IP Library › Granted Patent US 12,211,670
Granted Patent B2
US 12,211,670 · App. 18/377,918 · Granted Jan 28, 2025

Performing radio frequency matching control using a model-based digital twin

Inventors: Tao Zhang (San Ramon, CA); Upendra Ummethala (Cupertino, CA)
Assignee: Applied Materials, Inc.
H01J37/32183H01J37/321H01J37/32926H01J37/32935H03H7/40H05H1/46H05H1/4652
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Quick Facts
Patent No.
US 12,211,670
App. No.
18/377,918
Granted
Jan 28, 2025
Kind
B2
Abstract

A method includes receiving, from one or more sensors, sensor data associated with manufacturing equipment and updating one or more values of a digital replica associated with the manufacturing equipment based on the sensor data. The digital replica comprises a model reflecting a virtual representation of physical elements and dynamics of how the manufacturing equipment operates. One or more outputs indicative of predictive data is obtained from the digital replica and, based on the predictive data, performance of one or more corrective actions associated with the manufacturing equipment is caused.

Claims (40)

1. A method comprising:

receiving, from one or more sensors, sensor data associated with manufacturing equipment;

updating one or more values of a digital replica associated with the manufacturing equipment based on the sensor data, wherein the digital replica comprises a trained machine-learning_model reflecting a virtual representation of physical elements and dynamics of how the manufacturing equipment operates;

obtaining, from the digital replica, one or more outputs indicative of predictive data; and

causing, based on the predictive data, performance of one or more corrective actions associated with the manufacturing equipment.

2. The method of claim 1 , further comprising:

responsive to determining that digital replica fails to satisfy an accuracy threshold criterion based on the sensor data, performing an optimization of the digital replica.

3. The method of claim 1 , wherein updating the one or more values of the digital replica comprises:

updating a processing chamber model associated with the digital replica using sensor data from an output sensor, wherein the output sensor is associated with a matching network of the manufacturing equipment.

4. The method of claim 1 , wherein updating the one or more values of the digital replica comprises:

updating a matching network model associated with the digital replica using sensor data from an input sensor and an output sensor, wherein the input sensor and the output sensor are associated with a matching network of the manufacturing equipment.

5. The method of claim 1 , wherein the predictive data comprises one or more tune settings for one or more variable capacitors associated with a matching network of the manufacturing equipment.

6. The method of claim 1 , wherein the corrective action comprises adjusting one or more variable capacitors associated with a matching network of the manufacturing equipment based on the predictive data.

7. A system comprising:

a memory; and

a processing device, coupled to the memory, to:

receive, from one or more sensors, sensor data associated with manufacturing equipment;

update one or more values of a digital replica associated with the manufacturing equipment based on the sensor data, wherein the digital replica comprises a trained machine-learning_model reflecting a virtual representation of physical elements and dynamics of how the manufacturing equipment operates;

obtain, from the digital replica, one or more outputs indicative of predictive data; and

cause, based on the predictive data, performance of one or more corrective actions associated with the manufacturing equipment.

8. The system of claim 7 , wherein the processing device is further to:

responsive to determining that digital replica fails to satisfy an accuracy threshold criterion based on the sensor data, perform an optimization of the digital replica.

9. The system of claim 7 , wherein to update the one or more values of the digital replica, the processing device is further to:

update a processing chamber model associated with the digital replica using sensor data from an output sensor, wherein the output sensor is associated with a matching network of the manufacturing equipment.

10. The system of claim 7 , wherein to update the one or more values of the digital replica, the processing device is further to:

update a matching network model associated with the digital replica using trace data from an input impedance sensor and an output impedance sensor, wherein the input impedance sensor and the output impedance sensor are associated with a matching network of the manufacturing equipment.

11. The system of claim 7 , wherein the predictive data comprises one or more tune settings for one or more variable capacitors associated with a matching network of the manufacturing equipment.

12. The system of claim 7 , wherein the corrective action comprises adjusting one or more variable capacitors associated with a matching network of the manufacturing equipment based on the predictive data.

13. A non-transitory machine-readable storage medium storing instructions which, when executed cause a processing device to perform operations comprising:

receiving, from one or more sensors, sensor data associated with manufacturing equipment;

updating one or more values of a digital replica associated with the manufacturing equipment based on the sensor data, wherein the digital replica comprises a trained machine-learning model reflecting a virtual representation of physical elements and dynamics of how the manufacturing equipment operates;

obtaining, from the digital replica, one or more outputs indicative of predictive data; and

causing, based on the predictive data, performance of one or more corrective actions associated with the manufacturing equipment.

14. The non-transitory machine-readable storage medium of claim 13 , wherein the operations further comprise:

responsive to determining that digital replica fails to satisfy an accuracy threshold criterion based on the sensor data, performing an optimization of the digital replica.

15. The non-transitory machine-readable storage medium of claim 13 , wherein updating the one or more values of the digital replica comprises:

updating a processing chamber model associated with the digital replica using sensor data from an output sensor, wherein the output sensor is associated with a matching network of the manufacturing equipment.

16. The non-transitory machine-readable storage medium of claim 13 , wherein updating the one or more values of the digital replica comprises:

updating a matching network model associated with the digital replica using sensor data from an input sensor and an output sensor, wherein the input sensor and the output sensor are associated with a matching network of the manufacturing equipment.

17. The non-transitory machine-readable storage medium of claim 13 , wherein the predictive data comprises one or more tune settings for one or more variable capacitors associated with a matching network of the manufacturing equipment, and wherein the corrective action comprises adjusting one or more variable capacitors associated with a matching network of the manufacturing equipment based on the predictive data.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 10, 2024
From: ZHANG, TAO; UMMETHALA, UPENDRA
To: APPLIED MATERIALS, INC.
Reel/Frame 067376/0068 →
Continuity (2)
Continuation 17133787 · Dec 24, 2020
Related Publication 20240162009A1 · May 16, 2024
References Cited (52)
US 5654679A · Mavretic · 1997 [cited by examiner]
US 5770982A · Moore · 1998 [cited by examiner]
US 5815047A · Sorensen · 1998 [cited by examiner]
US 7042311B1 · Hilliker · 2006 [cited by examiner]
US 7906032B2 · Yamashita · 2011 [cited by examiner]
US 9385891B2 · Boggan · 2016 [cited by examiner]
US 9770211B2 · Hayter · 2017 [cited by examiner]
US 9804148B2 · Hayter · 2017 [cited by examiner]
US 9833181B2 · Hayter · 2017 [cited by examiner]
US 10304663B1 · Kapoor · 2019 [cited by examiner]
US 10304669B1 · Coumou · 2019 [cited by examiner]
US 10741362B2 · Miki · 2020 [cited by examiner]
US 11784028B2 · Zhang · 2023 [cited by examiner]
US 20030184319A1 · Nishimori et al. · 2003 [cited by applicant]
US 20050011451A1 · Blackburn · 2005 [cited by examiner]
US 20050057165A1 · Goodman · 2005 [cited by examiner]
US 20050106873A1 · Hoffman · 2005 [cited by examiner]
US 20050128160A1 · Howald · 2005 [cited by examiner]
US 20050168152A1 · Blackburn · 2005 [cited by examiner]
US 20060165146A1 · Backes · 2006 [cited by examiner]
US 20070238199A1 · Yamashita · 2007 [cited by examiner]
US 20080061793A1 · Anwar · 2008 [cited by examiner]
US 20090048792A1 · Turner · 2009 [cited by examiner]
US 20090055149A1 · Hayter · 2009 [cited by examiner]
US 20100243606A1 · Koshimizu · 2010 [cited by examiner]
US 20120168081A1 · Son · 2012 [cited by examiner]
US 20140334209A1 · Li · 2014 [cited by examiner]
US 20160013953A1 · Boggan · 2016 [cited by examiner]
US 20160085584A1 · Pedersen · 2016 [cited by examiner]
US 20170330876A1 · Leedy · 2017 [cited by examiner]
US 20180293103A1 · Kalmus · 2018 [cited by examiner]
US 20190103293A1 · Kim · 2019 [cited by examiner]
US 20200075291A1 · Miki · 2020 [cited by applicant]
US 20200080202A1 · Akashi · 2020 [cited by examiner]
US 20200226742A1 · Sawlani · 2020 [cited by examiner]
US 20210142986A1 · Bhutta · 2021 [cited by examiner]
US 20210305018A1 · Bhutta · 2021 [cited by examiner]
US 20220066411A1 · Ummethala · 2022 [cited by examiner]
US 20220208520A1 · Zhang · 2022 [cited by examiner]
US 20220254610A1 · Bhutta · 2022 [cited by examiner]
US 20230236586A1 · Cheon · 2023 [cited by examiner]
US 20230237412A1 · Cheon · 2023 [cited by examiner]
US 20230259112A1 · Cheon · 2023 [cited by examiner]
US 20230390886A1 · Ummethala · 2023 [cited by examiner]
JP 2019133785A · 2019 [cited by applicant]
KR 20170103660A · 2017 [cited by applicant]
KR 20190038070A · 2019 [cited by applicant]
WO 2018101722A2 · 2018 [cited by applicant]
WO WO2022140431A1 · 2022 [cited by examiner]
International Preliminary Report on Patentability for International Application No. PCT/US2021/064673, mailed Jul. 6, 2023, 6 Pages. [cited by applicant]
International Search Report And Written Opinion for International Application No. PCT/US2021/064673, mailed Apr. 15, 2022, 9 Pages. [cited by applicant]
Extended European Search Report for European Application No. 21912066.4, mailed Dec. 6, 2024, 9 Pages. [cited by applicant]