Differentiation of clastic sedimentary systems using March-Dollase preferred orientation actor
Methods and tools to identify a type of sedimentary system from an XRD pattern. The method includes applying x-rays to a sample to obtain diffraction pattern data, and calculating a March-Dollase preferred orientation factor of a crystallographic plane of the sample based on the diffraction pattern data. The method further includes classifying the calculated March-Dollase preferred orientation factor to identify a type of clastic sedimentary system corresponding to the sample. A rapid sediment analyzer tool includes an X-ray diffraction device and an application having a March-Dollase preferred orientation factor calculator and a classifier. The display device is configured to display the identified type of clastic sedimentary system.
1 . A method of identifying a type of sedimentary system from a sample comprising the steps of:
applying x-rays to a sample to obtain diffraction pattern data for the sample;
calculating, with at least one processor, a March-Dollase orientation factor of a crystallographic plane of the sample based on the diffraction pattern data; and
classifying, with the at least one processor, the calculated March-Dollase orientation factor to identify a type of clastic sedimentary system corresponding to the sample,
wherein the type of clastic sedimentary system includes one or more of fluvial, lake, interdune, or dune types of sedimentary systems and the calculating comprises calculating a March-Dollase preferred orientation factor P j according to a March model based on the equation:
P
j
=
[
r
-
1
sin
2
θ
j
+
r
2
cos
2
θ
j
]
-
3
/
2
where θ j is an angle between a direction of crystallographic preferred orientation and a reciprocal-lattice vector for a Bragg peak that is corrected and r is a March parameter.
2 . The method of claim 1 , further comprising determining a diffraction angle corresponding to a maximum in a detected intensity level in the diffraction pattern data.
3 . The method of claim 2 , wherein the sample includes quartz having a crystallographic plane orientation <101> and a d-space of about 3.34 Angstroms, and the calculating comprises calculating the March-Dollase orientation factor at the quartz plane orientation <101>.
4 . The method of claim 1 , wherein the type of clastic sedimentary system includes fluvial, lake, interdune, and dune types of sedimentary systems.
5 . The method of claim 1 , further comprising outputting data about the identified type of clastic sedimentary system.
6 . The method of claim 5 , wherein the outputting data includes storing output data about the identified type of clastic sedimentary system in non-transitory computer-readable memory or displaying output data about the identified type of clastic sedimentary system on a display view of a display device.
7 . The method of claim 6 , wherein the type of clastic sedimentary system includes fluvial, lake, interdune, and dune types of sedimentary systems in a wellfield.
8 . A sediment analyzer tool comprising:
an X-ray diffraction device configured to apply x-rays to a sample to obtain diffraction pattern data for the sample;
a computing device having a March-Dollase orientation factor calculator and a classifier implemented on at least one processor;
wherein the March-Dollase orientation factor calculator is configured to calculate a March-Dollase orientation factor of a crystallographic plane of the sample based on the diffraction pattern data, and
wherein the classifier is configured to classify the calculated March-Dollase orientation factor to identify a type of clastic sedimentary system corresponding to the sample and
wherein the March-Dollase orientation factor calculator is configured to calculate a March-Dollase preferred orientation factor P j according to a March model based on the equation:
P
j
=
[
r
-
1
sin
2
θ
j
+
r
2
cos
2
θ
j
]
-
3
/
2
where θ j is an angle between a direction of crystallographic preferred orientation and a reciprocal-lattice vector for a Bragg peak that is corrected and r is a March parameter.
9 . The sediment analyzer tool of claim 8 , wherein the X-ray diffraction device is further configured to determine a diffraction angle corresponding to a maximum in a detected intensity level in the diffraction pattern data.
10 . The sediment analyzer tool of claim 9 , wherein the sample includes quartz having a crystallographic plane orientation <101> and a d-space of about 3.34 Angstroms, and the March-Dollase orientation factor calculator is configured to calculate the March-Dollase orientation factor at the quartz plane orientation <101>.
11 . The sediment analyzer tool of claim 8 , wherein the type of clastic sedimentary system includes fluvial, lake, interdune, and dune types of sedimentary systems in a wellfield.
12 . The sediment analyzer tool of claim 8 , wherein the classifer is further configured to output data about the identified type of clastic sedimentary system for storage in a non-transitory computer-readable memory, transmission over a data network, or display on a display device.
13 . The sediment analyzer tool of claim 12 , further comprising a display device configured to display the identified type of clastic sedimentary system from the output data.
14 . A sediment analyzer tool comprising:
an X-ray diffraction device configured to apply x-rays to a sample to obtain diffraction pattern data for the sample;
non-transitory computer-readable memory having instructions executable by at least one processor to perform the following operations:
calculating a March-Dollase orientation factor of a crystallographic plane of the sample based on diffraction pattern data obtained by the X-ray diffraction device, and
classifying the calculated March-Dollase orientation factor to identify a type of clastic sedimentary system corresponding to the sample,
wherein the type of clastic sedimentary system includes one or more of fluvial, lake, interdune, or dune types of sedimentary systems and
wherein the calculating operation comprises calculating a March-Dollase preferred orientation factor P j according to a March model based on the equation:
P
j
=
[
r
-
1
sin
2
θ
j
+
r
2
cos
2
θ
j
]
-
3
/
2
where θ j is an angle between a direction of crystallographic preferred orientation and a reciprocal-lattice vector for a Bragg peak that is corrected and r is a March parameter.