IP Library › Granted Patent US 12,724,697
Granted Patent B2
US 12,724,697 · App. 18/198,577 · Granted Sep 1, 2026

Apparatus and method for simulation automation in regression test

Inventors: Jicheon Kim (Suwon-si, KR); Jinwoo Park (Suwon-si, KR); Yeonho Jeong (Suwon-si, KR); Seonil Brian Choi (Suwon-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
G06F11/3684G06F11/3692
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Quick Facts
Patent No.
US 12,724,697
App. No.
18/198,577
Granted
Sep 1, 2026
Kind
B2
Abstract

A method of simulating an integrated circuit includes providing at least one test case to a simulation tool, obtaining at least one first simulation result and at least one first simulation log from the simulation tool, classifying, with a first machine learning model, the at least one test case into one fail class of a plurality of fail classes, generating at least one renewed test case by applying, with a controller, a solution to the at least one test case, and providing the at least one renewed test case to the simulation tool.

Claims (79)

1 . A method of simulating an integrated circuit, the method comprising:

providing at least one test case to a simulation tool;

obtaining at least one first simulation result and at least one first simulation log from the simulation tool;

outputting, with a first machine learning model, a probability that the at least one test case is to be classified into at least one fail class;

classifying, with the first machine learning model, the at least one test case into one fail class of a plurality of fail classes based on the probability that the at least one test case is to be classified into at least one fail class being greater than a predetermined threshold probability value;

generating at least one renewed test case by applying, with a controller, a solution to the at least one test case; and

providing the at least one renewed test case to the simulation tool.

2 . The method of claim 1 , further comprising:

providing a first test case set to a second machine learning model; and

predicting, with the second machine learning model, at least one test case of the first test case set where a simulation result is expected to fail.

3 . The method of claim 2 , further comprising:

generating, with the simulation tool, a second simulation result based on a second test case set; and

training the second machine learning model based on the second test case set and the second simulation result.

4 . The method of claim 2 , wherein the second machine learning model comprises a third sub-model configured to:

receive the first test case set;

vectorize the first test case set; and

generate second data based on the vectorized first test case set.

5 . The method of claim 4 , wherein the first test case set comprises at least one attribute, and

wherein the at least one attribute comprises a target, a test class, and a function target.

6 . The method of claim 4 , wherein the second machine learning model comprises a fourth sub-model configured based on logistic regression and configured to determine whether a simulation result of the first test case set fails or passes based on the second data.

7 . The method of claim 1 , wherein the first machine learning model comprises a first sub-model configured to:

receive the at least one first simulation log;

tokenize the at least one first simulation log, and

generate first data based on the tokenized at least one first simulation log.

8 . The method of claim 7 , wherein the first sub-model comprises:

a model based on a transformer, and

at least one of a byte pair encoding (BPE) algorithm and a wordpiece algorithm.

9 . The method of claim 7 , wherein the first machine learning model further comprises a second sub-model comprising a fully connected layer and configured to receive the first data from the first sub-model and output the probability of the at least one test case to be classified into at least one fail class based on the first data.

10 . The method of claim 9 , wherein the at least one fail class comprises a data mismatch occurring in source data.

11 . The method of claim 1 , wherein the at least one fail class comprises a data mismatch, and the solution comprises at least one of version management and a system-on design revision based on the data mismatch.

12 . A system comprising:

at least one memory storing instructions; and

at least one processor configured to execute the instructions to:

provide at least one test case to a simulation tool;

obtain at least one first simulation result and at least one first simulation log from the simulation tool;

output, with a first machine learning model, a probability that the at least one test case is to be classified into at least one fail class;

classify, with the first machine learning model, the at least one test case into one fail class of a plurality of fail classes based on the probability that the at least one test case is to be classified into at least one fail class being greater than a predetermined threshold probability value;

generate a renewed test case by applying, with a controller, a solution to the at least one test case; and

provide the renewed test case to the simulation tool.

13 . The system of claim 12 , wherein the at least one processor is further configured to execute the instructions to:

provide a first test case set to a second machine learning model; and

predict, with the second machine learning model, at least one test case of the first test case set where a simulation result is expected to fail.

14 . The system of claim 13 , wherein the at least one processor is further configured to execute the instructions to:

generate, with the simulation tool, a second simulation result based on a second test case set; and

train the second machine learning model based on the second test case set and the second simulation result.

15 . The system of claim 13 , wherein the second machine learning model comprises:

a third sub-model configured to:

receive the first test case set;

vectorize the first test case set; and

generate second data based on the vectorized first test case set; and

a fourth sub-model configured based on logistic regression and configured to determine whether a simulation result of the first test case set fails or passes based on the second data.

16 . The system of claim 12 , wherein the first machine learning model comprises:

a first sub-model configured to:

receive the at least one first simulation log;

tokenize the at least one first simulation log; and

generate first data based on the tokenized at least one first simulation log; and

a second sub-model comprising a fully connected layer, the second sub-model configured to receive the first data from the first sub-model and output the probability of the at least one test case to be classified into at least one fail class based on the first data.

17 . A non-transitory computer-readable storage medium storing instructions that, when executed by at least one processor, cause the at least one processor to:

provide at least one test case to a simulation tool;

obtain at least one first simulation result and at least one first simulation log from the simulation tool;

output, with a first machine learning model, a probability that the at least one test case is to be classified into at least one fail class;

classify, with the first machine learning model, the at least one test case into one fail class of a plurality of fail classes based on the probability that the at least one test case is to be classified into at least one fail class being greater than a predetermined threshold probability value;

generate a renewed test case by applying, with a controller, a solution to the at least one test case; and

provide the renewed test case to the simulation tool.

18 . The non-transitory computer-readable storage medium of claim 17 , wherein the instructions, when executed by the at least one processor, further cause the at least one processor to:

provide a first test case set to a second machine learning model, and

predict, with the second machine learning model, at least one test case of the first test case set where a simulation result is expected to fail.

19 . The non-transitory computer-readable storage medium of claim 18 , wherein the second machine learning model comprises:

a third sub-model configured to:

receive the first test case set;

vectorize the first test case set; and

generate second data based on the vectorized first test case set; and

a fourth sub-model configured based on logistic regression and configured to determine whether a simulation result of the first test case set fails or passes based on the second data.

20 . The non-transitory computer-readable storage medium of claim 17 , wherein the first machine learning model comprises:

a first sub-model configured to:

receive the at least one first simulation log;

tokenize the at least one first simulation log; and

generate first data based on the tokenized at least one first simulation log; and

a second sub-model comprising a fully connected layer, the second sub-model being configured to receive the first data from the first sub-model and output the probability of the at least one test case to be classified into at least one fail class based on the first data.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 17, 2023
From: KIM, JICHEON; PARK, JINWOO; JEONG, YEONHO; CHOI, SEONIL BRIAN
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 063675/0823 →
Priority Claims (1)
KR 10-2022-0066916 · May 31, 2022 · national
Continuity (1)
Related Publication 20230385185A1 · Nov 30, 2023
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