METHODS AND SYSTEMS FOR CHROMATOGRAPHICALLY ANALYZING A TEST SAMPLE
There are provided techniques, including methods and systems, for chromatographically analyzing a test sample. The techniques include obtaining a sample chromatogram of the test sample with a chromatography system, the chromatography system including a detector having an adjustable response factor. The techniques also include adjusting, while obtaining the sample chromatogram, the response factor of the detector based on a compensation signal for compensating expected chromatographic artefacts to obtain an artefact-compensated sample chromatogram. The disclosed techniques allow compensating for chromatographic artefacts, which include baseline drift(s) and/or peak tailing(s), during acquisition of chromatograms.
1 .- 55 . (canceled)
56 . A method for chromatographically analyzing a test sample, the method comprising:
obtaining a sample chromatogram of the test sample with a chromatography system, the chromatography system comprising a detector having an adjustable response factor; and
adjusting, while obtaining the sample chromatogram, the response factor of the detector based on a compensation signal for compensating expected chromatographic artefacts to obtain an artefact-compensated sample chromatogram.
57 . The method of claim 56 , further comprising determining the compensation signal.
58 . The method of claim 57 , wherein said determining the compensation signal is based at least partly on calibration data, the calibration data comprising artefact information about the expected chromatographic artefacts.
59 . The method of claim 58 , further comprising obtaining the calibration data from a control sample chromatographically representative of the test sample.
60 . The method of claim 57 , wherein said determining the compensation signal is based on calibration data obtained from a control sample and a scaling factor representative of a deviation between the calibration data and sample data measured during said obtaining the sample chromatogram.
61 . The method of claim 58 , wherein the expected chromatographic artefacts are real-time expected chromatographic defects, the response factor of the detector being adjusted in real-time or near real-time.
62 . The method of claim 56 , wherein the compensation signal comprises a peak tailing compensation signal component.
63 . The method of claim 62 , wherein the peak tailing compensation signal component is determined based on a mirror function.
64 . The method of claim 56 , wherein the compensation signal comprises a base line drift compensation signal component.
65 . The method of claim 57 , wherein said determining the compensation signal is performed entirely during said obtaining the sample chromatogram and said adjusting the response factor of the detector.
66 . The method of claim 56 , further comprising circulating the test sample in a plasma chamber of the detector.
67 . The method of claim 66 , further comprising generating a plasma from the test sample.
68 . The method of claim 67 , wherein said generating the plasma in the test sample comprises applying a plasma generating field across the plasma chamber to generate the plasma from the test sample.
69 . The method of claim 68 , wherein said adjusting the response factor of the detector comprises adjusting the plasma generating field.
70 . The method of claim 68 , further comprising measuring an optical emission of the plasma, the optical emission being representative of the test sample.
71 . The method of claim 70 , wherein the optical emission is a spectral line representative of an analyte present in the test sample.
72 . The method of claim 70 , wherein said measuring the optical emission comprises obtaining a reference signal, obtaining an emission signal, and subtracting the reference signal from the emission signal.
73 . The method of 56 , further comprising pre-processing the artefact-compensated chromatogram.
74 . The method of claim 73 , wherein said pre-processing the artefact-compensated chromatogram comprises at least one of: filtering, adjusting, and correcting one or more peaks of the artefact-compensated chromatogram.
75 . The method of claim 56 , further comprising processing the artefact-compensated chromatogram to determine at least one property of the test sample.
76 . The method of claim 75 , wherein said processing the artefact-compensated chromatogram comprises performing at least one mathematical operation on the artefact-compensated chromatogram or at least one peak thereof.
77 . A chromatography system for chromatographically analyzing a test sample, the system comprising:
a detector having an adjustable response factor, the detector being configured for obtaining a sample chromatogram of the test sample; and
a control and processing unit coupled to the detector and configured for:
adjusting, while the sample chromatogram is obtained by the detector, the response factor of the detector based on a compensation signal for compensating expected chromatographic artefacts to obtain an artefact-compensated sample chromatogram.
78 . The chromatography system of claim 77 , wherein the detector is a plasma-based detector, the plasma-based detector comprising:
a plasma chamber configured for receiving the test sample;
a plasma generator configured for applying a plasma generating field across the plasma chamber to generate a plasma from the test sample; and
an optical detection module configured for detecting optical emissions emitted from the plasma and producing a detection signal, the sample chromatogram being generated from the detection signal.
79 . A method for chromatographically analyzing a test sample, the method comprising:
generating a plasma from the test sample in a plasma cell of a chromatography system, using a plasma generator of the chromatography system;
determining operating conditions of the plasma, said determining the operating conditions comprising:
determining an operating frequency of the plasma generator; and/or
determining an operating current and/or an operating voltage of the plasma generator;
generating a compensation signal, based on the operating conditions of the plasma, the compensation signal being sent towards a detector having an adjustable response factor, the compensation signal causing an adjustment of the response factor of the detector for compensating expected chromatographic artefacts; and
obtaining a sample chromatogram of the test sample with the detector, during the adjustment of the response factor of the detector, to obtain an artefact-compensated sample chromatogram.