IP Library Granted Patent US 12,474,526
Granted Patent B2
US 12,474,526 · App. 18/177,844 · Granted Nov 18, 2025

Managing photonic integrated circuit optical coupling

Inventors: Jean-Philippe Bérubé (Saint-Augustin, CA); Marie-Josee Picard (L'Ancienne-Lorette, CA)
Assignee: Ciena Corporation
G02B6/262
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Quick Facts
Patent No.
US 12,474,526
App. No.
18/177,844
Granted
Nov 18, 2025
Kind
B2
Abstract

An apparatus for coupling an external optical interface to a first optical interface of a photonic integrated circuit comprises: a substrate comprising an optically transmissive material; and a first optical waveguide core formed in proximity to a first surface of the substrate. The first optical waveguide core comprises: a first portion comprising the external optical interface, a second portion that is (1) adjacent to the first surface of the substrate, and (2) adjacent to a second surface of the substrate at an acute angle with the first surface of the substrate, and a third portion between the first and second portions that is separated from the first surface of the substrate by a thickness of the optically transmissive material.

Claims (35)

1 . An apparatus for coupling an external optical interface to a first optical interface of a photonic integrated circuit, the apparatus comprising:

a substrate comprising an optically transmissive material; and

a first optical waveguide core formed in proximity to a first surface of the substrate, the first optical waveguide core comprising

a first portion in optical communication with the external optical interface to couple optical waves between the first portion and the external optical interface,

a second portion that is (1) in proximity to the first surface of the substrate, and (2) adjacent to a second surface of the substrate at an acute angle with the first surface of the substrate and configured to reflect the optical waves before or after they propagate through the first surface of the substrate, and

a third portion between the first and second portions that is separated from the first surface of the substrate by a thickness of the optically transmissive material such that the second portion and the third portion have different respective distances to the first surface;

where the thickness of the optically transmissive material by which the third portion is separated from the first surface of the substrate is less than 0.1 microns, and/or the second portion of the first optical waveguide core is positioned less than 0.1 microns from the first optical interface of the photonic integrated circuit.

2 . The apparatus of claim 1 , further comprising a second optical waveguide core formed in proximity to the first surface of the substrate, the second optical waveguide core comprising

a first portion in optical communication with a second external optical interface,

a second portion that is (1) in proximity to the first surface of the substrate, and (2) adjacent to the second surface of the substrate, and

a third portion between the first and second portions that is separated from the first surface of the substrate by a thickness of the optically transmissive material.

3 . The apparatus of claim 1 , where the acute angle is between about 10 degrees to 80 degrees.

4 . The apparatus of claim 1 , where the second and third portions are at opposite ends of a segment of the first optical waveguide core that is not straight.

5 . The apparatus of claim 1 , where the second and third portions are at opposite ends of a curved segment of the first optical waveguide core.

6 . The apparatus of claim 1 , where the photonic integrated circuit is fabricated on a portion of a silicon-on-insulator wafer.

7 . The apparatus of claim 1 , where a portion of the first optical waveguide core extends into a trench of the photonic integrated circuit.

8 . The apparatus of claim 1 , where the first optical waveguide core is optically coupled to at least one passive optical element.

9 . The apparatus of claim 8 , where the passive optical element comprises a ring resonator or a Sagnac loop.

10 . The apparatus of claim 1 , where the first optical waveguide core is optically coupled to a wavelength-dependent optical element.

11 . The apparatus of claim 1 , where the first optical waveguide core is optically coupled to a second optical waveguide core formed in proximity to the first surface of the substrate.

12 . The apparatus of claim 11 , where the second optical waveguide core is optically coupled to a second optical interface of the photonic integrated circuit.

13 . The apparatus of claim 1 , where the second portion of the first optical waveguide core is positioned based at least in part on an optical test signal received from the photonic integrated circuit.

14 . The apparatus of claim 1 , further comprising a second optical waveguide core formed in proximity to the first surface of the substrate that is optically isolated from the first optical waveguide core.

15 . The apparatus of claim 1 , where the external optical interface further comprises an adhesive with an index of refraction substantially matching an index of refraction of the optically transmissive material.

16 . A method for fabricating a coupler for coupling an external optical interface to a first optical interface of a photonic integrated circuit, the method comprising:

forming a substrate comprising an optically transmissive material; and

forming a first optical waveguide core formed in proximity to a first surface of the substrate, the first optical waveguide core comprising

a first portion in optical communication with the external optical interface to couple optical waves between the first portion and the external optical interface,

a second portion that is (1) in proximity to the first surface of the substrate, and (2) adjacent to a second surface of the substrate at an acute angle with the first surface of the substrate and configured to reflect the optical waves before or after they propagate through the first surface of the substrate, and

a third portion between the first and second portions that is separated from the first surface of the substrate by a thickness of the optically transmissive material such that the second portion and the third portion have different respective distances to the first surface;

where the thickness of the optically transmissive material by which the third portion is separated from the first surface of the substrate is less than 0.1 microns, and/or the second portion of the first optical waveguide core is positioned less than 0.1 microns from the first optical interface of the photonic integrated circuit.

17 . The method of claim 16 , where the second and third portions are at opposite ends of a segment of the first optical waveguide core that is not straight.

18 . The method of claim 16 , where the second and third portions are at opposite ends of a curved segment of the first optical waveguide core.

19 . The method of claim 16 , where the first optical waveguide core is optically coupled to a second optical waveguide core formed in proximity to the first surface of the substrate.

20 . The method of claim 19 , where the second optical waveguide core is optically coupled to a second optical interface of the photonic integrated circuit.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 3, 2023
From: BÉRUBÉ, JEAN-PHILIPPE; PICARD, MARIE-JOSEE
To: CIENA CORPORATION
Reel/Frame 062866/0774 →
Continuity (1)
Related Publication 20240295697A1 · Sep 5, 2024
References Cited (5)
US 7783146B2 · Blauvelt et al. · 2010 [cited by applicant]
US 20230358976A1 · Hu · 2023 [cited by examiner]
Jean-Philippe Bérubé et al., “Direct Inscription of on-surface waveguides in polymers using a mid-ir fiber laser,” Optics Express, Oct. 14, 2019, vol. 27, No. 21, pp. 31013-31022. [cited by applicant]
Jean-Philippe Bérubé et al., “Femtosecond laser direct inscription of surface skimming waveguides in glass,” Optics Letters, Jul. 2016, 6 pages. [cited by applicant]
R. Polster et al., “Wafer-scale high-density edge coupling for high throughput testing of silicon photonics”, M3F.2, pp. 1-3, OFC 2018. [cited by applicant]