IP Library › Patent Application 18308202
Patent Application
App. No. 18/308,202

SINGLE PHOTON DETECTION ELEMENT, ELECTRONIC DEVICE, AND LiDAR DEVICE

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Quick Facts
Patent No.
US None
App. No.
18/308,202
Abstract

Disclosed is a single photon detection device comprises a first well, a second well provided on the first well, a heavily doped region provided on the second well, and a contact facing the heavily doped region. The first well, the second well, and the contact have a first conductive type. The heavily doped region has a second conductive type that is different from the first conductive type. The region between the heavily doped region and the contact consist of semiconductor materials.

Claims (32)

1 . A single photon detection device comprising:

a first well;

a second well provided on the first well;

a heavily doped region provided on the second well; and

a contact facing the heavily doped region,

wherein the first well, the second well, and the contact have a first conductive type,

wherein the heavily doped region has a second conductive type that is different from the first conductive type,

the region between the heavily doped region and the contact consist of semiconductor materials.

2 . The single photon detection device of claim 1 , wherein the distance between the heavily doped region and the contact is 0.2 ˜2.5 .

3 . The single photon detection device of claim 1 , further comprising:

a guard ring provided between the heavily doped region and the contact,

wherein the guard ring has a second conductive type and has a doping concentration lower than the heavily doped region.

4 . The single photon detection device of claim 3 , wherein the guard ring contacts with the heavily doped region.

5 . The single photon detection device of claim 3 , wherein the guard ring extends to a side surface of the second well.

6 . The single photon detection device of claim 3 , wherein a bottom surface of the guard ring is located at a depth between a bottom surface and an upper surface of the second well.

7 . The single photon detection device of claim 3 , wherein a bottom surface of the guard ring is located at the same depth as a bottom surface of the second well.

8 . The single photon detection device of claim 3 , wherein a bottom surface of the second well is located at a depth between an upper surface and a bottom surface of the guard ring.

9 . The single photon detection device of claim 3 , wherein the first well extends to a region between the guard ring and the contact.

10 . The single photon detection device of claim 3 , further comprising an isolation region provided on the opposite side of the guard ring with the contact interposed therebetween.

11 . The single photon detection device of claim 1 , wherein the heavily doped region protrudes from a side of the second well.

12 . The single photon detection device of claim 1 , wherein a side of the heavily doped region and a side of the second well forms a coplanar.

13 . A electronic device comprising:

a single photon detection device including a first well, a second well provided on the first well, a heavily doped region provided on the second well, and a contact facing the heavily doped region,

wherein the first well, the second well, and the contact have a first conductive type,

wherein the heavily doped region has a second conductive type that is different from the first conductive type,

wherein a region between the heavily doped region and the contact consist of semiconductor materials.

14 . A LiDAR device comprising:

an electronic device including a single photon detection element,

wherein the single photon detection element includes a first well, a second well provided on the first well, a heavily doped region provided on the second well, and a contact facing the heavily doped region,

wherein the first well, the second well, and the contact have a first conductive type,

wherein the heavily doped region has a second conductive type that is different from the first conductive type,

wherein the region between the heavily doped region and the contact consist of semiconductor materials.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 14, 2024
From: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
To: TRUPIXEL INC.
Reel/Frame 067736/0455 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 27, 2023
From: LEE, MYUNG-JAE
To: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
Reel/Frame 063468/0030 →