Process and system for characterizing a fixture component of a test fixture
Disclosed is a process for characterizing a fixture component of a test fixture. The fixture component comprises a test instrument interface and a device under test, DUT, interface. The process comprises connecting a test instrument to the test instrument interface; sequentially establishing a plurality of characterization setups for the fixture component; and characterizing at least one scattering, S, parameter of the respectively established characterization setup. The establishing respectively comprises one of: providing an open circuit at the DUT interface, providing a short circuit at the DUT interface, providing a further fixture component of the test fixture at the DUT interface via mated connectors, and providing a DUT at the DUT interface. This avoids inaccuracies, high cost and availability issues in connection with lead-out structures of test fixtures.
1 . A process for characterizing a fixture component of a test fixture,
the fixture component comprising
a test instrument interface comprising coaxial connector, and
a device under test (DUT) interface comprising one of a printed circuit board (PCB) trace and a non-coaxial connector;
wherein the fixture component is configured to mediate between signals of the DUT interface and signals of the test instrument interface,
the process comprising
connecting a test instrument to the test instrument interface;
sequentially establishing a plurality of characterization setups for the fixture component and de-embedding a characterized error model of the fixture component in order to move a reference plane from the test instrument interface to the DUT interface, the plurality of characterization setups comprising two or more, the establishing respectively containing:
providing an open circuit at the DUT interface, and
providing a further fixture component of the test fixture at the DUT interface via mated connectors, wherein a corresponding sequence of characterization setups requires no short circuit, and wherein the corresponding sequence of characterization setups requires a start-up for reception (RX); and
characterizing at least one scattering(S) parameter of the respectively established characterization setup.
2 . The process of claim 1 ,
the plurality of characterization setups comprising three or more.
3 . The process of claim 1 ,
sequentially establishing the plurality of characterization setups for the fixture component further containing
providing a DUT at the DUT interface.
4 . The process of claim 1 ,
the test instrument comprising one of:
a vector network analyzer (VNA), and
a time-domain reflectometer (TDR).
5 . The process of claim 1 ,
the DUT comprising one of:
a printed circuit board (PCB), and
an active electronic device.
6 . The process of claim 1 ,
the fixture component and the further fixture component being identical.
7 . A system for characterizing a fixture component of a test fixture,
the system comprising:
the fixture component comprising a test instrument interface comprising a coaxial connector and a device under test (DUT) interface comprising one of a printed circuit board (PCB) trace and a non-coaxial connector, wherein the fixture component is configured to mediate between signals of the DUT interface and signals of the test instrument interface; and
a test instrument connected to the test instrument interface for characterizing at least one scattering(S) parameter of a plurality of sequentially established characterization setups for the fixture component and de-embedding a characterized error model of the fixture component in order to move a reference plane from the test instrument interface to the DUT interface, the plurality of characterization setups comprising two or more, the establishing respectively containing:
providing an open circuit at the DUT interface, and
providing a further fixture component of the test fixture at the DUT interface via mated connectors, wherein a corresponding sequence of characterization setups requires no short circuit, and wherein the corresponding sequence of characterization setups requires a start-up for reception (RX).
8 . The system of claim 7 ,
the system further comprising a power supply for supplying electrical power to the DUT.