Contact pins for test sockets and test sockets comprising the same
A contact pin for a test socket is provided in the test socket for testing the electrical characteristics of a semiconductor device. The contact pin includes an elastic part elastically deformable in the longitudinal direction of the contact pin; a first contact part which includes a first support part extending from one end of the elastic part and a first contact tip connected to an end of the first support part; and a second contact part which includes a second support part extending from the other end of the elastic part and a second contact tip connected to an end of the second support part, where the elastic part and the second contact part are bent in at least one direction with respect to the first contact part.
1. A contact pin for a test socket, the contact pin being provided in the test socket for testing electrical characteristics of a semiconductor device, comprising:
an elastic part, wherein the elastic part is elastically deformable in a longitudinal direction of the contact pin;
a first contact part, wherein the first contact part comprises a first support part extending from a first end of the elastic part and a first contact tip connected to an end of the first support part; and
a second contact part, wherein the second contact part comprises a second support part extending from a second end of the elastic part and a second contact tip connected to an end of the second support part,
wherein the elastic part and the second contact part are bent in at least one direction with respect to the first contact part.
2. The contact pin of claim 1 , wherein the elastic part and the second contact part are bent in a first direction perpendicular to the longitudinal direction and in a second direction perpendicular to the first direction, respectively.
3. The contact pin of claim 1 , wherein the first contact part and the second contact part are located on different planes.
4. The contact pin of claim 1 , wherein the first contact tip and the second contact tip are located on different lines.
5. The contact pin of claim 1 , wherein the contact pin is formed with a stopper for restraining the contact pin to the test socket.
6. A test socket for testing electrical characteristics of a semiconductor device, comprising:
a housing, wherein a plurality of first through-holes are formed in the housing;
a cover, wherein a plurality of second through-holes are formed in the cover; and
a plurality of contact pins, wherein the plurality of contact pins are inserted into the plurality of first through-holes and the plurality of second through-holes,
wherein the plurality of contact pins comprise:
an elastic part, wherein the elastic part is elastically deformable in a longitudinal direction of the contact pin;
a first contact part, wherein the first contact part comprises a first support part extending from a first end of the elastic part and a first contact tip connected to an end of the first support part, and the first contact part is inserted into the plurality of first through-holes; and
a second contact part, wherein the second contact part comprises a second support part extending from a second end of the elastic part and a second contact tip connected to an end of the second support part, and the second contact part is inserted into the plurality of second through-holes,
wherein the elastic part and the second contact part are bent in at least one direction with respect to the first contact part before the plurality of contact pins are inserted into the plurality of second through-holes.
7. The test socket of claim 6 , wherein the elastic part and the second contact part are bent in a first direction perpendicular to the longitudinal direction and in a second direction perpendicular to the first direction before the plurality of contact pins are inserted into the plurality of second through-holes, respectively.
8. The test socket of claim 6 , wherein the first contact part and the second contact part are located on a same plane.
9. The test socket of claim 6 , wherein the first contact tip and the second contact tip are located on a same line.
10. The test socket of claim 6 , wherein the contact pin is formed with a stopper for restraining the contact pin to the test socket.
11. The test socket of claim 7 , wherein the plurality of first through-holes and the plurality of second through-holes are formed in an oblique shape such that the first contact tip and the second contact tip are located on a second direction axis.
12. The test socket of claim 7 , wherein the first contact part is inclined at a certain angle such that the first contact tip and the second contact tip are located on a second direction axis so as to be inserted into the plurality of first through-holes.
13. The test socket of claim 12 , wherein while the second contact part is inserted into the plurality of second through-holes, the cover moves the second contact part in the first direction to position the first contact tip and the second contact tip on a first direction axis.