Reflection characteristic analysis device, reflection characteristic analysis method, and reflection characteristic analysis program
A reflection characteristic analysis device analyzes reflection characteristics of a reconfigurable intelligent surface (RIS: Reconfigurable Intelligent Surface). The reflection characteristic analysis device includes a ray trace calculation unit and an electromagnetic field analysis unit. The ray trace calculation unit calculates an incident angle of an electromagnetic wave incident on the reconfigurable intelligent surface by a ray-tracing method. The electromagnetic field analysis unit acquires the incident angle calculated by the ray trace calculation unit, and calculates, based on an electromagnetic field analysis, the reflection characteristics obtained when the electromagnetic wave enters the reconfigurable intelligent surface at the incident angle.
1 . A reflection characteristic analysis device for analyzing reflection characteristics of a reconfigurable intelligent surface, the reflection characteristic analysis device comprising:
processing circuitry configured to execute:
first processing that calculates an incident angle of an electromagnetic wave incident on the reconfigurable intelligent surface by a ray-tracing method; and
second processing that acquires the incident angle calculated by the first processing and calculates, based on an electromagnetic field analysis, the reflection characteristics obtained when the electromagnetic wave enters the reconfigurable intelligent surface at the incident angle.
2 . The reflection characteristic analysis device according to claim 1 , further comprising:
one or more storage devices configured to store the incident angle calculated by the first processing,
wherein in the second processing, the processing circuitry acquires the incident angle stored in the one or more storage devices to calculate the reflection characteristics.
3 . The reflection characteristic analysis device according to claim 1 , wherein:
the processing circuitry is further configured to calculate radio wave propagation characteristics in an environment including the reconfigurable intelligent surface by a ray-tracing method, based on the reflection characteristics calculated by the second processing.
4 . A reflection characteristic analysis method for analyzing reflection characteristics of a reconfigurable intelligent surface, the reflection characteristic analysis method comprising:
first processing that calculates an incident angle of an electromagnetic wave incident on the reconfigurable intelligent surface by a ray-tracing method; and
second processing that acquires the incident angle calculated by the first processing and calculates, based on an electromagnetic field analysis, the reflection characteristics obtained when the electromagnetic wave enters the reconfigurable intelligent surface at the incident angle.
5 . The reflection characteristic analysis method according to claim 4 , further comprising:
storing the incident angle calculated by the first processing in one or more storage devices,
wherein the second processing includes acquiring the incident angle stored in the one or more storage devices to calculate the reflection characteristics.
6 . A non-transitory computer-readable recording medium storing a reflection characteristic analysis program for analyzing reflection characteristics of a reconfigurable intelligent surface, the reflection characteristic analysis program, when executed by a computer, causing the computer to execute:
first processing that calculates an incident angle of an electromagnetic wave incident on the reconfigurable intelligent surface by a ray-tracing method; and
second processing that acquires the incident angle calculated by the first processing and calculates, based on an electromagnetic field analysis, the reflection characteristics obtained when the electromagnetic wave enters the reconfigurable intelligent surface at the incident angle.