IP Library › Granted Patent US 12,254,950
Granted Patent B2
US 12,254,950 · App. 18/148,875 · Granted Mar 18, 2025

Dies, semiconductor package structures, enable pin configuration methods and memories

Inventors: Yingjun Wu (Hubei, CN); Huabin Yan (Hubei, CN); Dong He (Hubei, CN); Lei You (Hubei, CN)
Assignee: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
G11C7/1039G11C7/1063G11C7/109
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,254,950
App. No.
18/148,875
Granted
Mar 18, 2025
Kind
B2
Abstract

In one example, a peripheral circuit in a die is configured to: first, receive control commands, and generate indication information according to the control commands, the control commands being used for indicating the die to determine the address of the die, the indication information being used for indicating M dies to share the same enable pin, M being a positive integer greater than or equal to 1; and then, determine the address of the die according to the indication information, and send the address of the die, the address being used for addressing an enable signal provided by the enable pin.

Claims (32)

1. A die comprising a peripheral circuit, the peripheral circuit configured to:

receive control commands, the control commands for indicating the die to determine an address of the die;

generate indication information for M dies based on the control commands, the indication information to include address encoding information of the M dies, the indication information being used for indicating the M dies to share a same enable pin, M being a positive integer greater than or equal to 1;

determine the address of a die of the M dies based on the indication information, wherein to determine the address further includes to decode the indication information to produce a first encoded value based on a number of dies sharing the same enable pin and to decode the first encoded value to obtain the address of the die; and

send the address of the die to a main control chip, the main control chip to enable the die via an enable signal provided by the same enable pin to the address.

2. The die of claim 1 , wherein the peripheral circuit includes:

a control circuit, a trigger, a first decoding circuit, and a second decoding circuit, which are coupled in sequence;

the control circuit is configured to receive the control commands, generate the indication information based on the control commands, and send the indication information;

the trigger is configured to receive the indication information and send the indication information to the first decoding circuit;

the first decoding circuit is configured to determine the first encoded value of the die based on the indication information; and

the second decoding circuit is configured to decode the first encoded value to obtain the address of the die.

3. The die of claim 2 , wherein the peripheral circuit further includes a register coupled with the first decoding circuit, and the first decoding circuit is further configured to set a first numerical value in the register to be a second numerical value, the first numerical value is used for indicating that an encoded value of the die is a second encoded value, and the second numerical value is used for indicating that the encoded value of the die is the first encoded value.

4. The die of claim 3 , wherein values of M include 1, 2, 4, 8, 16 or 32.

5. A semiconductor package structure, wherein the semiconductor package structure comprises N dies configured to at least:

receive control commands using M dies among the N dies, the control commands for indicating a die to determine an address of the die, and wherein M is a positive integer greater than or equal to 1, N is a positive integer greater than or equal to 2, and M is less than or equal to N;

generate indication information for M dies based on the control commands, the indication information to include address encoding information of the M dies, the indication information being used for indicating the M dies to share a same enable pin;

determine the address of the die of the M dies based on the indication information, wherein to determine the address further includes to decode the indication information to produce a first encoded value based on a number of dies sharing the same enable pin and to decode the first encoded value to obtain the address of the die; and

send the address of the die to a main control chip via the M dies, the main control chip to enable the die via an enable signal provided by the same enable pin to the address.

6. The semiconductor package structure of claim 5 , wherein when M is greater than or equal to 2, encoded values of the M dies are different from each other.

7. The semiconductor package structure of claim 6 , wherein the M dies include a target die therein, wherein the target die is used for receiving chip selection signals, the chip selection signals are used for selecting the target die to receive the enable signal and include the address of the target die.

8. An enable pin configuration method of a die, wherein the die includes a peripheral circuit, and the method comprises:

receiving, by the peripheral circuit, control commands, the control commands for indicating the die to determine an address of the die;

generating indication information for M dies based on the control commands, the indication information including address encoding information of the M dies, the indication information being used for indicating the M dies to share a same enable pin, M being a positive integer greater than or equal to 1;

determining, by the peripheral circuit, the address of the die based on the indication information, wherein determining the address further includes to decode the indication information to produce a first encoded value based on a number of dies sharing the same enable pin and to decode the first encoded value to obtain the address of the die; and

sending the address of the die to a main control chip, the main control chip to enable the die via an enable signal provided by the same enable pin to the address.

9. The method of claim 8 , wherein the peripheral circuit includes a control circuit, a trigger, a first decoding circuit, and a second decoding circuit, which are coupled in sequence, and the method further includes:

receiving, by the control circuit, the control commands, generating the indication information based on the control commands, and sending the indication information;

receiving, by the trigger, the indication information, and sending the indication information to the first decoding circuit;

determining, by the first decoding circuit, the first encoded value of the die based on the indication information; and

decoding, by the second decoding circuit, the first encoded value to obtain the address of the die.

10. The method of claim 9 , wherein the peripheral circuit further includes a register coupled with the first decoding circuit, and the method further includes setting, by the first decoding circuit, a first numerical value in the register to be a second numerical value, the first numerical value being used for indicating that an encoded value of the die is a second encoded value, the second numerical value being used for indicating that the encoded value of the die is the first encoded value.

11. The method of claim 10 , wherein values of M include 1, 2, 4, 8, 16 or 32.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE THE REEL AND FRAME PREVIOUSLY RECORDED AT REEL: 063213 FRAME: 0781. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Apr 25, 2023
From: WU, YINGJUN; YAN, HUABIN; HE, DONG; YOU, LEI
To: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
Reel/Frame 063440/0534 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ADDRESS OF THE ASSIGNEE PREVIOUSLY RECORDED AT REEL: 062883 FRAME: 0464. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Mar 31, 2023
From: WU, YINGJUN; YAN, HUABIN; HE, DONG; YOU, LEI
To: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
Reel/Frame 063213/0781 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 5, 2023
From: WU, YINGJUN; YAN, HUABIN; HE, DONG; YOU, LEI
To: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
Reel/Frame 062883/0308 →
Continuity (2)
Continuation PCTCN2022137657 · Dec 8, 2022
Related Publication 20240194227A1 · Jun 13, 2024
References Cited (11)
US 20140351525A1 · Chen et al. · 2014 [cited by applicant]
US 20220206719A1 · Juan et al. · 2022 [cited by applicant]
US 20230350606A1 · Hsu · 2023 [cited by examiner]
CN 101958152A · 2011 [cited by applicant]
CN 102543189A · 2012 [cited by applicant]
CN 103246625A · 2013 [cited by applicant]
CN 108710579A · 2018 [cited by applicant]
CN 113468082A · 2021 [cited by applicant]
CN 114691554A · 2022 [cited by applicant]
International Searching Authority, “International Search Report,” issued in connection with International Patent Application No. PCT/CN2022/137657, mailed on Aug. 9, 2023, 5 pages. [English Translation Included]. [cited by applicant]
International Searching Authority, “Written Opinion,” issued in connection with International Patent Application No. PCT/CN2022/137657, mailed on Aug. 9, 2023, 6 pages. [English Machine Translation Included]. [cited by applicant]