method of claim 3 , wherein determining the stress history model comprises stressing each population of pixels while periodically testing the pixels at one or more testing drive levels to determine correction drive level versus accumulated stress.

5 . The method of claim 4 , wherein stressing each population of pixels comprises continuously driving the pixels at predetermined stress drive levels.

6 . The method of claim 5 , wherein the model parameters include parameters defining a pixel gain and an offset in terms of the accumulated stress.

7 . The method of claim 6 , wherein the model parameters include parameters which define a linear relationship between pixel gain and accumulated stress and a linear relationship between offset and accumulated stress.

8 . A system for compensating for degradation of pixels of a display panel including organic light emitting devices (OLED), said system comprising:

the display panel;

optical correction processing and a controller adapted to:

determine a stress history model for the pixels generating model parameters including a drive level power factor which linearizes the correction drive level versus accumulated stress in the model;

store the correction parameters in a memory of the display; and

a controller of display panel adapted to:

maintain a stress history of the pixels of the display according to the stress history model with use of the model parameters;

generate stress history corrected drive levels for the pixels with use of said parameters generating corrected drive levels for the pixels; and

display images on the display with use of the corrected drive levels.

9 . The system of claim 8 , wherein the optical correction processing and controller are adapted to determine the stress history model including testing populations of pixels of each color for the type of display panel and determining a drive level power factor for each population of pixels.

10 . The system of claim 9 , wherein the stress history model defines stress as a summation of drive levels raised to the power factor, up to some constant factor.

11 . The system of claim 10 , wherein the optical correction processing and controller are adapted to determine the stress history model including stressing each population of pixels while periodically testing the pixels at one or more testing drive levels to determine correction drive level versus accumulated stress.

12 . The system of claim 11 , wherein stressing each population of pixels comprises continuously driving the pixels at predetermined stress drive levels.

13 . The system of claim 12 , wherein the model parameters include parameters defining a pixel gain and an offset in terms of the accumulated stress.

14 . The method of claim 6 , wherein the model parameters include parameters which define a linear relationship between pixel gain and accumulated stress and a linear relationship between offset and accumulated stress.