Software defined device variants
Embodiments herein describe assigning integrated circuits with defects as variants of the integrated circuit design. Each variant can deactivate different circuitry in the integrated circuit design. A location of the defect can be matched to a variant that has a deactivated region that covers the defect. The integrated circuit can then be assigned to that variant.
1. A method, comprising:
identifying a defect in an integrated circuit (IC);
identifying a first variant of a plurality of predefined variants of the IC that includes a predefined deactivated region that covers the defect, wherein each of the plurality of predefined variants includes a plurality of predefined deactivated regions that are non-contiguous, wherein a size of each of the plurality of predefined deactivated regions permits signals to be routed through each of the plurality of predefined deactivated regions; and
assigning the IC to the first variant.
2. The method of claim 1 , wherein the IC comprises interconnect resources, wherein a first type of the interconnect resources is dedicated to interface with adjacent logical components and a second type of the interconnect resources is used to connect non-adjacent circuitry to each other, wherein the first type of interconnect resources are part of the plurality of predefined deactivated regions but the second type of interconnect resources are not.
3. The method of claim 2 , wherein the second type of the interconnect resources comprises interconnect tiles used to connect non-adjacent circuitry, wherein the interconnect tiles permit signals to be routed through the plurality of predefined deactivated regions to active non-adjacent circuitry disposed on opposite sides of the plurality of predefined deactivated regions.
4. The method of claim 1 , wherein the plurality of predefined deactivated regions in each of the plurality of predefined variants are non-overlapping with the plurality of predefined deactivated regions in each of the other plurality of predefined variants.
5. The method of claim 4 , wherein a union of the plurality of predefined deactivated regions of the plurality of predefined variants covers an entire area of the IC, except for areas of the IC containing circuitry that is excluded from the plurality of predefined deactivated regions of each of the plurality of predefined variants.
6. The method of claim 5 , further comprising:
identifying a defect in a second IC with a same design as the IC, wherein the defect is at a location of the second IC containing the circuitry that is excluded from the plurality of predefined deactivated regions of each of the plurality of predefined variants; and
discarding the second IC.
7. The method of claim 1 , further comprising:
identifying two defects in a second IC with a same design as the IC; and
upon determining none of the plurality of predefined variants has a plurality of predefined deactivated regions that cover both of the defects, discarding the second IC.
8. The method of claim 1 , further comprising:
identifying two defects in a second IC with a same design as the IC; and
upon determining that a second variant of the plurality of predefined variants has a plurality of predefined deactivated regions that cover both of the defects, assigning the second IC to the second variant.
9. The method of claim 1 , wherein the IC includes a plurality of columns, where each of the plurality of columns comprises only one type of circuitry, wherein the plurality of predefined deactivated regions for each of the plurality of predefined variants are located within multiple ones of the plurality of columns.
10. The method of claim 9 , wherein neighboring columns of the plurality of columns comprise different types of circuitry.
11. A system, comprising:
processor; and
memory storing an application which, when executed by the processor, performs an operation, the operation comprising:
identifying a defect in an integrated circuit (IC);
identifying a first variant of a plurality of predefined variants of the IC that includes a predefined deactivated region that covers the defect, wherein each of the plurality of predefined variants includes a plurality of predefined deactivated regions that are non-contiguous, wherein a size of each of the plurality of predefined deactivated regions permits signals to be routed through each of the plurality of predefined deactivated regions; and
assigning the IC to the first variant.
12. The system of claim 11 , wherein the IC comprises interconnect resources, wherein a first type of the interconnect resources is dedicated to interface with adjacent logical components and a second type of the interconnect resources is used to connect non-adjacent circuitry to each other, wherein the first type of interconnect resources are part of the plurality of predefined deactivated regions but the second type of interconnect resources are not.
13. The system of claim 12 , wherein the second type of the interconnect resources comprises interconnect tiles used to connect non-adjacent circuitry, wherein the interconnect tiles permit signals to be routed through the plurality of predefined deactivated regions to active non-adjacent circuitry disposed on opposite sides of the plurality of predefined deactivated regions.
14. The system of claim 11 , wherein the plurality of predefined deactivated regions in each of the plurality of predefined variants are non- overlapping with the plurality of predefined deactivated regions in each of the other plurality of predefined variants.
15. The system of claim 14 , wherein a union of the plurality of predefined deactivated regions of the plurality of predefined variants covers an entire area of the IC, except for areas of the IC containing circuitry that is excluded from the plurality of predefined deactivated regions of each of the plurality of predefined variants.
16. A non-transitory computer readable storage medium encoding instructions, which, when executed by a processor, perform an operation, the operation comprising:
identifying a defect in an integrated circuit (IC);
identifying a first variant of a plurality of predefined variants of the IC that includes a predefined deactivated region that covers the defect, wherein each of the plurality of predefined variants includes a plurality of predefined deactivated regions that are non-contiguous, wherein a size of each of the plurality of predefined deactivated regions permits signals to be routed through each of the plurality of predefined deactivated regions; and
assigning the IC to the first variant.
17. The non-transitory computer readable storage medium of claim 16 , wherein the IC comprises interconnect resources, wherein a first type of the interconnect resources is dedicated to interface with adjacent logical components and a second type of the interconnect resources is used to connect non-adjacent circuitry to each other, wherein the first type of interconnect resources are part of the plurality of predefined deactivated regions but the second type of interconnect resources are not.
18. The non-transitory computer readable storage medium of claim 17 , wherein the second type of the interconnect resources comprises interconnect tiles used to connect non-adjacent circuitry, wherein the interconnect tiles permit signals to be routed through the plurality of predefined deactivated regions to active non-adjacent circuitry disposed on opposite sides of the plurality of predefined deactivated regions.
19. The non-transitory computer readable storage medium of claim 16 , wherein the plurality of predefined deactivated regions in each of the plurality of predefined variants are non-overlapping with the plurality of predefined deactivated regions in each of the other plurality of predefined variants.
20. The non-transitory computer readable storage medium of claim 19 , wherein a union of the plurality of predefined deactivated regions of the plurality of predefined variants covers an entire area of the IC, except for areas of the IC containing circuitry that is excluded from the plurality of predefined deactivated regions of each of the plurality of predefined variants.