Single point gradiometer
A gradiometer includes a at least one magnet attached to a beam. The magnet moves in response to a magnetic force. A sensing element is configured to measure movement or deflection of the beam or magnet. The gradiometer is configured to determine a gradient of a magnetic field acting on the first magnet based on movement of the magnet. The gradiometer can further measure higher order gradients.
1. A gradiometer comprising:
a platform having a first side, a second end opposite the first side, and a fixed support between the first side and second side;
a first magnet attached to a moveable segment of the platform offset from the fixed support and on the first side, the moveable segment of the platform configured to deflect with respect to a polarization axis of the first magnet in response to a magnetic force from an external magnetic field; and
a sensing element configured to measure deflection of the first magnet with respect to the sensing element, wherein the gradiometer directly measures a gradient of the external magnetic field based on the deflection of the first magnet.
2. The gradiometer of claim 1 , wherein the gradiometer is configured to measure a change in the gradient of the magnetic field.
3. The gradiometer of claim 1 , wherein the change in the gradient of the magnetic field is a higher-than-second order gradient.
4. The gradiometer of claim 1 , further comprising a second magnet mechanically coupled to the first magnet and positioned to deflect along the polarization axis of the first magnet in response to the magnetic force from the external magnetic field, the first magnet and the second magnet being positioned such that a pair of like magnetic poles of the first magnet and the second magnet are adjacent.
5. The gradiometer of claim 1 , further comprising a first non-magnetic element driven at a first resonance frequency along an axis of the movable segment of the platform; and
a second non-magnetic element attached to the first magnet and driven at a second resonance frequency along the axis, wherein the first non-magnetic element and the second non-magnetic element are coupled by a force along the axis, in resonance,
wherein the gradiometer is configured to determine a gradient magnetic field acting on one or more of the first non-magnetic element and magnet based on change in at least one resonance characteristic.
6. The gradiometer of claim 5 , wherein:
the first non-magnetic element is a sphere;
the second non-magnetic element is a plate; and
the plate has an attractive force to the sphere.
7. The gradiometer of claim 6 , wherein the attractive force is a Casimir force; and
the second resonance frequency is twice the first resonance frequency.
8. The gradiometer of claim 1 , wherein the movable segment of the platform extends generally in a plane, and the sensing element is configured to measure deflection of the first magnet in a direction orthogonal to the plane.
9. The gradiometer of claim 1 , further comprising a second magnet positioned on the moveable segment of the platform offset from the fixed support and on the second side.
10. The gradiometer of claim 9 , wherein a polar orientation of the second magnet with respect to the moveable segment of the platform is opposite a polar orientation of the first magnet with respect to the moveable segment of the platform.
11. The gradiometer of claim 1 , further comprising at least one additional magnet positioned on the first side of the moveable segment of the platform adjacent the first magnet.
12. The gradiometer of claim 1 , wherein the moveable segment of the platform is at least one of: a plate; or a beam.
13. A gradiometer comprising:
a platform including a moveable segment;
a pedestal mechanically coupling the moveable segment to a substrate such that the moveable segment deflects around the pedestal, the substrate being fixed;
a first magnet attached to a first side of the moveable segment to deflect around the pedestal in response to a magnetic force from an external magnetic field;
a second magnet attached to a second side of the moveable segment, the second side being opposite the first side of the moveable segment with respect to the pedestal, wherein the second magnet is positioned such that a polar orientation of the second magnet with respect to the moveable segment is opposite a polar orientation of the first magnet with respect to the moveable segment; and
a sensing element configured to measure a deflection of the first magnet along an axis, wherein the gradiometer directly measures a gradient of the external magnetic field based on the deflection of the first magnet with respect to the sensing element.
14. The gradiometer of claim 13 , wherein the sensing element is positioned along the axis and offset from the magnet.
15. The gradiometer of claim 13 , further comprising at least one additional magnet positioned on the first side of the moveable segment adjacent the first magnet.
16. The gradiometer of claim 13 , further comprising at least one additional magnet attached to the first magnet at like magnetic poles and positioned along the moveable segment to move along the axis.
17. The gradiometer of claim 13 , wherein the moveable segment extends generally in a plane, and the sensing element is configured to measure the deflection of the first magnet in a direction orthogonal to the plane.
18. The gradiometer of claim 13 , wherein the gradiometer is configured to measure a change in the gradient of the magnetic field.
19. The gradiometer of claim 18 , wherein the change in the gradient of the magnetic field is a second order gradient.
20. The gradiometer of claim 19 , wherein the change in the gradient of the magnetic field is a higher-than-second order gradient.
21. The gradiometer of claim 13 , wherein the moveable segment is at least one of: a plate; or a beam.