Spectrometry system with decreased light path
A spectrometer comprises a plurality of isolated optical channels comprising a plurality of isolated optical paths. The isolated optical paths decrease cross-talk among the optical paths and allow the spectrometer to have a decreased length with increased resolution. In many embodiments, the isolated optical paths comprise isolated parallel optical paths that allow the length of the device to be decreased substantially. In many embodiments, each isolated optical path extends from a filter of a filter array, through a lens of a lens array, through a channel of a support array, to a region of a sensor array. Each region of the sensor array comprises a plurality of sensor elements in which a location of the sensor element corresponds to the wavelength of light received based on an angle of light received at the location, the focal length of the lens and the central wavelength of the filter.
1. A spectrometer assembly comprising:
a spectrometer;
a housing;
an optically transmissive cover plate;
a diffuser;
a filter array comprising a plurality of filters;
a lens array comprising a plurality of lenses; and
a support comprising a plurality of channels, wherein the housing covers the diffuser, the filter array and the lens array with the optically transmissive cover plate on a first end of the spectrometer assembly and the support on a second end of the spectrometer assembly thereby placing the support on a detector to measure spectra, wherein the support extends between the detector and the lens array, the support shaped and sized to support the lens array and position the lens array at a focal length from the detector, wherein the plurality of channels is configured to pass light from the plurality of lenses to a plurality of regions of the detector.
2. The spectrometer assembly of claim 1 , wherein the detector comprises the plurality of regions, wherein each region of the plurality of regions comprises multiple sensors.
3. The spectrometer assembly of claim 1 , further comprising an image sensor, wherein the image sensor includes a bare die surface in contact with the support to position each lens of the plurality of lenses at the focal length from the bare die surface.
4. The spectrometer assembly of claim 1 , wherein each lens of the plurality of lenses corresponds to a region of the plurality of regions.
5. The spectrometer assembly of claim 1 , wherein the filter array corresponds to the lens array, wherein each filter of the plurality of filters is configured to transmit a range of wavelengths different from other filters of the plurality of filters.
6. The spectrometer assembly of claim 1 , wherein the filter array comprises a substrate having a thickness and a first side and a second side, the first side oriented toward the diffuser, the second side oriented toward the lens array and the detector, wherein the filter array comprises a plurality of coatings on the second side oriented toward the lens array to inhibit cross-talk among lenses of the array.
7. The spectrometer assembly of claim 6 , wherein the plurality of coatings on the second side comprises a plurality of interference filters, wherein each filter of the plurality of interference filters on the second side is configured to transmit a central wavelength of light to one lens of the plurality of lenses.
8. The spectrometer assembly of claim 6 , wherein the filter array comprises one or more coatings on the first side of the filter array.
9. The spectrometer assembly of claim 8 , wherein the one or more coatings on the first side of the filter array comprises a coating to balance mechanical stress.
10. The spectrometer assembly of claim 8 , wherein the one or more coatings on the first side of the filter array comprises an optical filter.
11. The spectrometer assembly of claim 6 , wherein the first side of the substrate does not comprise a coating.
12. The spectrometer assembly of claim 6 , wherein the plurality of filters comprises an optical filter on the first side of the filter array, wherein the optical filter comprises an IR pass filter to selectively pass infrared light.
13. The spectrometer assembly of claim 1 , wherein the support includes a light absorbing material located on a wall of each of the plurality of channels in order to inhibit cross-talk among the plurality of channels.
14. The spectrometer assembly of claim 1 , wherein the support includes an axis extending a distance from an upper surface of the detector to a lower surface of the lens array, and wherein the support comprises stiffness in order to fix the distance from the upper surface to the lower surface at the focal length.
15. The spectrometer assembly of claim 3 , wherein the plurality of regions comprises a plurality of active regions, and wherein the plurality of channels corresponds to the plurality of active regions, and wherein the support comprises end structures sized and shaped to contact the bare die surface at a plurality of contact locations away from the plurality of active regions.