IP Library Granted Patent US 12,237,017
Granted Patent B2
US 12,237,017 · App. 18/072,723 · Granted Feb 25, 2025

Method for erasing flash memory

Inventors: Lung-Chi Cheng (Taichung, TW); Ying-Shan Kuo (Taichung, TW); Jun-Yao Huang (Taichung, TW); Ju-Chieh Cheng (Taichung, TW); Yu-Cheng Chuang (Taichung, TW)
Assignee: Winbond Electronics Corp.
G11C16/16G11C16/3431G11C16/3445
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Quick Facts
Patent No.
US 12,237,017
App. No.
18/072,723
Granted
Feb 25, 2025
Kind
B2
Abstract

A block erase method for a flash memory is provided. The block erase method is to perform block erase on a block with a predetermined block size. The block erase method includes: performing an erase verification on bytes byte-by-byte in the block when performing the block erase; checking an erase step of the byte when the byte does not pass the erase verification; when the erase step of the byte exceeds a predetermined threshold value, performing the block erase with a partitioned block smaller than the predetermined block size, and returning to an erase verification stage to perform the erase verification; and when the erase step of the bytes does not exceed the predetermined threshold value, continuing to perform the block erase with the predetermined block size, and returning to the erasure verification stage to continue to perform the erase verification.

Claims (43)

1. A block erase method for flash memory, wherein the block erase method is to perform a block erase on a block of the flash memory, and the block has a predetermined block size, the block erase method comprising:

setting the block to have M partitioned blocks, wherein each block size of the M partitioned blocks is smaller than the predetermined block size;

setting M erase step threshold values within a maximum erase step to generate (M+1) erase step determining intervals;

performing an erase verification on bytes byte-by-byte in each of the M partitioned blocks when performing the block erase;

when the byte does not pass the erase verification, checking an erase step of the byte;

determining which a specific interval among the (M+1) erase step determining intervals the erase step is therein; and

performing the block erase on the partitioned blocks corresponding to the specific interval, returning to an erase verification stage to perform the erase verification after the block erase is completed,

wherein in a case that the erase step is less than or equal to a first erase step threshold value and in a first erase step determining interval, the block erase is performed by using the predetermined block size, and

in a case that the erase step is in a j-th (2≤j≤M+1) erase step determining interval, the block erase is performed by using a block size of a (j−1)-th partitioned block.

2. The block erase method for flash memory according to claim 1 , when the byte passes the erase verification, erasing and performing the erase verification on a next byte until the block erase of the predetermined block size is completed.

3. The block erase method for flash memory according to claim 1 , wherein the block size of the M partitioned blocks is adjustable.

4. The block erase method for flash memory according to claim 1 , wherein a number of the M partitioned blocks is adjustable.

5. The block erase method for flash memory according to claim 1 , wherein the M erase step threshold values are adjustable within the maximum erase step.

6. The block erase method for flash memory according to claim 1 , wherein the flash memory is a NOR type flash memory.

7. The block erase method for flash memory according to claim 1 , wherein the flash memory is a NAND type flash memory.

8. A block erase method for flash memory, wherein the block erasing method is to perform a block erase on a block of the flash memory, and the block has a predetermined block size, the block erase method comprising:

performing an erase verification on bytes byte-by-byte in the block when performing the block erase;

checking an erase step of the byte when the byte does not pass the erase verification;

when the erase step of the byte exceeds a predetermined threshold value, performing the block erase with a partitioned block smaller than the predetermined block size, and returning to an erase verification stage to perform the erase verification; and

when the erase step of the bytes does not exceed the predetermined threshold value, continuing to perform the block erase with the predetermined block size, and returning to the erasure verification stage to continue to perform the erase verification.

9. The block erase method for flash memory according to claim 8 , wherein when the byte passes the erase verification, erasing and performing the erase verification on a next byte until the block erase of the predetermined block size is completed.

10. The block erase method for flash memory according to claim 8 , wherein the erase step is less than a maximum erase step and adjustable.

11. The block erase method for flash memory according to claim 8 , wherein a size of the partitioned block is adjustable.

12. The block erase method for flash memory according to claim 8 , wherein the flash memory is a NOR type flash memory.

13. The block erase method for flash memory according to claim 8 , wherein the flash memory is a NAND type flash memory.

14. A flash memory, comprising:

a flash memory array; and

a control circuit, coupled to the flash memory array to control operations of the flash memory array,

wherein when erasing the flash memory, the control circuit is configured to perform

setting the block to have M partitioned blocks, wherein each block size of the M partitioned blocks is smaller than the predetermined block size;

setting M erase step threshold values within a maximum erase step to generate (M+1) erase step determining intervals;

performing an erase verification on bytes byte-by-byte in each of the M partitioned blocks when performing the block erase;

when the byte does not pass the erase verification, checking an erase step of the byte;

determining which a specific interval among the (M+1) erase step determining intervals the erase step is therein; and

performing the block erase on the partitioned blocks corresponding to the specific interval, returning to an erase verification stage to perform the erase verification after the block erase is completed,

wherein in a case that the erase step is less than or equal to a first erase step threshold value and in a first erase step determining interval, the block erase is performed by using the predetermined block size, and

in a case that the erase step is in a j-th (2≤j≤M+1) erase step determining interval, the block erase is performed by using a block size of a (j−1)-th partitioned block.

15. The flash memory according to claim 14 , when the byte passes the erase verification, erasing and performing the erase verification on a next byte until the block erase of the predetermined block size is completed.

16. The flash memory according to claim 14 , wherein the block size of the M partitioned blocks is adjustable.

17. The flash memory according to claim 14 , wherein a number of the M partitioned blocks is adjustable.

18. The flash memory according to claim 14 , wherein the M erase step threshold values are adjustable within the maximum erase step.

19. The flash memory according to claim 14 , wherein the flash memory is a NOR type flash memory.

20. The flash memory according to claim 14 , wherein the flash memory is a NAND type flash memory.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 1, 2022
From: CHENG, LUNG-CHI; KUO, YING-SHAN; HUANG, JUN-YAO; CHENG, JU-CHIEH; CHUANG, YU-CHENG
To: WINBOND ELECTRONICS CORP.
Reel/Frame 061931/0300 →
Priority Claims (1)
TW 111106910 · Feb 25, 2022 · national
Continuity (1)
Related Publication 20230274782A1 · Aug 31, 2023
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