IP Library › Granted Patent US 12,340,831
Granted Patent B2
US 12,340,831 · App. 18/225,908 · Granted Jun 24, 2025

Memory device including three-dimensional racetrack and operating method thereof

Inventor: Youngnam Hwang (Suwon-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
G11C11/1655G11C11/161G11C11/1657
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Quick Facts
Patent No.
US 12,340,831
App. No.
18/225,908
Granted
Jun 24, 2025
Kind
B2
Abstract

A memory device including a three-dimensional racetrack and an operating method of the memory device are provided. The memory device includes a first racetrack, a first transistor, a first domain index controller, a bit line driver, a plurality of first magnetic tunnel junction (MTJ) elements, a plurality of first cell transistors, and a source line driver.

Claims (51)

1. A memory device comprising:

a first racetrack formed in a first direction, the first racetrack comprising a domain section comprising a plurality of first domains arranged in a second direction that is perpendicular to the first direction;

a first transistor connected to the first racetrack;

a first domain index controller connected to the first transistor and configured to shift first data from a first domain to a second domain, among the plurality of first domains of the first racetrack;

a bit line driver connected to the first domain index controller;

a plurality of first magnetic tunnel junction (MTJ) elements arranged in the first direction and adjacent to the first racetrack;

a plurality of first cell transistors respectively connected to the plurality of first MTJ elements; and

a source line driver connected to the plurality of first cell transistors through a source line.

2. The memory device of claim 1 , wherein the first racetrack further comprises a first buffer domain section and a second buffer domain section, and

wherein the domain section is between the first buffer domain section and the second buffer domain section.

3. The memory device of claim 2 , wherein a first number of the plurality of first domains in the domain section is greater than a second number of domains in the first buffer domain section and a third number of domains in the second buffer domain section.

4. The memory device of claim 2 , wherein the bit line driver is connected to the first buffer domain section of the first racetrack.

5. The memory device of claim 1 , further comprising a row decoder configured to drive a plurality of word lines,

wherein each of the plurality of first cell transistors is connected to one of the plurality of word lines.

6. The memory device of claim 5 , wherein the first domain index controller is further configured to shift the first data from the first domain to the second domain of the first racetrack in the first direction, based on a first address, and

wherein the row decoder is further configured to activate one of the plurality of word lines, based on a second address.

7. The memory device of claim 1 , wherein the first domain index controller is enabled based on a third address.

8. The memory device of claim 1 , wherein the first domain index controller comprises an n-bit register, and

wherein the domain section comprises 2 n domains.

9. The memory device of claim 1 , further comprising:

a second racetrack spaced apart from the first racetrack in a third direction perpendicular to the first direction and the second direction, the second racetrack comprising a plurality of second domains;

a second transistor connected to the second racetrack;

a second domain index controller connected to the second transistor and configured to shift second data from a first domain to a second domain, among the plurality of second domains of the second racetrack;

a plurality of second MTJ elements arranged in the first direction and adjacent to the second racetrack; and

a plurality of second cell transistors respectively connected to the plurality of second MTJ elements,

wherein the bit line driver is connected to the second domain index controller, and the source line driver is connected to respective ends of the plurality of second cell transistors through the source line.

10. A memory device comprising:

a racetrack formed in a first direction, the racetrack comprising a domain section comprising a plurality of domains arranged in a second direction that is perpendicular to the first direction;

a first transistor connected to the racetrack;

a domain index controller connected to the first transistor and configured to shift first data from a first domain to a second domain, among the plurality of domains of the racetrack;

a source line driver connected to the domain index controller;

a plurality of magnetic tunnel junction (MTJ) elements arranged in the first direction and adjacent to the racetrack;

a plurality of cell transistors respectively connected to the plurality of MTJ elements; and

a bit line driver connected to the plurality of cell transistors through a bit line.

11. The memory device of claim 10 , wherein the racetrack further comprises a first buffer domain section and a second buffer domain section, and

wherein the domain section is between the first buffer domain section and the second buffer domain section.

12. The memory device of claim 11 , wherein a first number of the plurality of first domains in the domain section is greater than a second number of domains in the first buffer domain section and a third number of domains in the second buffer domain section.

13. The memory device of claim 11 , wherein the bit line driver is connected to the first buffer domain section of the racetrack.

14. The memory device of claim 10 , further comprising a row decoder configured to drive a plurality of word lines,

wherein each of the plurality of cell transistors is connected to one of the plurality of word lines.

15. The memory device of claim 14 , wherein the domain index controller is further configured to shift the first data from the first domain to the second domain of the racetrack in the first direction, based on a first address, and

wherein the row decoder is further configured to activate one of the plurality of word lines, based on a second address.

16. The memory device of claim 14 , wherein the domain index controller is enabled based on a third address.

17. The memory device of claim 10 , wherein the domain index controller comprises an n-bit register, and

wherein the domain section comprises 2 n domains.

18. An operating method of a memory device, the operating method comprising:

shifting first data from a first domain to a second domain, among a plurality of domains in a racetrack, based on a first address signal;

selecting one of a plurality of magnetic tunnel junction (MTJ) elements adjacent to the racetrack, based on a second address signal; and

performing a read operation or a write operation based on a current that has passed through the racetrack and the selected MTJ elements.

19. The operating method of claim 18 , wherein the shifting of the first data from the first domain to the second domain of the racetrack comprises providing a first current to the racetrack.

20. The operating method of claim 19 , wherein the performing the read operation or the write operation comprises providing the racetrack with a second current that is less than the first current.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 25, 2023
From: HWANG, YOUNGNAM
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 064377/0689 →
Priority Claims (2)
KR 10-2022-0112340 · Sep 5, 2022 · national
KR 10-2022-0150973 · Nov 11, 2022 · national
Continuity (1)
Related Publication 20240079040A1 · Mar 7, 2024
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