Multi-mode object detection
There is provided object scanning apparatus and methods of scanning objects. The object scanning apparatus may include a THz source emitting an optical beam; an electromagnetic energy source for generating a radiation signal at a wavelength other than terahertz, such as RF or MMW radiation; an optical system for directing the optical beam; a zone for inspecting objects wherein the optical beam and radiation signal interact with the object; a motion device for changing the spatial or temporal interaction of the object and optical beam and the radiation signal; at least one transducer, the at least one transducer including an imaging transducer for converting the optical beam energy and radiation signal after interaction with the object to an electronic image; and a processor for performing processing of the image for use in characterization of the object or its interior contents or composition.
1 . An object scanning apparatus, comprising:
a terahertz source for generating a propagated optical beam;
a THz inspection zone defined by an in focus region of the propagated optical beam;
an electromagnetic energy source for generating a radiation signal at a frequency other than that of the terahertz source, wherein the radiation signal passes through the THz inspection zone such that objects interact with the propagated optical beam and radiation signal;
at least one imaging sensor configured to collect the propagated optical beam after the interacting; and
an image processor for taking data from the at least one imaging sensor, and processing the data to determine a characteristic of an object.
2 . The object scanning apparatus of claim 1 , wherein the electromagnetic energy source for generating the radiation signal is an RF source, a millimeter wave source, a second terahertz source or a combination thereof.
3 . The object scanning apparatus of claim 1 , wherein the electromagnetic energy source for generating the radiation signal has an in focus region that is smaller in volume than the THz inspection zone.
4 . The object scanning apparatus of claim 3 , wherein the electromagnetic energy source for generating the radiation signal has an in focus region that overlaps with the THz inspection zone.
5 . The object scanning apparatus of claim 1 , wherein the propagated optical beam has a direction, and wherein the radiation signal is emitted or collected orthogonal to the direction of the propagated optical beam.
6 . The object scanning apparatus of claim 5 , wherein the electromagnetic energy source and a second imaging sensor operate in reflection, transmission or both transmission and reflection modes.
7 . The object scanning apparatus of claim 1 , wherein the radiation signal is emitted from a handheld device.
8 . The object scanning apparatus of claim 1 , wherein the radiation signal is emitted by multiple emitters in a multiple input multiple output configuration.
9 . The object scanning apparatus of claim 1 , wherein the at least one imaging sensor comprises at least one imaging sensor configured to collect the propagated optical beam and at least one radiation signal imaging sensor to collect the radiation signal.
10 . An object scanning apparatus, comprising:
a terahertz source for generating a propagated optical beam;
a THz inspection zone defined by an in focus region of the propagated optical beam;
a radiation energy source for generating a radiation signal at a frequency other than that of the terahertz source;
a radiation inspection zone defined by an in focus region of the radiation energy source;
a THz sensor for collecting the propagated optical beam emitted from the THz inspection zone;
a radiation sensor for collecting the radiation signal emitted from the radiation inspection zone; and
an image processor for taking data from the THz sensor and radiation sensor of an object within the THz inspection zone and radiation inspection zone, and combining the data from the THz inspection zone and the radiation inspection zone to determine a characteristic of the object.
11 . The object scanning apparatus of claim 10 , wherein the radiation signal collected by the radiation sensor passes through the propagated optical beam.
12 . The object scanning apparatus of claim 11 , wherein the THz inspection zone and radiation inspection zone overlap.
13 . The object scanning apparatus of claim 11 , wherein the propagated optical beam and radiation signal are substantially aligned.
14 . The object scanning apparatus of claim 11 , wherein a cross section of the THz inspection zone and a cross section of the radiation inspection zone are substantively orthogonal.
15 . An object scanning apparatus, comprising:
a terahertz source for generating a propagated optical beam;
a THz inspection zone defined by an in focus region of the propagated optical beam;
a THz sensor for collecting the propagated optical beam emitted from the THz inspection zone;
a radiation energy source for generating a radiation signal at
a frequency other than that of the terahertz source;
a radiation inspection zone defined by an in focus region of the radiation energy source;
a mirror having a reflective surface for reflecting the radiation signal emitted from the radiation inspection zone;
a radiation sensor for collecting the radiation signal reflected from the reflective surface; and
an image processor for taking data from the THz sensor and radiation sensor of an object within the THz inspection zone and radiation inspection zone, and combining the data from both inspection zones to determine a characteristic of the object.
16 . The object scanning apparatus of claim 15 , wherein the radiation signal reflected by the mirror and collected by the radiation sensor passes through the radiation inspection zone.
17 . The object scanning apparatus of claim 15 , wherein the image processor calculates from the data collected by the radiation sensor a three-dimensional point cloud and an image plane representative of a relative spatial radiation signal incident on the mirror.
18 . The object scanning apparatus of claim 15 , wherein the reflective surface of the mirror has a spatial region wherein the mirror surface varies in height orthogonal to the mirror surface.
19 . The object scanning apparatus of claim 18 , wherein variations of the mirror surface are used to calibrate or characterize the object scanning apparatus.