Magnetic recording apparatus comprising disk with reduced thickness and reduced disk flatness
A disk for a magnetic recording apparatus. The disk includes a substrate comprising a first surface and a second surface, wherein the substrate has a substrate thickness. The disk includes a first coating layer disposed over the first surface of the substrate, wherein the first coating layer has a first coating layer thickness. The disk includes a second coating layer disposed over the second surface of the substrate, wherein the second coating layer has a second coating layer thickness. The disk has a disk thickness, wherein the disk thickness includes the substrate thickness. The maximum thickness difference between the first coating layer thickness and the second coating layer thickness is a function of the square of the disk thickness.
1 . A method for fabricating a disk for use in a hard disk drive, the method comprising:
selecting an allowable flatness deviation for a new disk to be fabricated;
obtaining a reference disk configured for use in the hard disk drive, the reference disk having a substrate with a thickness (S 0 ), a first nickel-phosphorous (NiP) coating directly on a first surface of the substrate, a second NiP coating directly on an opposing second surface of the substrate, and a flatness deviation less than the allowable flatness deviation;
determining a thickness difference (TD 0 ) between a thickness of the first NiP coating and a thickness of the second NiP coating of the reference disk;
providing a substrate for the new disk that has a substrate thickness (S 1 ) and a diameter that is the same as a diameter of the reference disk;
determining a thickness difference (TD 1 ) for the new disk between a first NiP coating to be applied to a first surface of the substrate of the new disk and a second NiP coating to be applied to a second, opposing surface of the new disk, wherein the thickness difference (TD 1 ) for the new disk is determined based, at least in part, on a function that includes multiplying the thickness difference (TD 0 ) of the reference disk by the square of S 1 divided by the square of S 0 ;
forming the first NiP coating directly on the first surface of the substrate of the new disk; and
forming the second NiP coating directly on the second surface of the substrate of the new disk;
wherein a difference in thickness between the first and second NiP coatings of the new disk (TD 1 ) is less than the thickness difference (TD 0 ) for the reference disk.
2 . The method of claim 1 , wherein the substrate of the reference disk and the substrate of the new disk comprise the same material.
3 . The method of claim 1 , wherein the substrate of the reference disk and the substrate of the new disk comprise a material selected from the group consisting of magnesium, zinc, glass and combinations thereof.
4 . The method of claim 1 , wherein the substrate of the reference disk and the substrate of the new disk comprise Al-Mg.
5 . The method of claim 1 ,
wherein the substrate of the reference disk has a substrate Young's modulus value E 0 ;
wherein the substrate of the new disk has a substrate Young's modulus value E 1 ; and
wherein the thickness difference (TD 1 ) for the new disk is further determined based, at least in part, on a dimensionless ratio of E 1 to E 0 .
6 . The method of claim 5 , wherein the thickness difference (TD 1 ) for the new disk is further determined as a function of
T
D
0
×
(
S
1
S
0
)
2
×
E
1
E
0
.
7 . The method of claim 1 , wherein an expansion rate of the first and second coatings of the reference disk is less than an expansion rate of the substrate of the reference disk, and wherein an expansion rate of the first and second coatings of the new disk is less than an expansion rate of the substrate of the new disk.
8 . The method of claim 1 , further comprising forming a magnetic recording layer over the first coating, wherein the magnetic recording layer is configured to store information.
9 . The method of claim 1 , wherein the reference disk is a prior iteration of the new disk.
10 . The method of claim 1 , wherein S 1 is 0.5 millimeters (mm).
11 . The method of claim 10 , wherein the first and second NiP coatings of the new disk each have a thickness in the range of 12-30 micrometers (μm).
12 . The method of claim 10 , wherein the substrate thickness (S 1 ) for the new disk is less than the substrate thickness (S 0 ) of the reference disk.
13 . A method for fabricating a disk for use in a hard disk drive, the method comprising:
selecting an allowable flatness deviation for a new disk to be fabricated;
obtaining a reference disk configured for use in the hard disk drive, the reference disk having a substrate with a thickness (S 0 ), a first coating on a first surface of the substrate, a second coating on an opposing second surface of the substrate, and a flatness deviation less than the allowable flatness deviation;
determining a thickness difference (TD 0 ) between a thickness of the first coating and a thickness of the second coating of the reference disk;
providing a substrate for the new disk that has a substrate thickness (S 1 ) and a diameter that is the same as a diameter of the reference disk;
determining a thickness difference (TD 1 ) for the new disk between a first coating to be applied on a first surface of the substrate of the new disk and a second coating to be applied on a second, opposing surface of the new disk, wherein the thickness difference (TD 1 ) for the new disk is determined based, at least in part, on a function that includes multiplying the thickness difference (TD 0 ) of the reference disk by the square of S 1 divided by the square of S 0 ;
forming the first coating comprising nickel-phosphorous (NiP) on the first surface of the substrate of the new disk; and
forming the second coating comprising NiP on the second surface of the substrate of the new disk;
wherein a difference in thickness between the first and second coatings of the new disk (TD 1 ) is less than the thickness difference (TD 0 ) for the reference disk.
14 . A method for fabricating a disk for use in a hard disk drive, the method comprising:
obtaining a reference disk configured for use in the hard disk drive, the reference disk having a substrate with a thickness (S 0 ), a first coating on a first surface of the
substrate, a second coating on an opposing second surface of the substrate;
determining a thickness difference (TD 0 ) between a thickness of the first coating and a thickness of the second coating of the reference disk;
providing a substrate for a new disk to be fabricated that has a substrate thickness (S 1 ) and a diameter that is the same as a diameter of the reference disk;
determining a thickness difference (TD 1 ) for the new disk between a first coating to be applied on a first surface of the substrate of the new disk and a second coating to be applied on a second, opposing surface of the new disk, wherein the thickness difference (TD 1 ) for the new disk is determined based, at least in part, on a function that includes multiplying the thickness difference (TD 0 ) of the reference disk by the square of S 1 divided by the square of So;
forming the first coating comprising nickel-phosphorous (NiP) on the first surface of the substrate of the new disk; and
forming the second coating comprising NiP on the second surface of the substrate of the new disk;
wherein a difference in thickness between the first and second coatings of the new disk (TD 1 ) is less than the thickness difference (TD 0 ) for the reference disk.
15 . The method of claim 14 ,
wherein the substrate of the reference disk has a substrate Young's modulus value E 0 ;
wherein the substrate of the new disk has a substrate Young's modulus value E 1 ; and
wherein the thickness difference (TD 1 ) for the new disk is further determined based, at least in part, on a dimensionless ratio of E 1 to E 0 .
16 . The method of claim 15 , wherein the thickness difference (TD 1 ) for the new disk is further determined as a function of
T
D
0
×
(
S
1
S
0
)
2
×
E
1
E
0
.
17 . The method of claim 14 , wherein an expansion rate of the first and second coatings of the reference disk is less than an expansion rate of the substrate of the reference disk, and wherein an expansion rate of the first and second coatings of the new disk is less than an expansion rate of the substrate of the new disk.
18 . The method of claim 14 ,
wherein S 1 is 0.5 millimeters (mm), and
wherein the first and second NiP coatings of the new disk each have a thickness in the range of 12-30 micrometers (μm).