Method and apparatus for providing wear leveling

1. A method for providing wear spreading among a plurality of die regions, the method comprising:

producing die region wear-out data for a die region in each die of a plurality of stacked dies, the die region wear-out data representing a cumulative amount of time each of the plurality of die regions has spent at an operating condition based on operating condition data from each of the plurality of die regions, wherein the operating condition data is based on at least one of the following operating characteristics: frequency of operation of the plurality of die regions, an operating voltage of the plurality of die regions and an activity level of the plurality of die regions;

storing, in persistent memory, the die region wear-out data; and

spreading wear among the plurality of die regions using a spreading operation based on operating condition data that is not accumulated over a life of a respective die region, that overrides a thermal wear spreading operation that is based on the die region wear-out data from the persistent memory, that is accumulated over the life of the respective die region.

2. The method of claim 1 , wherein the die region wear-out data is based on operating condition data associated with each of the plurality of die regions accrued over the life of each respective region of the plurality of die regions.

3. The method of claim 1 , wherein:

the operating condition includes a plurality of operating ranges;

the die region wear-out data includes data representing a cumulative amount of time each of the plurality of die regions has spent in each of the plurality of operating ranges; and

producing die region wear-out data includes combining the cumulative amount of time each of the plurality of die regions has spent in each of the plurality of operating ranges.

4. The method of claim 1 , wherein the operating condition data is based on a plurality of operating characteristics from the group consisting of: the frequency of operation of the plurality of die regions, temperature level of the plurality of die regions, the operating voltage of the plurality of die regions, the activity level of the plurality of die regions, a timing margin of the plurality of die regions, and a number of detected faults of the plurality of die regions.

5. The method of claim 4 , further comprising:

combining operating condition data associated with differing types of operating characteristics from each of the plurality of die regions; and

spreading wear among the plurality of die regions by generating wear-out control data based on the combined operating condition data associated with differing types of operating characteristics of each of the plurality of die regions.

6. The method of claim 1 , further comprising:

determining die region wear-out level data by combining die region wear-out data from multiple operating ranges; and

wherein spreading wear among the plurality of die regions includes controlling task execution among the plurality of die regions using the die region wear-out level data.

7. An apparatus, comprising:

at least one integrated circuit having a plurality of stacked dies each stacked die comprising a plurality of die regions;

a plurality of sensors operatively coupled to the plurality of die regions and operative to provide operating condition data associated with the plurality of die regions; and

wear spreading logic, operatively coupled to the plurality of sensors and operative to:

produce die region wear-out data representing a cumulative amount of time each of the plurality of die regions has spent at an operating condition based on the operating condition data from each of the plurality of die regions, wherein the operating condition data is based on at least one of the following operating characteristics: frequency of operation of the plurality of die regions, an operating voltage of the plurality of die regions, an activity level of the plurality of die regions, a timing margin of the plurality of die regions, and a number of detected faults of the plurality of die regions;

store, in persistent memory, the die region wear-out data; and

spread wear among the plurality of die regions using a spreading operation based on operating condition data that is not accumulated over a life of a respective die region, that overrides a thermal wear spreading operation that is based on the die region wear-out data from the persistent memory, that is accumulated over the life of the respective die region.

8. The apparatus of claim 7 , wherein the wear spreading logic is further operative to accrue the operating condition data over the life of each respective region of the plurality of die regions.

9. The apparatus of claim 7 , wherein:

the operating condition includes a plurality of operating ranges;

the die region wear-out data includes data representing a cumulative amount of time each of the plurality of die regions has spent in each of the plurality of operating ranges; and

the wear spreading logic is further operative to generate wear-out control data by combining the cumulative amount of time each of the plurality of die regions has spent in each of the plurality of operating ranges.

10. The apparatus of claim 7 , wherein the operating condition data is based on a plurality of operating characteristics from the group consisting of: the frequency of operation of the plurality of die regions, the operating voltage of the plurality of die regions, the activity level of the plurality of die regions, temperature level of the plurality of die regions, the timing margin of the plurality of die regions, and the number of detected faults of the plurality of die regions.

11. The apparatus of claim 10 , wherein the wear spreading logic is operative to:

combine operating condition data associated with differing types of operating characteristics from each of the plurality of die regions; and

spread wear among the plurality of die regions by generating wear-out control data based on the combined operating condition data associated with differing types of operating characteristics of each of the plurality of die regions.

12. The apparatus of claim 7 , wherein the wear spreading logic is further operative to:

determine die region wear-out data by combining die region wear-out data from multiple operating ranges; and

spread wear among the plurality of die regions by controlling task execution among the plurality of die regions using the determined die region wear-out data.

13. An apparatus, comprising:

at least one integrated circuit package having a plurality of stacked dies each with a plurality of die regions;

sensors operatively coupled to the plurality of die regions and operative to provide operating condition data associated with the plurality of die regions;

a persistent memory; and

wear spreading logic, operatively coupled to the persistent memory and responsive to the operating condition data, and operative to:

produce die region wear-out data representing a cumulative amount of time each of the plurality of die regions has spent at an operating condition based on the operating condition data from each of the plurality of die regions, wherein the operating condition data is based on at least one of the following operating characteristics: frequency of operation of the plurality of die regions, an operating voltage of the plurality of die regions, an activity level of the plurality of die regions, a timing margin of the plurality of die regions, and a number of detected faults of the plurality of die regions, wherein the die wear-out data represents a cumulative amount of time at least one of the operating characteristics has spent at a level and a rate of change in the operating characteristic;

store, in persistent memory, the die region wear-out data; and

spread wear among the plurality of die regions using a spreading operation based on operating condition data that is not accumulated over a life of a respective die region, that overrides a thermal wear spreading operation that is based on the die region wear-out data from the persistent memory, that is accumulated over the life of the respective die region.

14. The apparatus of claim 13 , wherein the wear spreading logic is further operative to accrue the operating condition data over the life of each respective region of the plurality of die regions.

15. The apparatus of claim 13 , wherein:

the operating condition includes a plurality of operating ranges;

the die region wear-out data includes data representing a cumulative amount of time each of the plurality of die regions has spent in each of the plurality of operating ranges; and

the wear spreading logic is further operative to generate wear-out control data by combining the cumulative amount of time each of the plurality of die regions has spent in each of the plurality of operating ranges.

16. The apparatus of claim 13 , wherein the wear spreading logic is further operative to:

determine die region wear-out level data by combining die region wear-out data from multiple operating ranges; and

spread wear among the plurality of die regions by controlling task execution among the plurality of die regions using the die region wear-out level data.

17. The apparatus of claim 13 , wherein the wear spreading logic is further operative to:

combine operating condition data associated with differing types of operating characteristics from each of the plurality of die regions; and

spread wear among the plurality of die regions by generating wear-out control data based on the combined operating condition data associated with differing types of operating characteristics of each of the plurality of die regions.