Image sensor and manufacturing method thereof

1 . A manufacturing method for an image sensor, comprising:

providing a substrate;

forming a lens layer above the substrate;

forming a patterned hard mask layer on the lens layer;

etching the lens layer to transfer a pattern of the patterned hard mask layer to the lens layer such that a plurality of lenses are defined, wherein the lenses are micro-lenses or meta-surface lenses;

forming a cladding layer to cover the plurality of lenses and the substrate;

etching portions of the cladding layer to form a first inclined sidewall and a second inclined sidewall, wherein the first inclined sidewall is above the second inclined sidewall, wherein a projection of the first inclined sidewall on the substrate is spaced apart from a projection of the second inclined sidewall on the substrate; and

conformally forming a bandpass filter layer having multiple films on the cladding layer and covering the substrate.

2 . The manufacturing method for the image sensor of claim 1 , wherein before forming the lens layer above the substrate, further comprising:

forming a photoresist layer with a third inclined sidewall and having a trench on the substrate;

forming the lens layer with a fourth inclined sidewall in the trench; and

removing the photoresist layer, wherein an angle between the third inclined sidewall and a top surface of the substrate is greater than 90 degrees, and an angle between the fourth inclined sidewall and the top surface of the substrate is less than 90 degrees.

3 . The manufacturing method for the image sensor of claim 2 , wherein after forming the lens layer above the substrate, further comprising:

forming a refill layer on the substrate and surrounding the lens layer, wherein a top surface of the lens layer is substantially coplanar with a top surface of the refill layer;

forming the patterned hard mask layer on the refill layer; and

etching the refill layer to transfer the pattern of the patterned hard mask layer to the refill layer such that a remaining portion of the refill layer and an underlying layer are defined, wherein the underlying layer is disposed between the plurality of lenses and the substrate, and the underlying layer connects to the remaining portion.

4 . The manufacturing method for the image sensor of claim 3 , wherein after the remaining portion of the refill layer and the underlying layer are defined, further comprising:

forming a protection layer to cover the plurality of lenses and expose the remaining portion of the refill layer;

removing the remaining portion of the refill layer;

removing the protection layer; and

forming an anti-reflective film on top surfaces of the plurality of lenses.

5 . The manufacturing method for the image sensor of claim 3 , wherein after the remaining portion of the refill layer and the underlying layer are defined, further comprising:

forming a protection layer to cover the plurality of lenses and a first portion of the remaining portion of the refill layer, wherein a second portion of the remaining portion of the refill layer is exposed;

removing the second portion of the remaining portion of the refill layer;

removing the protection layer; and

forming an anti-reflective film on top surfaces of the plurality of lenses and a top surface of the first portion of the remaining portion of the refill layer.

6 . The manufacturing method for the image sensor of claim 1 , wherein before forming the lens layer above the substrate, forming an underlying layer on the substrate.

7 . The manufacturing method for the image sensor of claim 1 , wherein forming the cladding layer to cover the plurality of lenses and the substrate, and etching the portions of the cladding layer to form the first inclined sidewall and the second inclined sidewall, further comprising:

forming a first cladding layer to cover the plurality of lenses and the substrate;

etching a portion of the first cladding layer to expose a portion of the substrate and form a third inclined sidewall;

forming a second cladding layer on the first cladding layer and the portion of the substrate to form the first inclined sidewall on a top of the cladding layer; and

etching a portion of the second cladding layer to form the second inclined sidewall on a bottom of the cladding layer.

8 . The manufacturing method for the image sensor of claim 7 , wherein an angle between the second inclined sidewall and a top surface of the substrate is in a range from 20 degrees to 60 degrees,

wherein an angle between the third inclined sidewall and the top surface of the substrate is in a range from 20 degrees to 60 degrees.

9 . The manufacturing method for the image sensor of claim 1 , wherein etching the portions of the cladding layer to form the first inclined sidewall and the second inclined sidewall, further comprising:

etching a first portion of the cladding layer to form the first inclined sidewall on a top of the cladding layer, wherein an angle between the first inclined sidewall and a top surface of the substrate is in a range from 20 degrees to 60 degrees; and

etching a second portion of the cladding layer to form the second inclined sidewall on a bottom of the cladding layer, wherein an angle between the second inclined sidewall and the top surface of the substrate is in a range from 20 degrees to 60 degrees.

10 . An image sensor, comprising:

a substrate;

a plurality of lenses disposed on the substrate, wherein the plurality of lenses are micro-lenses or meta-surface lenses;

a cladding layer disposed on the plurality of lenses and the substrate,

wherein the cladding layer has a first inclined sidewall and a second inclined sidewall, and the first inclined sidewall is above the second inclined sidewall,

wherein a projection of the first inclined sidewall on the substrate is spaced apart from a projection of the second inclined sidewall on the substrate; and

a bandpass filter layer having multiple films conformally disposed on the cladding layer and covering the substrate.

11 . The image sensor of claim 10 , further comprising an anti-reflective film disposed on top surfaces of the lens.

12 . The image sensor of claim 10 , further comprising a refill layer disposed on the substrate and surrounding the plurality of lenses, wherein a thickness of the refill layer is in a range from 0.1 μm to 100 μm.

13 . The image sensor of claim 12 , further comprising an anti-reflective film disposed on top surfaces of the lens and a top surface of the refill layer.

14 . The image sensor of claim 10 , further comprising an underlying layer disposed between the plurality of lenses and the substrate, wherein a thickness of the underlying layer is in a range from 0.01 μm to 100 μm.

15 . The image sensor of claim 14 , wherein a material of the lenses is a-Si, SiH, GeH, Ge, GeO, or GeSiH.

16 . The image sensor of claim 14 , wherein a material of the underlying layer is different from a material of the lenses.

17 . The image sensor of claim 14 , wherein a material of the underlying layer is the same as a material of the lenses, and a thickness of the underlying layer is in a range from 0.01 μm to 100 μm.

18 . The image sensor of claim 14 , wherein a distance between an outermost of the second inclined sidewall to an outermost of the underlying layer is in a range from 40 μm to 100 μm.

19 . The image sensor of claim 14 , wherein, when the plurality of lenses are micro-lenses, a projection of the micro-lenses on the substrate is in a projection of the underlying layer on the substrate.

20 . The image sensor of claim 10 , wherein an angle between the first inclined sidewall and a top surface of the substrate is in a range from 20 degrees to 60 degrees,

wherein an angle between the second inclined sidewall and the top surface of the substrate is in a range from 20 degrees to 60 degrees.