IP Library › Granted Patent US 11,861,889
Granted Patent B2
US 11,861,889 · App. 18/059,846 · Granted Jan 2, 2024

Analysis device

Inventors: Sadao Ota (Tokyo, JP); Issei Sato (Tokyo, JP); Katsuhito Fujiu (Tokyo, JP); Satoko Yamaguchi (Tokyo, JP); Kayo Waki (Tokyo, JP); Yoko Itahashi (Tokyo, JP); Ryoichi Horisaki (Osaka, JP)
Assignees: The University of Tokyo; Osaka University
G06V10/82C12M1/34G01N15/14G01N15/1404G01N15/147G01N15/1429G01N15/1434G01N15/1459G01N21/01G01N21/27G01N21/64G01N21/65G06F18/2178G06F18/28G06V10/772G06V10/7784G06V20/698G01N2015/1006G01N2015/145G01N2015/1413G01N2015/1415G06F2218/12
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Quick Facts
Patent No.
US 11,861,889
App. No.
18/059,846
Granted
Jan 2, 2024
Kind
B2
Abstract

An analysis device includes an analysis unit configured to receive scattered light, transmitted light, fluorescence, or electromagnetic waves from an observed object located in a light irradiation region light-irradiated from a light source and analyze the observed object on the basis of a signal extracted on the basis of a time axis of an electrical signal output from a light-receiving unit configured to convert the received light or electromagnetic waves into the electrical signal.

Claims (41)

1. An analysis system classifying at least one target object among one or more observed objects comprising:

(a) one or more flow cytometers comprising:

(i) at least one flow path configured to permit one or more observed objects to flow therethrough; and

(ii) a light-receiving unit comprising one or more sensors, wherein the one or more sensors are configured to (i) receive at least one electromagnetic wave from the one or more observed objects and (ii) convert the at least one electromagnetic wave into one or more time-series electrical signals;

(b) one or more processors configured to perform machine learning to train a classification model based on the one or more time-series electrical signals from the one or more flow cytometers, wherein the one or more time-series electrical signals comprise one or more signals obtained from the at least one target object; and

(c) one or more logic circuits configured to analyze the one or more time-series electrical signals from the one or more flow cytometers to classify or recognize the at least one target object among the one or more observed objects using the classification model.

2. The analysis system of claim 1 , wherein the one or more flow cytometers further comprises one or more optical elements to illuminate the one or more observed objects with a structured illumination pattern as the one or more observed objects move relative to the structured illumination pattern, wherein the one or more optical elements are disposed along a light path between a light source used to illuminate the one or more observed objects and a light irradiation region in the at least one flow path at which the one or more observed objects are illuminated.

3. The analysis system of claim 1 , wherein the one or more flow cytometers further comprises one or more optical elements which is used to receive the at least one electromagnetic wave from the one or more observed objects as the one or more observed objects move relative to the one or more optical elements, wherein the one or more optical elements is disposed along a light path between a light irradiation region in the at least one flow path at which the one or more observed objects are illuminated and the light-receiving unit.

4. The analysis system of claim 2 or claim 3 , wherein the one or more optical elements comprised in the one or more flow cytometers comprises a plurality of regions with different optical characteristics to irradiate the one or more observed objects with a structured illumination pattern or to receive the at least one electromagnetic wave from the one or more observed objects through the one or more optical elements.

5. The analysis system of claim 1 , wherein the classification model is created by supervised machine learning in combination with unsupervised machine learning.

6. The analysis system of claim 1 , wherein the one or more observed objects comprises one or more objects not being labeled with a fluorescent label, and wherein classifying or recognizing the at least one target object among the one or more observed objects comprises classifying or recognizing the at least one target object among the one or more objects not being labeled with a fluorescent label using the classification model.

7. The analysis system of claim 6 , wherein the classification model is trained through machine learning using the one or more time-series electrical signals obtained from one or more labeled objects, wherein the one or more labeled objects are labeled with a fluorescent label.

8. The analysis system of claim 6 , wherein a classification label indicating the one or more observed objects is the at least one target object or not the at least one target object is attached to each of the one or more time-series electrical signals, and the classification model is made through machine learning using the one or more time-series electrical signals obtained from the one or more observed objects.

9. The analysis system of claim 1 , wherein the analysis system further comprises a storage unit configured to record information relating to the one or more time-series electrical signals, and wherein in (b), the machine learning to train the classification model is performed based on the one or more time-series electrical signals recorded by the storage unit.

10. The analysis system of claim 1 , wherein the classification model is updated based on one or more classification results.

11. The analysis system of claim 1 , wherein the one or more time-series electrical signals from the one or more flow cytometers comprises one or more compressed temporal signals comprising spatial information corresponding to the one or more observed objects.

12. The analysis system of claim 2 , wherein the light-receiving unit further comprises a second sensor configured to image the one or more observed objects.

13. The analysis system of claim 2 , wherein one or more light properties in the light irradiation region is configured to be controlled or adjusted based at least in part based on analysis results of the one or more logic circuits.

14. The analysis system of claim 2 , wherein the structured illumination pattern irradiated to the one or more observed objects is controlled or adjusted by the following processes, comprising:

(a) providing the one or more flow cytometers with a second sensor to obtain a captured image of the one or more observed objects;

(b) changing the structured illumination pattern irradiated to the one or more observed objects at the light irradiation region;

(c) receiving the at least one electromagnetic wave from the one or more observed objects with the one or more sensors;

(d) obtaining the captured image of the one or more observed objects with the second sensor; and

(e) comparing the one or more time-series electrical signals of the at least one electromagnetic wave received by the one or more sensors with one or more calculated signals based on the captured image of the one or more observed objects.

15. The analysis system of claim 2 , wherein the structured illumination pattern irradiated to the one or more observed objects is controlled or adjusted by the following processes, comprising:

(a) providing the one or more flow cytometers with a second sensor to obtain a captured image of the one or more observed objects;

(b) providing one or more logic circuits to reconstruct an image relating to the one or more observed objects based on the one or more time-series electrical signals of the at least one electromagnetic wave received by the one or more sensors, resulting in a reconstructed image of the one or more observed objects;

(c) changing the structured illumination pattern irradiated to the one or more observed objects at the light irradiation region;

(d) receiving the at least one electromagnetic wave from the one or more observed objects with the one or more sensors;

(e) obtaining the captured image of the one or more observed objects; and

(f) comparing the reconstructed image of the one or more observed objects with the captured image of the one or more observed objects.

16. A logic circuit for outputting a classification or recognition of at least one target object among one or more observed objects using a classification model and one or more time-series electrical signals output from one or more flow cytometers without generation of an image:

(a) wherein the one or more flow cytometers comprises;

(i) at least one light source configured to illuminate the one or more observed objects with a light to yield at least one electromagnetic wave;

(ii) at least one flow path configured to permit the one or more observed objects to flow therethrough;

(iii) a light-receiving unit comprising one or more sensors, wherein the one or more sensors is configured to (i) receive the at least one electromagnetic wave from the one or more observed objects and (ii) convert the at least one electromagnetic wave into one or more time-series electrical signals; and

(iv) an optical element having a plurality of regions with different optical characteristics being disposed along a light path between the at least one light source and the light-receiving unit; and

(b) wherein the classification model is trained based on the one or more time-series electrical signals from the one or more flow cytometers which comprises one or more compressed temporal signals comprising spatial information corresponding to the one or more observed objects.

17. The logic circuit of claim 16 , wherein the classification model is implemented on the logic circuit using a support vector machine (SVM) algorithm in which a classification calculation is made by parallel processing.

18. The analysis system of claim 1 , wherein the one or more flow cytometers are configured to sort the one or more observed objects on the basis of classification or recognition of the at least one target object among the one or more observed objects using the classification model.

19. The analysis system of claim 1 , wherein the one or more logic circuits is further configured to reconstruct an image relating to the one or more observed objects.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 4, 2023
From: OTA, SADAO; SATO, ISSEI; FUJIU, KATSUHITO; YAMAGUCHI, SATOKO; WAKI, KAYO; ITAHASHI, YOKO; HORISAKI, RYOICHI
To: THE UNIVERSITY OF TOKYO; OSAKA UNIVERSITY
Reel/Frame 064495/0211 →
Priority Claims (1)
JP 2015-212356 · Oct 28, 2015 · national
Continuity (4)
Continuation 17351117 · Jun 17, 2021
Continuation 15771180
Provisional Application 62372321 · Aug 9, 2016
Related Publication 20230237789A1 · Jul 27, 2023
Cited By (5)
US 12,230,023 US 12,235,202 US 12,259,311 US 12,298,221 US 12,339,217