IP Library › Patent Application 18370244
Patent Application
App. No. 18/370,244

POLARIZATION IMAGE ACQUISITION APPARATUS AND THERMAL ANALYZER

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Quick Facts
Patent No.
US None
App. No.
18/370,244
Abstract

The apparatus is attached to a thermal analyzer including a pair of sample containers and a heating furnace having a window or an opening through which at least the measurement sample can be observed, and includes an attachment unit, a light source, a polarizer constituting a polarizing filter that polarizes irradiation light emitted from the light source, a camera, a half mirror, a rotation mechanism and an analyzer constituting a polarizing filter configured to polarize reflected light through the half mirror and to introduce the resulting polarized light of the reflected light into the camera, in which the polarized light irradiates the sample after passing through the window or opening and then reflects from the sample wherein the analyzer, the half mirror, and the light source are fixed to a fixing member and the rotation mechanism rotates the fixing member in a polarization direction of the analyzer.

Claims (16)

1 . A polarization image acquisition apparatus attached to a thermal analyzer, thermal analyzer comprising a pair of sample containers containing a measurement sample and a reference sample, respectively, and a heating furnace surrounding the sample containers from outside, the heating furnace having a window or an opening through which at least the measurement sample is observable, the polarization image acquisition apparatus comprising:

an attachment unit attached to the thermal analyzer;

a light source;

a polarizer constituting a polarizing filter that polarizes irradiation light coming from a light source;

a camera;

a half mirror; and

an analyzer constituting a polarizing filter configured such that the measurement sample or the reference sample is irradiated with polarized light transmitted through the polarizer through the window or opening via the half mirror, and light reflected from the measurement sample or the reference sample is polarized through the half mirror and is introduced into the camera,

wherein the polarizer, the analyzer, the half mirror, and the light source are fixed to a fixing member, thereby constituting an optical unit, and

the apparatus comprises a rotation mechanism causing the fixing member to rotate in a polarization direction of the analyzer.

2 . The polarization image acquisition apparatus according to claim 1 , wherein the half mirror comprises a cube-type beam splitter.

3 . The polarization image acquisition apparatus according to claim 1 , wherein the fixing member comprises an adjustment member that adjusts at least an optical axis of the half mirror.

4 . The polarization image acquisition apparatus according to claim 2 , wherein the fixing member comprises an adjustment member that adjusts at least an optical axis of the half mirror

5 . The polarization image acquisition apparatus according to claim 1 , wherein the polarizer and the analyzer are rotatable relative to each other.

6 . The polarization image acquisition apparatus according to claim 2 , wherein the polarizer and the analyzer are rotatable relative to each other.

7 . A thermal analyzer comprising the polarization image acquisition apparatus of claim 1 .

8 . A thermal analyzer comprising the polarization image acquisition apparatus of claim 2 .

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 15, 2025
From: FUJIWARA, HIROHITO; YAMAZAKI, RYOKUHEI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 071708/0354 →
CHANGE OF NAME Recorded Jul 14, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 071701/0397 →