IP Library › Granted Patent US 12,631,573
Granted Patent B2
US 12,631,573 · App. 18/137,910 · Granted May 19, 2026

X-ray inspection apparatus and method of inspection with X-rays

Inventors: Toshiyuki Takahara (Tokyo, JP); Tsuneo Sato (Tokyo, JP); Satoshi Matsubara (Tokyo, JP); Yuta Seki (Tokyo, JP); Kazuya Iwata (Tokyo, JP)
Assignee: HITACHI HIGH-TECH ANALYSIS CORPORATION
G01N23/083G01N23/18G01N2223/313
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Quick Facts
Patent No.
US 12,631,573
App. No.
18/137,910
Granted
May 19, 2026
Kind
B2
Abstract

Proposed are an X-ray inspection apparatus and a method of inspection with X-rays in which even in a sample having coated portion and uncoated portion of the cathode material, the inspection of foreign objects in the both portions can be simultaneously performed under the same conditions. The X-ray inspection apparatus includes an X-ray source ( 2 ) that irradiates the sample (S) with X-rays (X 1 ), an X-ray detection unit ( 3 ) which is installed at a side opposite to the X-ray source with respect to the sample and detects the X-rays that passed through the sample, and a filter ( 4 ) installed between the X-ray source and the X-ray detection unit, wherein the sample has a region with a large amount of X-ray absorption and a region with a small amount of X-ray absorption.

Claims (24)

1 . An X-ray inspection apparatus comprising:

an X-ray source that irradiates a sample with X-rays;

an X-ray detection unit that is installed on a side opposite to the X-ray source with respect to the sample and detects the X-rays that passed through the sample; and

a filter installed between the X-ray source and the X-ray detection unit,

wherein the sample has a region with a large amount of X-ray absorption and a region with a small amount of X-ray absorption and

the filter is formed of a material that makes an intensity ratio between an X-ray that passed through the region with a large amount of X-ray absorption and an X-ray that passed through the region with a small amount of X-ray absorption smaller than when the filter is not installed.

2 . The X-ray inspection apparatus of claim 1 , wherein the sample has a region with a large amount of X-ray absorption and a region with a small amount of X-ray absorption in a specific energy band of the X-rays with which the sample is irradiated and

the filter is formed of a material that makes absorption of X-rays of the specific energy band greater than absorption of X-rays of other energy bands.

3 . The X-ray inspection apparatus of claim 1 , wherein the sample has an uncoated portion that is a region where a base material is exposed and an amount of X-ray absorption is small and a coated portion that is a region where a material different from the base material is applied on the base material and an amount of X-ray absorption is large.

4 . The X-ray inspection apparatus of claim 1 , wherein the sample is of a flexible film shape and

the filter is placed in close contact with the sample between the X-ray source and the X-ray detection unit.

5 . The X-ray inspection apparatus of claim 4 , wherein the filter is placed on each of both surfaces of the sample with the sample being in between.

6 . The X-ray inspection apparatus of claim 4 , further comprising:

a sample moving mechanism that continuously moves the sample of a band shape in an extension direction of the sample,

wherein the sample moving mechanism is provided with a roller member rotatable while the sample is in contact with a portion of an outer circumferential surface of the roller member,

the X-ray source is disposed inside or outside the roller member,

the X-ray detection unit is installed on a side opposite to the X-ray source with respect to a portion of the sample in contact with the outer circumferential surface of the roller member, and

the roller member is the filter.

7 . A method of inspection with X-rays comprising:

irradiating a sample with X-rays from an X-ray source; and

detecting the X-rays that passed through the sample with an X-ray detection unit installed at a side opposite to the X-ray source with respect to the sample,

wherein a filter is installed between the X-ray source and the X-ray detection unit,

the sample has a region with a large amount of X-ray absorption and a region with a small amount of X-ray absorption, and

the filter is formed of a material that makes an intensity ratio between an X-ray that passed through the region with a large amount of X-ray absorption and an X-ray that passed through the region with a small amount of X-ray absorption smaller than when the filter is not installed.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 15, 2025
From: TAKAHARA, TOSHIYUKI; SATO, TSUNEO; MATSUBARA, SATOSHI; SEKI, YUTA; IWATA, KAZUYA
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 071707/0363 →
CHANGE OF NAME Recorded Jul 14, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 071701/0397 →
Continuity (1)
Related Publication 20230384247A1 · Nov 30, 2023
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