Automated machine vision-based defect detection
Provided are various mechanisms and processes for automatic computer vision-based defect detection using a neural network. A system is configured for receiving historical datasets that include training images corresponding to one or more known defects. Each training image is converted into a corresponding matrix representation for training the neural network to adjust weighted parameters based on the known defects. Once sufficiently trained, a test image of an object that is not part of the historical dataset is obtained. Portions of the test image are extracted as input patches for input into the neural network as respective matrix representations. A probability score indicating the likelihood that the input patch includes a defect is automatically generated for each input patch using the weighted parameters. An overall defect score for the test image is then generated based on the probability scores to indicate the condition of the object.
1. A method comprising:
obtaining a test image of an object;
extracting portions of the test image as a plurality of patches for input into a neural network that was trained using a historical dataset that does not include the test image, each patch corresponding to an extracted portion of the test image;
determining whether each patch contains a portion of the object; and
inputting each patch that is determined to contain a portion of the object, while preventing input of patches that are determined to not contain a portion of the object, into the neural network as a respective matrix representation to automatically generate a probability score for each patch using a plurality of weighted parameters;
wherein the probability score for each patch input into the neural network indicates the probability that the patch includes a predicted defect, wherein a defect score for the test image is generated based on the probability scores for each patch, and wherein the defect score indicates a condition of the object.
2. The method of claim 1 , wherein the neural network is embedded in a camera device.
3. The method of claim 1 , wherein the patches are input into the neural network in parallel.
4. The method of claim 1 , wherein the patches include overlapping portions of the test image.
5. The method of claim 1 , wherein the patches are aligned such that each patch is immediately adjacent to one or more other patches of the plurality of patches.
6. The method of claim 1 , wherein the neural network is configured to accurately output a probability score for a defect in each patch input into the neural network using the weighted parameters.
7. The method of claim 6 , further comprising generating a heat map of the patches based on the probability scores of the patches.
8. The method of claim 1 , further comprising, prior to inputting the patches of the test image into the neural network, removing background and other noise from the test image and removing any color components from the test image to only retain a luma component.
9. A system comprising:
an interface configured to receive a test image of an object;
memory configured to store the test image; and
a processor associated with a neural network, wherein the processor is configured for:
extracting portions of the test image as a plurality of patches for input into a neural network that was trained using a historical dataset that does not include the test image, each patch corresponding to an extracted portion of the test image;
determining whether each patch contains a portion of the object; and
inputting each patch that is determined to contain a portion of the object, while preventing input of patches that are determined to not contain a portion of the object, into the neural network as a respective matrix representation to automatically generate a probability score for each patch using a plurality of weighted parameters;
wherein the probability score for each patch input into the neural network indicates the probability that the patch includes a predicted defect, wherein a defect score for the test image is generated based on the probability scores for each patch, and wherein the defect score indicates a condition of the object.
10. The system of claim 9 , wherein the neural network is embedded in a camera device.
11. The system of claim 9 , wherein the patches are input into the neural network in parallel.
12. The system of claim 9 , wherein the patches include overlapping portions of the test image.
13. The system of claim 9 , wherein the patches are aligned such that each patch is immediately adjacent to one or more other patches of the plurality of patches.
14. The system of claim 9 , wherein the neural network is configured to accurately output a probability score for a defect in each patch input into the neural network using the weighted parameters.
15. The system of claim 14 , wherein the processor is further configured for generating a heat map of the patches based on the probability scores of the patches.
16. The system of claim 9 , wherein the processor is further configured for, prior to inputting the patches of the test image into the neural network, removing background and other noise from the test image and removing any color components from the test image to only retain a luma component.
17. A non-transitory computer readable medium storing one or more programs configured for execution by a computer, the one or more programs comprising instructions for:
obtaining a test image of an object;
extracting portions of the test image as a plurality of patches for input into a neural network that was trained using a historical dataset that does not include the test image, each patch corresponding to an extracted portion of the test image;
determining whether each patch contains a portion of the object; and
inputting each patch that is determined to contain a portion of the object, while preventing input of patches that are determined to not contain a portion of the object, into the neural network as a respective matrix representation to automatically generate a probability score for each patch using a plurality of weighted parameters;
wherein the probability score for each patch input into the neural network indicates the probability that the patch includes a predicted defect, wherein a defect score for the test image is generated based on the probability scores for each patch, and wherein the defect score indicates a condition of the object.
18. The non-transitory computer readable medium of claim 17 , wherein the neural network is embedded in a camera device.
19. The non-transitory computer readable medium of claim 17 , wherein the patches are input into the neural network in parallel.
20. The non-transitory computer-readable medium of claim 17 , wherein the neural network comprises one or more of the following: a convolution layer, a max pooling layer, a flattening layer, and a fully connected layer.