Cutting force measurement system
A sensor unit according to an embodiment includes a piezoelectric sensor having a wire shape, and a measurement part including an abutting surface formed with a guide groove that holds a part of the piezoelectric sensor and abutting a measurement object at predetermined pressure.
1. A sensor unit of a machining device comprising:
a piezoelectric sensor having a wire shape;
a measurement part including an abutting surface formed with a guide groove that holds a part of the piezoelectric sensor and abutting a measurement object at predetermined pressure; and
a cushioning holding part that holds, in a buffered state, another part of the piezoelectric sensor located outside the abutting surfaces.
2. The sensor unit of the machining device according to claim 1 , wherein
the guide groove is provided in plural, and the guide grooves have the same length.
3. The sensor unit of the machining device according to claim 1 , wherein a width of the guide groove is set to a width for not preventing deformation of the piezoelectric sensor in the guide groove due to pressurization.
4. The sensor unit of the machining device according to claim 1 , wherein the measurement part comprises:
an abutting part having the abutting surface; and
a pressurizing part that presses the abutting part against the measurement object at the predetermined pressure.
5. A sensor system comprising:
a plurality of sensor units wherein each sensor unit comprises:
a piezoelectric sensor having a wire shape;
a measurement part including an abutting surface formed with a guide groove that holds a part of the piezoelectric sensor and abutting a measurement object at predetermined pressure;
wherein each of the plurality of sensor units include the abutting surface disposed on a plane perpendicular to axes different from each other and intersecting each other;
a plurality of amplifiers connected to the piezoelectric sensors of the sensor units to amplify and output signals of the piezoelectric sensors; and
an analysis device that analyzes a detection state on the basis of the output signals of the plurality of amplifiers.