Die-to-die connectivity monitoring using a clocked receiver

1. An integrated circuit (IC) comprising:

a programmable delay line;

a reference clocked receiver;

a delayed clocked receiver having the following inputs:

a data signal and a reference voltage that also serve as inputs to the reference clocked receiver, wherein the reference clocked receiver is configured to sample the data signal received from an interconnect lane between the IC and another IC, wherein the IC and the other IC are part of a multi-IC module, and

a delayed clock signal received from the programmable delay line, wherein the delayed clock signal is a delayed version of a clock signal that clocks the reference clocked receiver;

a comparison circuit configured to compare a data signal output of the delayed clocked receiver and a data signal output of the reference clocked receiver; and

a controller configured to:

gradually adjust an amount of delay introduced by the programmable delay line,

receive a result of the comparison from the comparison circuit, following each gradual adjustment of the delay, and

based on at least one of the results and on the amount of delay that caused it, estimate a quality of connectivity between the IC and the other IC over the interconnect lane.

2. The IC of claim 1 , wherein:

the programmable delay line comprises a coarse delay line and a fine delay line that are serially connected;

each delay step of the coarse delay line is longer than each delay step of the fine delay line;

the length of each delay step of the coarse delay line is configured to bring a rising edge of the delayed clock signal in proximity to where the result of the comparison is likely to inverted from a ‘pass’ to a ‘fail,’ or vice versa; and

the length of each delay step of the fine delay line is configured to detect an exact point where the result of the comparison is likely to be inverted from a ‘pass’ to a ‘fail,’ or vice versa.

3. The IC of claim 1 , wherein the estimation of the quality of connectivity comprises a calculation of an eye pattern parameter of the data signal that was received from the interconnect lane between the IC and the other IC.

4. The IC of claim 3 , wherein the eye pattern parameter comprises an eye width, that is calculated based on a time distance between points of inversion of the comparison result at the left and right sides of a Unit Interval (UI) of the data signal that was received from the interconnect lane between the IC and the other IC.

5. The IC of claim 4 , wherein the controller is configured to operate the programmable delay line to scan the eye in one direction, in order to detect the points of inversion of the comparison result.

6. The IC of claim 4 , wherein the controller is configured to select between two eye scanning modes:

a first eye scanning mode in which a first side of the eye is scanned by increasing or decreasing the amount of delay introduced by the programmable delay line; and

a second eye scanning mode in which a second, opposing side of the eye is scanned by increasing or decreasing the amount of delay introduced by the programmable delay line.

7. The IC of claim 6 , wherein the clock signal that clocks the reference clocked receiver is a multi-phase clock signal, and wherein:

in the first eye scanning mode, one of the phases of the multi-phase clock signal is subject to the increasing or the decreasing of the amount of delay introduced by the programmable delay line;

in the second eye scanning mode, a different one of the phases of the multi-phase clock signal is subject to the increasing or the decreasing of the amount of delay introduced by the programmable delay line; and

in both the first and the second eye scanning modes, the different one of the phases of the multi-phase clock signal is used to clock the reference clocked receiver.

8. The IC of claim 6 , wherein:

the reference voltage is a variable reference voltage;

the eye pattern parameter further comprises an eye height; and

the controller is further configured to measure the eye height by gradually adjusting the variable reference voltage during each of the first and second eye scanning modes, thereby measuring the eye width at different voltage levels.

9. The IC of claim 6 , wherein:

the clock signal that clocks the reference clocked receiver is a multi-phase clock signal; and

the controller is further configured to detect a duty cycle distortion of the multi-phase clock signal based on just one of the two eye scanning modes.

10. The IC of claim 4 , wherein:

the clock signal that clocks the reference clocked receiver is a multi-phase clock signal that has an approximately 50% duty cycle; and

in the calculation of the eye width, the delayed clock signal received from the programmable delay line is only one phase of the multi-phase clock signal.

11. The IC of claim 1 , further comprising a compensatory delay element configured to apply a fixed amount of delay to the clock signal, to compensate for an intrinsic delay of the programmable delay line.

12. The IC of claim 1 , further comprising a compensatory delay element configured to apply a fixed amount of delay to the data signal, to compensate for an intrinsic delay of the programmable delay line.

13. The IC of claim 1 , further comprising a compensatory delay element configured to apply a fixed amount of delay to the data signal or the clock signal, to compensate for a distance between the reference clocked receiver and the delayed clocked receiver.