IP Library Granted Patent US 12,334,402
Granted Patent B2
US 12,334,402 · App. 18/065,797 · Granted Jun 17, 2025

Fabrication of thin-film encapsulation layer for light-emitting device

Inventors: Eliyahu Vronsky (Los Altos, CA); Nahid Harjee (Sunnyvale, CA)
Assignee: Kateeva, Inc.
H01L22/12B05C11/10B41J2/01B41J2/04581B41J2/2054B41J2/21B41J3/407B41M3/00B41M5/0047B41M7/0081H01L21/02288H01L21/67126H01L22/26H04N1/405H10F19/80H10F77/50H10H20/852H10H20/853H10K50/84H10K50/844H10K71/00H10K71/135H10K71/70B41M7/009H10H20/0362H10H20/854H10K50/8445H10K59/1201H10K59/8731Y02E10/549Y02P70/50
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,334,402
App. No.
18/065,797
Granted
Jun 17, 2025
Kind
B2
Abstract

An ink jet process is used to deposit a material layer to a desired thickness. Layout data is converted to per-cell grayscale values, each representing ink volume to be locally delivered. The grayscale values are used to generate a halftone pattern to deliver variable ink volume (and thickness) to the substrate. The halftoning provides for a relatively continuous layer (e.g., without unintended gaps or holes) while providing for variable volume and, thus, contributes to variable ink/material buildup to achieve desired thickness. The ink is jetted as liquid or aerosol that suspends material used to form the material layer, for example, an organic material used to form an encapsulation layer for a flat panel device. The deposited layer is then cured or otherwise finished to complete the process.

Claims (39)

1. A method of fabricating a layer of an electronic device, wherein the layer is to span an area of a substrate, the area having at least one lateral edge, the method comprising:

receiving a value representing a desired thickness of the layer;

using an ink jet printer to deposit droplets of liquid, the droplets to coalesce to form a continuous liquid coat within the area; and

using a curing mechanism to cure the continuous liquid coat to form the layer;

wherein using the ink jet printer to deposit the droplets of liquid comprises deposing droplets at a first density of droplets at the at least one lateral edge to form a frame for the layer, and

depositing droplets within the frame at a second density of droplets different from the first density of droplets, wherein the second density of droplets is based on the value and on a correction image representing a topography of the area.

2. The method of claim 1 , wherein the layer comprises at least one of an encapsulation layer, or a planarization layer, or a barrier layer.

3. The method of claim 2 , wherein the electronic device comprises light emitting elements and wherein each layer of the at least one is to span the light emitting elements.

4. The method of claim 1 , wherein the liquid comprises a first material, wherein the curing mechanism comprises a source of radiation, and wherein the method further comprises exposing the continuous liquid coat to the source of radiation to convert the first material into a second material.

5. The method of claim 4 , wherein the first material is a monomer and the second material is a polymer.

6. The method of claim 4 , wherein:

depositing droplets within the frame at the second density of droplets comprises driving nozzles of a print head using a nozzle drive waveform in a manner dependent on the value and the correction image.

7. The method of claim 6 , wherein depositing droplets comprises using nozzle drive waveforms selected according to the received value and the correction image.

8. The method of claim 1 , wherein density of droplets is varied according to the value and the correction image.

9. The method of claim 1 , wherein depositing the droplets at the first density of droplets comprises using the ink jet printer to print within a controlled atmosphere, and wherein depositing the droplets at the second density of droplets comprises using the ink jet printer to print within the controlled atmosphere.

10. The method of claim 1 , further comprising producing the layer for each respective substrate of a series of substrates, and using the ink jet printer to print the liquid according to a common scan pattern and a common nozzle firing pattern for each of the respective substrates.

11. The method of claim 1 , wherein the first density of droplets is greater the second density of droplets.

12. The method of claim 1 , wherein the second density of droplets is defined by a pattern of droplets resolved from the correction image.

13. A method, comprising:

forming an electroluminescent element on a substrate; and

forming a uniform layer over an area of the substrate and over the electroluminescent element, the layer having a plurality of thicknesses, by:

forming a frame by depositing a first plurality of droplets of a liquid with first droplet coverage at an edge of the area, the frame defining a central area within the frame; and

depositing a second plurality of droplets of the liquid with second droplet coverage in the central area, the second droplet coverage based on a topology of the substrate in the central area; and

solidifying the uniform layer.

14. The method of claim 13 , wherein forming the uniform layer further comprises depositing a third plurality of droplets of the liquid with a third droplet coverage, different from the first and second droplet coverages, within an intermediate region in the central area adjacent to the frame.

15. The method of claim 13 , wherein the first and second droplet coverages are defined by a droplet deposition density.

16. The method of claim 13 , wherein the droplets are ejected from a plurality of nozzles of a print head of an inkjet printer, and droplet coverage is defined by a selection of waveforms applied to the nozzles to adjust size of the droplets ejected from the nozzles.

17. The method of claim 13 , wherein the second droplet coverage is defined by a pattern of droplets resolved from a correction image based on the topology of the substrate in the central area.

18. A method, comprising forming an electroluminescent element on a substrate; and

forming a uniform layer over an area of the substrate and over the electroluminescent element, the layer having a plurality of thicknesses, by:

forming a frame by depositing a first plurality of droplets of a liquid with first droplet coverage at an edge of the area, the frame defining a central area within the frame;

depositing a second plurality of droplets of the liquid with second droplet coverage in the central area, the second droplet coverage based on a topology of the substrate in the central area; and

depositing a third plurality of droplets of the liquid in the central area with a third droplet coverage different from the first and second droplet coverages; and

solidifying the uniform layer.

19. The method of claim 18 , wherein the droplets are ejected from a plurality of nozzles of a print head of an inkjet printer, and droplet coverage is defined by one or more of:

a selection of nozzles and waveforms that adjust size and deposition density of the droplets;

a time dependent frequency of a trigger signal for ejecting the droplets; and

a correction image based on a topography of the substrate.

20. The method of claim 18 , wherein the first droplet coverage is greater than the second droplet coverage.

Assignments (1)
SECURITY INTEREST Recorded Nov 13, 2025
From: KATEEVA, INC.
To: SINO XIN JI LIMITED
Reel/Frame 072891/0259 →
Continuity (12)
Continuation 17305963 · Jul 19, 2021
Continuation 16546006 · Aug 20, 2019
Division 15802325 · Nov 2, 2017
Continuation 15416931 · Jan 26, 2017
Continuation 15279261 · Sep 28, 2016
Continuation 14627186 · Feb 20, 2015
Continuation 14458005 · Aug 12, 2014
Provisional Application 62019076 · Jun 30, 2014
Provisional Application 62005044 · May 30, 2014
Provisional Application 61977939 · Apr 10, 2014
Provisional Application 61915149 · Dec 12, 2013
Related Publication 20230147887A1 · May 11, 2023
References Cited (400)
US 4922270A · Cobbs et al. · 1990 [cited by applicant]
US 4963882A · Hickman · 1990 [cited by applicant]
US 4992270A · Wilson et al. · 1991 [cited by applicant]
US 5317169A · Nakano et al. · 1994 [cited by applicant]
US 5345673A · Saitoh · 1994 [cited by applicant]
US 5434430A · Stewart · 1995 [cited by applicant]
US 5469276A · Shu · 1995 [cited by applicant]
US 5555006A · Cleveland et al. · 1996 [cited by applicant]
US 5561449A · Raskin et al. · 1996 [cited by applicant]
US 5681757A · Hayes · 1997 [cited by applicant]
US 5707684A · Hayes et al. · 1998 [cited by applicant]
US 5711989A · Ciardella et al. · 1998 [cited by applicant]
US 5779971A · Pan et al. · 1998 [cited by applicant]
US 5847720A · Dunand · 1998 [cited by applicant]
US 5895692A · Shirasaki et al. · 1999 [cited by applicant]
US 5906682A · Bouras et al. · 1999 [cited by applicant]
US 5932012A · Ishida et al. · 1999 [cited by applicant]
US 6013982A · Thompson et al. · 2000 [cited by applicant]
US 6019454A · Serra et al. · 2000 [cited by applicant]
US 6066357A · Tang et al. · 2000 [cited by applicant]
US 6149263A · Nakano · 2000 [cited by applicant]
US 6164746A · Akahira et al. · 2000 [cited by applicant]
US 6228228B1 · Singh et al. · 2001 [cited by applicant]
US 6247787B1 · Giere et al. · 2001 [cited by applicant]
US 6283572B1 · Kumar et al. · 2001 [cited by applicant]
US 6328395B1 · Kitahara et al. · 2001 [cited by applicant]
US 6329108B1 · Fujiike et al. · 2001 [cited by applicant]
US 6347857B1 · Purcell et al. · 2002 [cited by applicant]
US 6352331B1 · Armijo et al. · 2002 [cited by applicant]
US 6354686B1 · Tanaka et al. · 2002 [cited by applicant]
US 6382850B1 · Freund et al. · 2002 [cited by applicant]
US 6401001B1 · Jang et al. · 2002 [cited by applicant]
US 6406114B1 · Shioya · 2002 [cited by applicant]
US 6481816B1 · Pyen · 2002 [cited by applicant]
US 6495917B1 · Ellis-Monaghan et al. · 2002 [cited by applicant]
US 6517176B1 · Chaug · 2003 [cited by applicant]
US 6565177B1 · Corrigan · 2003 [cited by applicant]
US 6629741B1 · Okuda et al. · 2003 [cited by applicant]
US 6736484B2 · Nakamura · 2004 [cited by applicant]
US 6739686B2 · Imai · 2004 [cited by applicant]
US 6754551B1 · Zohar et al. · 2004 [cited by applicant]
US 6783210B2 · Takahashi et al. · 2004 [cited by applicant]
US 6793324B2 · Hosono et al. · 2004 [cited by applicant]
US 6824238B2 · Chang · 2004 [cited by applicant]
US 6827423B1 · Katakura et al. · 2004 [cited by applicant]
US 6837568B2 · Nakamura · 2005 [cited by applicant]
US 6863961B2 · Miyashita et al. · 2005 [cited by applicant]
US 6910762B2 · Nakamura · 2005 [cited by applicant]
US 6960036B1 · Fujita et al. · 2005 [cited by applicant]
US 6972261B2 · Wong et al. · 2005 [cited by applicant]
US 7072522B2 · Miyake et al. · 2006 [cited by applicant]
US 7073727B2 · Usuda · 2006 [cited by applicant]
US 7093924B2 · Nakamura · 2006 [cited by applicant]
US 7101013B2 · Nakamura · 2006 [cited by applicant]
US 7111755B2 · Koyama et al. · 2006 [cited by applicant]
US 7121642B2 · Stoessel et al. · 2006 [cited by applicant]
US 7138304B2 · Hirai · 2006 [cited by applicant]
US 7188919B2 · Satomura · 2007 [cited by applicant]
US 7204573B2 · Koyama · 2007 [cited by applicant]
US 7207647B2 · Silverbrook · 2007 [cited by applicant]
US 7216950B2 · Eguchi et al. · 2007 [cited by applicant]
US 7217438B2 · Newsome et al. · 2007 [cited by applicant]
US 7223309B2 · Takahashi et al. · 2007 [cited by applicant]
US 7249829B2 · Hawkins et al. · 2007 [cited by applicant]
US 7258408B2 · Usuda · 2007 [cited by applicant]
US 7270712B2 · Edwards et al. · 2007 [cited by applicant]
US 7278847B2 · Silverbrook · 2007 [cited by applicant]
US 7281778B2 · Hasenbein et al. · 2007 [cited by applicant]
US 7381449B2 · Miyasaka · 2008 [cited by applicant]
US 7449070B2 · Edwards et al. · 2008 [cited by applicant]
US 7461912B2 · Kamiyama et al. · 2008 [cited by applicant]
US 7503637B2 · Komatsu et al. · 2009 [cited by applicant]
US 7513595B2 · Nakamura · 2009 [cited by applicant]
US 7517549B2 · Hayashi · 2009 [cited by applicant]
US 7554697B2 · Mizutani et al. · 2009 [cited by applicant]
US 7569129B2 · Pamula et al. · 2009 [cited by applicant]
US 7600840B2 · Kim et al. · 2009 [cited by applicant]
US 7611754B2 · Edwards et al. · 2009 [cited by applicant]
US 7612917B2 · Nagaishi et al. · 2009 [cited by applicant]
US 7616340B2 · Yamazaki · 2009 [cited by applicant]
US 7658465B2 · Newsome et al. · 2010 [cited by applicant]
US 7677689B2 · Kim et al. · 2010 [cited by applicant]
US 7699428B2 · Kato · 2010 [cited by applicant]
US 7757632B2 · Edwards et al. · 2010 [cited by applicant]
US 7775179B2 · Kim et al. · 2010 [cited by applicant]
US 7815965B2 · Edwards et al. · 2010 [cited by applicant]
US 7823535B2 · Hanafusa et al. · 2010 [cited by applicant]
US 7839080B2 · Kim et al. · 2010 [cited by applicant]
US 7850267B2 · Usuda · 2010 [cited by applicant]
US 7857242B2 · Huang · 2010 [cited by applicant]
US 7887156B2 · Middleton et al. · 2011 [cited by applicant]
US 7891752B2 · Liu et al. · 2011 [cited by applicant]
US 7901026B2 · Albertalli et al. · 2011 [cited by applicant]
US 7909427B2 · Kim et al. · 2011 [cited by applicant]
US 7914104B2 · Silverbrook · 2011 [cited by applicant]
US 7920934B2 · Aruga · 2011 [cited by applicant]
US 7972875B2 · Rogers et al. · 2011 [cited by applicant]
US 8025353B2 · Hasenbein · 2011 [cited by applicant]
US 8025917B2 · Kinoshita · 2011 [cited by applicant]
US 8033634B2 · Komatsu et al. · 2011 [cited by applicant]
US 8066345B2 · Komori et al. · 2011 [cited by applicant]
US 8119186B2 · Sakai · 2012 [cited by applicant]
US 8123324B2 · Komori et al. · 2012 [cited by applicant]
US 8124190B2 · Miyasaka · 2012 [cited by applicant]
US 8186791B2 · Yamashita · 2012 [cited by applicant]
US 8235487B2 · Madigan et al. · 2012 [cited by applicant]
US 8248656B2 · Lin et al. · 2012 [cited by applicant]
US 8310721B2 · Saita et al. · 2012 [cited by applicant]
US 8323724B2 · Shinohara · 2012 [cited by applicant]
US 8342623B2 · Hong et al. · 2013 [cited by applicant]
US 8342636B2 · Nakano et al. · 2013 [cited by applicant]
US 8343869B2 · Gothait et al. · 2013 [cited by applicant]
US 8382232B2 · Silverbrook · 2013 [cited by applicant]
US 8383202B2 · Somekh et al. · 2013 [cited by applicant]
US 8413602B2 · Nakamura · 2013 [cited by applicant]
US 8435093B2 · Takeuchi · 2013 [cited by applicant]
US 8449058B2 · Hasenbein · 2013 [cited by applicant]
US 8459768B2 · Hasenbein et al. · 2013 [cited by applicant]
US 8466484B2 · Slyke et al. · 2013 [cited by applicant]
US 8579408B2 · Kelly et al. · 2013 [cited by applicant]
US 8784938B2 · Suzuki et al. · 2014 [cited by applicant]
US 8995022B1 · Vronsky et al. · 2015 [cited by applicant]
US 9010899B2 · Harjee et al. · 2015 [cited by applicant]
US 9139747B2 · Kamada · 2015 [cited by applicant]
US 9174433B2 · Somekh et al. · 2015 [cited by applicant]
US 9224952B2 · Harjee et al. · 2015 [cited by applicant]
US 9352561B2 · Harjee et al. · 2016 [cited by applicant]
US 9496519B2 · Vronsky et al. · 2016 [cited by applicant]
US 9527276B2 · Mala et al. · 2016 [cited by applicant]
US 9537119B2 · Harjee et al. · 2017 [cited by applicant]
US 9700908B2 · Baker et al. · 2017 [cited by applicant]
US 9755186B2 · Vronsky et al. · 2017 [cited by applicant]
US 9802403B2 · Harjee et al. · 2017 [cited by applicant]
US 9832428B2 · Hauf et al. · 2017 [cited by applicant]
US 9873273B2 · Mauck et al. · 2018 [cited by applicant]
US 9961782B2 · Pun et al. · 2018 [cited by applicant]
US 11088035B2 · Vronsky · 2021 [cited by applicant]
US 11167303B2 · Baker et al. · 2021 [cited by applicant]
US 11551982B2 · Vronsky · 2023 [cited by applicant]
US 20010017703A1 · Szumla · 2001 [cited by applicant]
US 20010022596A1 · Korol · 2001 [cited by applicant]
US 20020109862A1 · Hayama · 2002 [cited by applicant]
US 20020180816A1 · Haflinger · 2002 [cited by applicant]
US 20030008429A1 · Yamazaki et al. · 2003 [cited by applicant]
US 20030040061A1 · Baker et al. · 2003 [cited by applicant]
US 20030087026A1 · Dijksman et al. · 2003 [cited by applicant]
US 20030101421A1 · Satoh · 2003 [cited by applicant]
US 20030184613A1 · Nakamura et al. · 2003 [cited by applicant]
US 20030197747A1 · Hattori · 2003 [cited by applicant]
US 20040004643A1 · Satomura · 2004 [cited by applicant]
US 20040009309A1 · Raksha et al. · 2004 [cited by applicant]
US 20040019143A1 · Koloski et al. · 2004 [cited by applicant]
US 20040027405A1 · Stoessel et al. · 2004 [cited by applicant]
US 20040085375A1 · Hara · 2004 [cited by applicant]
US 20040104951A1 · Shibata et al. · 2004 [cited by applicant]
US 20040169691A1 · Newsome et al. · 2004 [cited by applicant]
US 20040170762A1 · Newsome et al. · 2004 [cited by applicant]
US 20040223014A1 · Barr et al. · 2004 [cited by applicant]
US 20050009213A1 · Wang et al. · 2005 [cited by applicant]
US 20050030612A1 · Yamazaki et al. · 2005 [cited by applicant]
US 20050053719A1 · Ishida · 2005 [cited by applicant]
US 20050078133A1 · Molinet et al. · 2005 [cited by applicant]
US 20050140709A1 · Sekiya · 2005 [cited by applicant]
US 20050156176A1 · Gupta et al. · 2005 [cited by applicant]
US 20050200273A1 · Nozawa · 2005 [cited by applicant]
US 20050200684A1 · Sakurada et al. · 2005 [cited by applicant]
US 20050247340A1 · Zeira · 2005 [cited by applicant]
US 20060029247A1 · Chan · 2006 [cited by applicant]
US 20060046347A1 · Wood et al. · 2006 [cited by applicant]
US 20060093751A1 · White et al. · 2006 [cited by applicant]
US 20060126121A1 · Chung · 2006 [cited by applicant]
US 20060132529A1 · Verhoest et al. · 2006 [cited by applicant]
US 20060144331A1 · Hanafusa et al. · 2006 [cited by applicant]
US 20060209347A1 · Nagaishi et al. · 2006 [cited by applicant]
US 20060214976A1 · Iwao et al. · 2006 [cited by applicant]
US 20070070099A1 · Beer et al. · 2007 [cited by applicant]
US 20070109342A1 · Kato · 2007 [cited by applicant]
US 20070109606A1 · Nagae · 2007 [cited by applicant]
US 20070110893A1 · Lennon et al. · 2007 [cited by applicant]
US 20070176173A1 · Ramakrishnan et al. · 2007 [cited by applicant]
US 20080024532A1 · Kim · 2008 [cited by applicant]
US 20080049231A1 · Bachalo et al. · 2008 [cited by applicant]
US 20080057260A1 · Buchhauser et al. · 2008 [cited by applicant]
US 20080117247A1 · Miller et al. · 2008 [cited by applicant]
US 20080150419A1 · Kang · 2008 [cited by applicant]
US 20080158278A1 · Inoue · 2008 [cited by applicant]
US 20080180473A1 · Gardner et al. · 2008 [cited by applicant]
US 20080227663A1 · Tisone et al. · 2008 [cited by applicant]
US 20080278534A1 · Kim et al. · 2008 [cited by applicant]
US 20080305969A1 · Dijksman et al. · 2008 [cited by applicant]
US 20080308037A1 · Bulovic et al. · 2008 [cited by applicant]
US 20080309698A1 · Nakano et al. · 2008 [cited by applicant]
US 20080317941A1 · Hanaoka · 2008 [cited by applicant]
US 20090096823A1 · Watt et al. · 2009 [cited by applicant]
US 20090096825A1 · Takahashi et al. · 2009 [cited by applicant]
US 20090117261A1 · Sakai · 2009 [cited by applicant]
US 20090184990A1 · Shang et al. · 2009 [cited by applicant]
US 20090191342A1 · Chu et al. · 2009 [cited by applicant]
US 20090197013A1 · Gouch et al. · 2009 [cited by applicant]
US 20090231368A1 · Nakano · 2009 [cited by examiner]
US 20090274833A1 · Li et al. · 2009 [cited by applicant]
US 20090322828A1 · Kim et al. · 2009 [cited by applicant]
US 20100020118A1 · Xie · 2010 [cited by applicant]
US 20100024725A1 · Lennon et al. · 2010 [cited by applicant]
US 20100066779A1 · Gothait et al. · 2010 [cited by applicant]
US 20100089636A1 · Ramadas et al. · 2010 [cited by applicant]
US 20100090582A1 · Okishiro et al. · 2010 [cited by applicant]
US 20100166950A1 · Nieminen · 2010 [cited by applicant]
US 20100184244A1 · Hunt · 2010 [cited by applicant]
US 20100201749A1 · Somekh et al. · 2010 [cited by applicant]
US 20100231672A1 · Joyce et al. · 2010 [cited by applicant]
US 20100311298A1 · Suzuki et al. · 2010 [cited by applicant]
US 20110032297A1 · Mitsuzawa · 2011 [cited by applicant]
US 20110084290A1 · Nakamura et al. · 2011 [cited by applicant]
US 20110087718A1 · Srinivasan et al. · 2011 [cited by applicant]
US 20110121021A1 · Dudenhoefer et al. · 2011 [cited by applicant]
US 20110222126A1 · Asai et al. · 2011 [cited by applicant]
US 20110267390A1 · Bulovic et al. · 2011 [cited by applicant]
US 20110279544A1 · Dovrat et al. · 2011 [cited by applicant]
US 20120056923A1 · Vronsky et al. · 2012 [cited by applicant]
US 20120058251A1 · Yamazaki · 2012 [cited by applicant]
US 20120069076A1 · Higuchi · 2012 [cited by applicant]
US 20120139984A1 · Lang · 2012 [cited by applicant]
US 20120220497A1 · Jacobson et al. · 2012 [cited by applicant]
US 20120256981A1 · Matsuo · 2012 [cited by applicant]
US 20120274648A1 · Hwang et al. · 2012 [cited by applicant]
US 20120306951A1 · Somekh et al. · 2012 [cited by applicant]
US 20120308252A1 · Shimura · 2012 [cited by applicant]
US 20120309252A1 · Takeuchi · 2012 [cited by applicant]
US 20130026533A1 · Lee · 2013 [cited by applicant]
US 20130040061A1 · Lowrance et al. · 2013 [cited by applicant]
US 20130057879A1 · Takagi et al. · 2013 [cited by applicant]
US 20130120485A1 · Kodama et al. · 2013 [cited by applicant]
US 20130127030A1 · Gong et al. · 2013 [cited by applicant]
US 20130168664A1 · Crankshaw · 2013 [cited by applicant]
US 20130206058A1 · Mauck et al. · 2013 [cited by applicant]
US 20130252533A1 · Mauck et al. · 2013 [cited by applicant]
US 20130286073A1 · Blessing et al. · 2013 [cited by applicant]
US 20130307898A1 · Somekh et al. · 2013 [cited by applicant]
US 20140055513A1 · Usui · 2014 [cited by applicant]
US 20140117316A1 · Choi · 2014 [cited by applicant]
US 20140165864A1 · Oppenheim · 2014 [cited by applicant]
US 20140184683A1 · Harjee et al. · 2014 [cited by applicant]
US 20140210886A1 · Driggers et al. · 2014 [cited by applicant]
US 20150099059A1 · Harjee et al. · 2015 [cited by applicant]
US 20150171368A1 · Vronsky et al. · 2015 [cited by applicant]
US 20150221869A1 · Harjee et al. · 2015 [cited by applicant]
US 20150273869A1 · Ide et al. · 2015 [cited by applicant]
US 20150298153A1 · Baker et al. · 2015 [cited by applicant]
US 20150373305A1 · Hauf et al. · 2015 [cited by applicant]
US 20160133881A1 · Harjee et al. · 2016 [cited by applicant]
US 20160311219A1 · Harjee et al. · 2016 [cited by applicant]
US 20170054078A1 · Vronsky et al. · 2017 [cited by applicant]
US 20170084882A1 · Vronsky et al. · 2017 [cited by applicant]
US 20170140999A1 · Vronsky et al. · 2017 [cited by applicant]
US 20170141353A1 · Vronsky et al. · 2017 [cited by applicant]
US 20170141357A1 · Vronsky et al. · 2017 [cited by applicant]
US 20170170435A1 · Harjee et al. · 2017 [cited by applicant]
US 20170210886A1 · Ikeda et al. · 2017 [cited by applicant]
US 20170259560A1 · Sreenivasan et al. · 2017 [cited by applicant]
US 20180008995A1 · Baker et al. · 2018 [cited by applicant]
US 20180061719A1 · Vronsky et al. · 2018 [cited by applicant]
US 20180061720A1 · Vronsky et al. · 2018 [cited by applicant]
US 20180083230A1 · Harjee et al. · 2018 [cited by applicant]
US 20180146162A1 · Hauf et al. · 2018 [cited by applicant]
US 20190074484A1 · Harjee et al. · 2019 [cited by applicant]
CN 1258250A · 2000 [cited by applicant]
CN 1311100A · 2001 [cited by applicant]
CN 1366007A · 2002 [cited by applicant]
CN 1430554A · 2003 [cited by applicant]
CN 1473707A · 2004 [cited by applicant]
CN 1476973A · 2004 [cited by applicant]
CN 1503338A · 2004 [cited by applicant]
CN 1513214A · 2004 [cited by applicant]
CN 1572497A · 2005 [cited by applicant]
CN 1607378A · 2005 [cited by applicant]
CN 1668164A · 2005 [cited by applicant]
CN 1895895A · 2007 [cited by applicant]
CN 1985366A · 2007 [cited by applicant]
CN 101020386A · 2007 [cited by applicant]
CN 101022893A · 2007 [cited by applicant]
CN 101024334A · 2007 [cited by applicant]
CN 101202328A · 2008 [cited by applicant]
CN 101222026A · 2008 [cited by applicant]
CN 101301814A · 2008 [cited by applicant]
CN 101326060A · 2008 [cited by applicant]
CN 101498856A · 2009 [cited by applicant]
CN 101533894A · 2009 [cited by applicant]
CN 101544107A · 2009 [cited by applicant]
CN 101027186B · 2010 [cited by applicant]
CN 101950771A · 2011 [cited by applicant]
CN 101256092B · 2011 [cited by applicant]
CN 102107555A · 2011 [cited by applicant]
CN 1753600B · 2011 [cited by applicant]
CN 102189790A · 2011 [cited by applicant]
CN 101648458B · 2012 [cited by applicant]
CN 102343712A · 2012 [cited by applicant]
CN 102431293A · 2012 [cited by applicant]
CN 102555467A · 2012 [cited by applicant]
CN 101301814B · 2013 [cited by applicant]
CN 101022893B · 2013 [cited by applicant]
CN 101743125B · 2013 [cited by applicant]
CN 103241025A · 2013 [cited by applicant]
CN 102555467B · 2015 [cited by applicant]
CN 102597133B · 2018 [cited by applicant]
EP 0976567A2 · 2000 [cited by applicant]
EP 0902315B1 · 2003 [cited by applicant]
EP 0880303B1 · 2004 [cited by applicant]
EP 0887199B1 · 2004 [cited by applicant]
EP 1211916B1 · 2006 [cited by applicant]
EP 0863478B1 · 2006 [cited by applicant]
EP 0863004B2 · 2011 [cited by applicant]
EP 1874551B1 · 2012 [cited by applicant]
EP 1376716B1 · 2013 [cited by applicant]
IN 103026789A · 2016 [cited by applicant]
JP H0578655A · 1993 [cited by applicant]
JP H06308312A1 · 1994 [cited by applicant]
JP H07169567A · 1995 [cited by applicant]
JP H07235378A · 1995 [cited by applicant]
JP 107294916A · 1995 [cited by applicant]
JP H10138475A · 1998 [cited by applicant]
JP H10012377A1 · 1998 [cited by applicant]
JP H10193587A · 1998 [cited by applicant]
JP 2991270B2 · 1999 [cited by applicant]
JP 2000062158A · 2000 [cited by applicant]
JP 3036436B2 · 2000 [cited by applicant]
JP 2000207543A · 2000 [cited by applicant]
JP 2000309123A · 2000 [cited by applicant]
JP 2001038892A · 2001 [cited by applicant]
JP 2001071476A · 2001 [cited by applicant]
JP 2001121722A1 · 2001 [cited by applicant]
JP 2001138590A · 2001 [cited by applicant]
JP 2001162840A1 · 2001 [cited by applicant]
JP 2002011872A · 2002 [cited by applicant]
JP 2002205429A · 2002 [cited by applicant]
JP 2002323615A1 · 2002 [cited by applicant]
JP 2003014442A · 2003 [cited by applicant]
JP 2003509256A · 2003 [cited by applicant]
JP 2003127430A · 2003 [cited by applicant]
JP 2003161824A · 2003 [cited by applicant]
JP 2003217840A · 2003 [cited by applicant]
JP 2003249355A1 · 2003 [cited by applicant]
JP 2003272847A · 2003 [cited by applicant]
JP 2003311943A · 2003 [cited by applicant]
JP 2003338370A · 2003 [cited by applicant]
JP 2004058627A · 2004 [cited by applicant]
JP 2004106511A · 2004 [cited by applicant]
JP 2004148750A · 2004 [cited by applicant]
JP 2004209412A · 2004 [cited by applicant]
JP 2004267874A · 2004 [cited by applicant]
JP 2004295092A · 2004 [cited by applicant]
JP 2004337709A · 2004 [cited by applicant]
JP 2005014216A · 2005 [cited by applicant]
JP 2005502987A · 2005 [cited by applicant]
JP 2005044613A · 2005 [cited by applicant]
JP 2005100894A · 2005 [cited by applicant]
JP 2005131606A · 2005 [cited by applicant]
JP 2005153431A · 2005 [cited by applicant]
JP 2005183184A · 2005 [cited by applicant]
JP 2005193104A1 · 2005 [cited by applicant]
JP 3679987B2 · 2005 [cited by applicant]
JP 2005246248A · 2005 [cited by applicant]
JP 2005296904A · 2005 [cited by applicant]
JP 2006021146A · 2006 [cited by applicant]
JP 2006047803A · 2006 [cited by applicant]
JP 2006170910A · 2006 [cited by applicant]
JP 2006212501A · 2006 [cited by applicant]
JP 2007111914A · 2007 [cited by applicant]
JP 2007117833A · 2007 [cited by applicant]
JP 2007207762A · 2007 [cited by applicant]
JP 2007299725A · 2007 [cited by applicant]
JP 4027552B2 · 2007 [cited by applicant]
JP 2003217840B · 2008 [cited by applicant]
JP 2008004817A · 2008 [cited by applicant]
JP 2008123993A · 2008 [cited by applicant]
JP 2008136927A · 2008 [cited by applicant]
JP 2008209218A · 2008 [cited by applicant]
JP 2008233833A · 2008 [cited by applicant]
JP 2008540118A · 2008 [cited by applicant]
JP 2008296547A · 2008 [cited by applicant]
JP 2009093189A · 2009 [cited by applicant]
JP 2009117140A · 2009 [cited by applicant]
JP 2009117141A · 2009 [cited by applicant]
JP 4273819B2 · 2009 [cited by applicant]
JP 2002225259A1 · 2009 [cited by applicant]
JP 2009189954A · 2009 [cited by applicant]
JP 2009291710A · 2009 [cited by applicant]
JP 2010046944A · 2010 [cited by applicant]
JP 2010115650A · 2010 [cited by applicant]
JP 2010204189A · 2010 [cited by applicant]
JP 2010227762A · 2010 [cited by applicant]
JP 2011005453A · 2011 [cited by applicant]
JP 2011508062A · 2011 [cited by applicant]
JP 2011215173A · 2011 [cited by applicant]
JP 2011216268A · 2011 [cited by applicant]
JP 2011255366A · 2011 [cited by applicant]
JP 2012025983A · 2012 [cited by applicant]
JP 2012116188A · 2012 [cited by applicant]
JP 2012139655A · 2012 [cited by applicant]
JP 2012160858A · 2012 [cited by applicant]