IP Library › Granted Patent US 12,628,014
Granted Patent B2
US 12,628,014 · App. 18/163,933 · Granted May 12, 2026

Measurement device and measurement method

Inventors: Takahiro Kasagi (Atsugi, JP); Koichi Inoue (Atsugi, JP); Hiroyuki Tanikage (Atsugi, JP)
Assignee: ANRITSU CORPORATION
H04W24/08H04W80/04
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Quick Facts
Patent No.
US 12,628,014
App. No.
18/163,933
Granted
May 12, 2026
Kind
B2
Abstract

A measurement device includes: a display unit that displays information related to a test; a device control unit group that includes a plurality of device control units controlling control target devices of a control target device group, respectively, the control target device group including the control target devices that each simulate the component of the component group, respectively; a measurement target setting unit that sets a component selected from the component group as a measurement target device; a test case creation unit that creates a test case by displaying a use order of device control units to be used for the test of the measurement target device among the device control unit group on the display unit in a user-settable manner; and a test case execution unit that executes the test case as to the device control units to be used for the test in the set use order.

Claims (21)

1 . A measurement device for testing a component included in a component group constituting an Open Radio Access Network (Open RAN), the measurement device comprising:

a display unit, including a display screen, that displays information related to a test;

a device control unit group, including a CPU, an ASIC or an FPGA, that includes a plurality of device control units controlling control target devices of a control target device group, respectively, the control target device group including the control target devices that each simulate the component of the component group;

a measurement target setting unit, including a CPU, an ASIC or an FPGA, that sets a component selected from the component group as a measurement target device;

a test case creation unit, including a CPU, an ASIC or an FPGA, that creates a test case by displaying a use order of device control units to be used for the test of the measurement target device among the device control unit group on the display unit in a user-settable manner;

a test case execution unit, including a CPU, an ASIC or an FPGA, that executes the test case as to the device control units to be used for the test in the set use order; and

a control target selection unit, including a CPU, an ASIC or an FPGA, that displays identification information of control target devices usable for the test of the measurement target device among the control target device group in a manner on the display unit in a user-selectable manner,

wherein the control target selection unit selects, in accordance with the measurement target device set by the measurement target setting unit and without requiring user selection, an emulator of a component adjacent to at least the measurement target device in the Open RAN as the control target device.

2 . The measurement device according to claim 1 , further comprising a processing component extraction unit, including a CPU, an ASIC or an FPGA, that extracts, from a processing component database, identification information of a control processing executable for the control target device selected by the control target selection unit as a processing component, and displays the extracted processing component in a user-selectable manner, wherein the processing component selected by the user is associated with a device control unit in which the user order is specified in the test case.

3 . The measurement device according to claim 2 , further comprising a processing component arrangement unit, including a CPU, an ASIC or an FPGA, that displays processing components selected from the processing components extracted by the processing component extraction unit side by side on the display unit in align in a manner that the user can change an order of the displayed processing components, and stores, in a memory unit, information on a series of the processing components arranged in the order changed by the user as the test case.

4 . The measurement device according to claim 3 , further comprising a processing component detailed setting unit, including a CPU, an ASIC or an FPGA, that displays, on the display unit in a user-settable manner, a processing content of the processing component displayed on the display unit by the processing component arrangement unit.

5 . The measurement device according to claim 1 , the component device group includes a radio unit of the Open RAN (O-RU), a distributed unit of the Open RAN (O-DU), a central unit of the Open RAN (O-CU), and a user equipment (UE).

6 . The measurement device according to claim 1 , wherein the device control unit group includes a plurality of device control units, including a CPU, an ASIC or an FPGA, that control one or a plurality of measurement equipment, respectively.

7 . A measurement method of testing a component included in a component group constituting an Open Radio Access Network (Open RAN), the measurement method comprising:

a display step of displaying information related to a test in a display unit;

a preparing step of preparing a device control unit group that includes a plurality of device control units controlling control target devices of a control target device group, respectively, the control target device group including the control target devices that each simulate the component of the component group, respectively;

a measurement target setting step of setting a component selected from the component group as a measurement target device;

a test case creation step of creating a test case by displaying a use order of device control units to be used for the test of the measurement target device among the device control unit group on the display unit in a user-settable manner; and

a test case execution step of executing the test case as to the device control units to be used for the test in the set use order,

the measurement method further comprising a control target selection step of displaying identification information of control target devices usable for the test of the measurement target device among the control target device group in a manner on the display unit in a user-selectable manner,

wherein, in the control target selection step, an emulator of a component adjacent to at least the measurement target device in the Open RAN is selected as the control target device, in accordance with the measurement target device set by the measurement target setting unit and without requiring user selection.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 3, 2023
From: KASAGI, TAKAHIRO; INOUE, KOICHI; TANIKAGE, HIROYUKI
To: ANRITSU CORPORATION
Reel/Frame 062580/0029 →
Priority Claims (1)
JP 2022-059000 · Mar 31, 2022 · national
Continuity (1)
Related Publication 20230319610A1 · Oct 5, 2023
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