IP Library Granted Patent US 12,253,426
Granted Patent B2
US 12,253,426 · App. 18/403,551 · Granted Mar 18, 2025

Parasitic insensitive sampling in sensors

Inventors: Vishnu Srinivasan (Austin, TX); Ion Opris (San Jose, CA); Keith Bargroff (San Diego, CA)
Assignee: Murata Manufacturing Co., Ltd
G01L9/12B81B7/0058B81B7/007G01L9/02H03M3/414H03M3/458B81B2201/0264H03M3/438
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Quick Facts
Patent No.
US 12,253,426
App. No.
18/403,551
Granted
Mar 18, 2025
Kind
B2
Abstract

Methods and devices to mitigate time varying impairments in sensors are described. The application of such methods and devices to pressure sensors facing time varying parasitic capacitances due to water droplets is detailed. Benefits of auto-zeroing technique as adopted in disclosed devices is also described.

Claims (45)

1. A sensor system comprising:

a sensor comprising a sense capacitor with a variable sense capacitance;

a readout integrated circuit comprising an analog to digital converter (ADC) having an ADC input connected to the sense capacitor, and

an offset capacitor operatively charged and discharged out of phase with respect to the sense capacitor;

wherein:

a variable parasitic capacitance is able to be coupled to the ADC input;

when an input pressure is sensed by the sensor, the variable sense capacitance is modulated, thereby generating one or more ADC output signals in correspondence of the input pressure, and

undesired charges due to the variable parasitic capacitance:

are sampled before a charging phase in which a reference voltage is sampled to store charges across the sense capacitor; and

are compensated for during an integration phase in which the ADC output signals are generated by an integration of the charges stored across the sense capacitor.

2. The sensor system of claim 1 , wherein the sense capacitor is serially connected with the ADC input.

3. The sensor system of claim 1 , wherein the ADC comprises a sigma-delta modulator.

4. The sensor system of claim 3 , wherein the sigma-delta modulator is a multi-stage noise shaping (MASH) modulator comprising one or more integrators interconnected with one or more comparators.

5. The sensor system of claim 4 , further comprising a decimation filter connected with the sigma-delta modulator.

6. The sensor system of claim 1 , wherein the sensor further comprises a feedback capacitor, and wherein the offset capacitor is configured to center variations of the sense capacitor to a center of a full-scale of the ADC, the full-scale of the ADC being set by the feedback capacitor.

7. The sensor system of claim 6 , further comprising an integrator including an operational amplifier and integration capacitor, an operational amplifier input being the ADC input.

8. The sensor system of claim 1 , configured to receive a plurality of reference voltages and further comprising a switching arrangement being controlled by a plurality of clock signals to connect/disconnect the sense capacitor, and the offset capacitor to/from corresponding reference voltages of the plurality of reference voltages.

9. The sensor system of claim 8 , wherein the plurality of clock signals comprises clock signals that are generated based on the one or more ADC output signals.

10. The sensor system of claim 9 , wherein:

in the charging phase:

the switching arrangement is configured such that the plurality of reference voltages are sampled to store charges across the sense capacitor, and the offset capacitor; and

in the integration phase:

a combination of the charges stored on the sense capacitor and the offset capacitor during the charging phase is transferred to the integrating capacitor, thereby generating an integrator output signal in correspondence of the input pressure.

11. The sensor system of claim 10 , wherein the plurality of clock signals have clock periods substantially smaller than a time during which the variable parasitic capacitance varies by one pF.

12. The sensor system of claim 10 , wherein the plurality of clock signals have clocks rates in the range of hundreds of KHz and the variable parasitic capacitance varies within a range of tens of pf and having a rate of change within a range of tens of pF/msec.

13. The sensor system of claim 8 , wherein the switching arrangement comprises metal-oxide semiconductor field-effect (MOSFET) transistors.

14. The sensor system of claim 1 , wherein the sensor is a MEMS sensor.

15. The sensor system of claim 1 , further comprising a gel material configured to transfer sensed pressure to the readout integrated circuit.

16. The sensor system of claim 15 , wherein the sensor is connected to the readout integrated circuit via bondwires that are exposed to the gel material.

17. A method of measuring pressure comprising:

providing a sense capacitor with a variable sense capacitance;

providing an offset capacitor;

providing a readout circuit having an integrating capacitor, wherein a variable parasitic capacitance is able to be generated across a readout circuit input;

in a charging phase,

storing first charges across the sense capacitor;

storing second charges across the offset capacitor;

before the charging phase, sampling the readout circuit input to capture undesired charges due to the variable parasitic capacitance and compensate for the undesired charges during the integration phase;

in an integration phase, transferring the first and the second charges to the integrating capacitor, thereby generating a readout circuit output signal in correspondence of an input pressure;

wherein the storing the first and the second charges and the transferring the first and the second charges are performed such that a charging and discharging of the offset capacitor is out of phase with respect to the sense capacitor.

18. The method of claim 17 , further comprising:

providing a feedback capacitor configured to set the full-scale of the readout circuit;

in the charging phase, sampling the first and the second reference voltage during set time intervals to store third charges across the feedback capacitor; and

in the integration phase, transferring the third charges to the integration capacitor.

19. The method of claim 18 , wherein the set time intervals are defined based on the readout circuit output signal.

20. The method of claim 19 , wherein the readout circuit further comprises one or more integrators interconnected with one or more comparators.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 10, 2025
From: SRINIVASAN, VISHNU; OPRIS, ION; BARGROFF, KEITH
To: PSEMI CORPORATION
Reel/Frame 072389/0437 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 14, 2024
From: PSEMI CORPORATION
To: MURATA MANUFACTURING CO., LTD.
Reel/Frame 066597/0427 →
Continuity (4)
Continuation 17467251 · Sep 5, 2021
Continuation PCTUS2020019762 · Feb 25, 2020
Continuation 16294824 · Mar 6, 2019
Related Publication 20240247991A1 · Jul 25, 2024
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