Display device and method of inspecting the same
A display device includes a display layer including an active area in which a plurality of pixels is arranged and a peripheral area located adjacent to the active area. The display layer includes a transistor disposed in the active area and including a gate, a source, and a drain, a first crack line disposed in the peripheral area and surrounding a portion of the active area in a plan view, and a second crack line disposed in the peripheral area under the first crack line. The first crack line is insulated from the second crack line.
1. A display device comprising:
a display layer comprising an active area in which a plurality of pixels is arranged and a peripheral area located adjacent to the active area,
the display layer comprising:
a transistor disposed in the active area and comprising a gate, a source, and a drain;
a first crack line disposed in the peripheral area on a same layer as the gate and surrounding a portion of the active area in a plan view; and
a second crack line disposed in the peripheral area under the first crack line to overlap the first crack line in the plan view,
wherein the first crack line is insulated from the second crack line.
2. The display device of claim 1 , wherein the layer is an insulating layer disposed between the first crack line and the second crack line.
3. The display device of claim 1 , wherein the second crack line surrounds the portion of the active area in the plan view.
4. The display device of claim 1 , wherein the display layer further comprises a driving circuit electrically connected to the transistor, the peripheral area comprises a first area, a second area spaced apart from the first area in a first direction, and a bending area disposed between the first area and the second area, the first area is located adjacent to the active area, and the driving circuit is disposed in the second area.
5. The display device of claim 4 , wherein each of the first crack line and the second crack line is disposed in the first area, the second area, and the bending area.
6. A display device comprising:
a display layer comprising an active area in which a plurality of pixels is arranged and a peripheral area located adjacent to the active area,
the display layer comprising:
a transistor disposed in the active area and comprising a gate, a source, and a drain;
a first crack line disposed in the peripheral area and surrounding a portion of the active area in a plan view; and
a second crack line disposed in the peripheral area under the first crack line,
wherein the first crack line is insulated from the second crack line, and
wherein the active area includes a pattern hole, and the first crack line surrounds a portion of the pattern hole.
7. A display device comprising:
a display layer comprising an active area in which a plurality of pixels is arranged and a peripheral area located adjacent to the active area; and
a sensor layer disposed on the display layer, sensing an external input, and comprising a plurality of conductive layers,
the display layer comprising:
a transistor disposed in the active area and comprising a gate, a source, and a drain;
a first crack line disposed in the peripheral area and surrounding a portion of the active area in a plan view; and
a second crack line disposed in the peripheral area under the first crack line,
wherein the first crack line is insulated from the second crack line.
8. A method of inspecting a display device, comprising:
providing a display device comprising a display layer comprising an active area in which a plurality of pixels is arranged and a peripheral area located adjacent to the active area, the display layer comprising a transistor disposed in the active area and comprising a gate, a source, and a drain, a first crack line disposed in the peripheral area and surrounding a portion of the active area in a plan view, a second crack line disposed in the peripheral area under the first crack line, and an insulating layer disposed between the first crack line and the second crack line;
detecting whether a defect occurs in the display device based on at least one of the first crack line and the second crack line; and
analyzing a position where the defect occurs based on a Wheatstone bridge.
9. The method of claim 8 , wherein the analyzing of the position of the defect is performed using a Murray loop test.
10. The method of claim 8 , further comprises: detecting whether a first defect of the first crack line has occurred based on the first crack line; and detecting whether a second defect of the insulating layer has occurred based on the first crack line and the second crack line.
11. The method of claim 10 , wherein the analyzing of the position of the defect comprises analyzing a position of the second defect occurring in the insulating layer.
12. The method of claim 8 , wherein the analyzing of the position of the defect comprises electrically connecting a Murray loop tester to the first crack line.
13. The method of claim 8 , wherein the analyzing of the position of the defect comprises connecting the second crack line to a ground voltage.
14. The method of claim 8 , wherein the analyzing of the position of the defect comprises detecting a position where excessive heat is generated in the first crack line.
15. A method of inspecting a display device, comprising:
providing a display device comprising a display layer comprising an active area in which a plurality of pixels is arranged and a peripheral area located adjacent to the active area, the display layer comprising a first crack line disposed in the peripheral area and surrounding a portion of the active area in a plan view, and a second crack line disposed in the peripheral area under the first crack line;
detecting whether a defect occurs in the display layer based on the first crack line and the second crack line; and
analyzing a position where the defect occurs based on a Murray loop test.
16. The method of claim 15 , wherein the analyzing of the position of the defect comprises connecting the second crack line to a ground voltage.
17. The method of claim 15 , wherein the analyzing of the position of the defect comprises:
connecting the first crack line to a detector; and
allowing the first crack line and the detector to form a Wheatstone bridge.
18. The method of claim 15 , wherein the analyzing of the position of the defect comprises detecting a position where excessive heat is generated in the first crack line.