IP Library Granted Patent US 12,553,957
Granted Patent B2
US 12,553,957 · App. 18/405,208 · Granted Feb 17, 2026

Systems and methods for testing a capacitor in a circuit

Inventors: Karthik Naik (Singapore, SG); Nomel Centino Navarro (Singapore, SG); Balasubramanian Muthuraman (Singapore, SG)
Assignee: BorgWarner US Technologies LLC
G01R31/64G01R19/16576H02H7/16
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,553,957
App. No.
18/405,208
Granted
Feb 17, 2026
Kind
B2
Abstract

Disclosed techniques relate to a system for testing a capacitor. In an example, a testing circuit includes a testing voltage source configured to output a testing voltage to the capacitor; a discharge network configured to dissipate power from the capacitor; a voltage detection circuit configured to measure a voltage of the capacitor; a first switch configured to connect the capacitor to a main circuit; a second switch configured to connect the capacitor to the discharge network; a third switch configured to connect the capacitor to the testing voltage source; and a fourth switch configured to connect the capacitor to the voltage detection circuit; and one or more controllers. The controllers are configured to control an operation of the switches to test the capacitor using the testing voltage source, the discharge network, and the voltage detection circuit, and to determine, from the test, whether the capacitor is connected.

Claims (82)

1 . A system comprising:

an alternating current (AC) to direct current (DC) converter (AC-DC converter) to receive power;

a DC to DC converter (DC-DC converter) connected to the AC-DC converter to charge a battery based on the received power;

a noise filter including a capacitor;

a testing circuit configured to test the capacitor, the testing circuit including:

a testing voltage source configured to output a testing voltage to the capacitor;

a discharge network configured to dissipate power from the capacitor;

a voltage detection circuit configured to measure a voltage of the capacitor, as a measured voltage;

a first switch configured to connect the capacitor to a main circuit, wherein the main circuit is configured to operate independently from the testing circuit;

a second switch configured to connect the capacitor to the discharge network;

a third switch configured to connect the capacitor to the testing voltage source; and

a fourth switch configured to connect the capacitor to the voltage detection circuit; and

one or more controllers configured to (i) control an operation of the first switch, the second switch, the third switch, and the fourth switch to test the capacitor using the testing voltage source, the discharge network, and the voltage detection circuit, and (ii) determine, from the test, whether the capacitor is connected to the noise filter.

2 . The system of claim 1 , further comprising an electric vehicle including the battery connected to the DC-DC converter.

3 . The system of claim 1 , wherein the one or more controllers are further configured to:

close the second switch, thereby connecting the capacitor to the discharge network;

close the third switch, thereby applying the testing voltage to the capacitor; and

close the fourth switch, thereby connecting the capacitor to the voltage detection circuit.

4 . The system of claim 1 , wherein the one or more controllers are further configured to:

determine that the measured voltage is below a threshold; and

responsive to determining that the measured voltage is below the threshold, determine that the capacitor is disconnected from the noise filter.

5 . The system of claim 1 , wherein the one or more controllers are further configured to:

determine that the measured voltage is above a threshold; and

responsive to determining that the measured voltage is above the threshold, determine that the capacitor is connected to the noise filter.

6 . The system of claim 1 , wherein the one or more controllers are configured to close the first switch, thereby connecting the capacitor to the noise filter.

7 . The system of claim 1 , wherein the one or more controllers are further configured to:

open the first switch, thereby disconnecting the capacitor from the noise filter; and

close the second switch, thereby connecting the capacitor to the discharge network.

8 . The system of claim 1 , wherein the one or more controllers are further configured to:

open the second switch, thereby disconnecting the capacitor from the discharge network; and

close the third switch, thereby applying the testing voltage source to the capacitor.

9 . The system of claim 1 , wherein the one or more controllers are further configured to:

open the third switch, thereby disconnecting the testing voltage source from the capacitor; and

close the fourth switch, thereby connecting the capacitor to the voltage detection circuit.

10 . A method comprising performing, with one or more controllers, operations including:

connecting a capacitor to a discharge network;

after a first time period, disconnecting the capacitor from the discharge network and applying a testing voltage to the capacitor;

after a second time period, disconnecting the testing voltage from the capacitor and connecting the capacitor to a voltage detection circuit;

measuring, at the voltage detection circuit, a voltage at the capacitor, as a measured voltage;

comparing the measured voltage against a threshold voltage; and

responsive to the comparing, determining whether the capacitor is connected or disconnected.

11 . The method of claim 10 , wherein the operations further include:

determining that the capacitor is disconnected when the measured voltage is below the threshold voltage; and

determining that the capacitor is connected when the measured voltage is above the threshold voltage.

12 . The method of claim 10 , wherein the operations further include:

disconnecting the testing voltage; and

subsequent to disconnecting the testing voltage, delaying the connecting of the capacitor to the voltage detection circuit for a third time period.

13 . The method of claim 10 , wherein the operations further include:

receiving, from the voltage detection circuit, a plurality of additional voltage measurements at the capacitor; and

detecting, based on the plurality of additional voltage measurements, a peak in the voltage at the capacitor.

14 . A system comprising:

a testing circuit configured to test a capacitor, the testing circuit comprising:

a testing voltage source configured to output a testing voltage to the capacitor;

a discharge network configured to dissipate power from the capacitor;

a voltage detection circuit configured to measure a voltage of the capacitor, as a measured voltage;

a first switch configured to connect the capacitor to a main circuit, wherein the main circuit is configured to operate independently from the testing circuit;

a second switch configured to connect the capacitor to the discharge network;

a third switch configured to connect the capacitor to the testing voltage source; and

a fourth switch configured to connect the capacitor to the voltage detection circuit; and

one or more controllers configured to (i) control an operation of the first switch, the second switch, the third switch, and the fourth switch to test the capacitor using the testing voltage source, the discharge network, and the voltage detection circuit and (ii) determine, from the measured voltage, whether the capacitor is connected to the testing circuit.

15 . The system of claim 14 , wherein the one or more controllers are further configured to:

control the operation of the second switch to be closed, thereby connecting the capacitor to the discharge network;

control the operation of the third switch to be closed, thereby applying the testing voltage to the capacitor; and

control the operation of the fourth switch to be closed, thereby connecting the capacitor to the voltage detection circuit.

16 . The system of claim 14 , wherein the one or more controllers are further configured to:

determine that the measured voltage is below a threshold; and

responsive to the determining that the measured voltage is below the threshold, determine that the capacitor is disconnected.

17 . The system of claim 14 , wherein the one or more controllers are further configured to:

determine that the measured voltage is above a threshold; and

responsive to the determining that the measured voltage is above the threshold, determine that the capacitor is connected.

18 . The system of claim 14 , wherein the one or more controllers are further configured to control the operation of the first switch to be closed, thereby connecting the capacitor to the main circuit.

19 . The system of claim 14 , wherein the one or more controllers are further configured to:

control the operation of the first switch to be open, thereby disconnecting the capacitor from the main circuit;

control the operation of the second switch to be closed, thereby applying the capacitor to the discharge network;

control the operation of the second switch to be open, thereby disconnecting the capacitor from the discharge network;

control the operation of the third switch to be closed, thereby applying the testing voltage source to the capacitor;

control the operation of the third switch to be closed, thereby disconnecting the testing voltage source from the capacitor; and

control the operation of the fourth switch to be closed, thereby connecting the capacitor to the voltage detection circuit.

20 . The system of claim 14 , further comprising:

a first resistor connected between the third switch and the testing voltage source;

a diode connected to the fourth switch; and

a second resistor connected between the fourth switch and the voltage detection circuit.

Assignments (2)
CHANGE OF NAME Recorded Sep 18, 2024
From: DELPHI TECHNOLOGIES IP LIMITED
To: BORGWARNER US TECHNOLOGIES LLC
Reel/Frame 068987/0367 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 9, 2024
From: NAIK, KARTHIK; NAVARRO, NOMEL CENTINO; MUTHURAMAN, BALASUBRAMANIAN
To: DELPHI TECHNOLOGIES IP LIMITED
Reel/Frame 066430/0041 →
Continuity (1)
Related Publication 20250224461A1 · Jul 10, 2025
References Cited (39)
US 2771992A · William et al. · 1956 [cited by applicant]
US 3521155A · Zdral · 1970 [cited by applicant]
US 3714571A · Walker · 1973 [cited by applicant]
US 3891917A · Harris · 1975 [cited by applicant]
US 4251767A · Montana · 1981 [cited by applicant]
US 4464605A · Ford, Jr. et al. · 1984 [cited by applicant]
US 4835513A · McCurdy et al. · 1989 [cited by applicant]
US 5294889A · Heep · 1994 [cited by examiner]
US 5798648A · Ueyama · 1998 [cited by examiner]
US 5936409A · Nishioka · 1999 [cited by examiner]
US 6356086B1 · Cook et al. · 2002 [cited by applicant]
US 6587050B2 · Owen · 2003 [cited by applicant]
US 6812712B2 · Linzey · 2004 [cited by applicant]
US 7042228B2 · Lally et al. · 2006 [cited by applicant]
US 7132835B1 · Arcus · 2006 [cited by applicant]
US 7145350B2 · Mellert · 2006 [cited by examiner]
US 7724000B2 · Grosjean et al. · 2010 [cited by applicant]
US 9013296B2 · Clarke · 2015 [cited by applicant]
US 10281512B2 · Conte et al. · 2019 [cited by applicant]
US 10739404B2 · Wandres et al. · 2020 [cited by applicant]
US 11346893B2 · Schnell et al. · 2022 [cited by applicant]
US 11467204B2 · Nuttgens et al. · 2022 [cited by applicant]
US 20140167809A1 · Sebald · 2014 [cited by examiner]
US 20180083527A1 · Fukuda et al. · 2018 [cited by applicant]
US 20180198460A1 · Bogner · 2018 [cited by examiner]
US 20210325463A1 · Katsumata · 2021 [cited by examiner]
US 20230236254A1 · Izutani et al. · 2023 [cited by applicant]
US 20230378879A1 · Ammanamanchi et al. · 2023 [cited by applicant]
CA 1080800A1 · 1980 [cited by applicant]
CN 104635082B · 2017 [cited by applicant]
CN 109655682B · 2021 [cited by applicant]
EP 1742076B1 · 2019 [cited by applicant]
GB 1358167A · 1974 [cited by applicant]
KR 20180080856A · 2018 [cited by applicant]
WO 2008074950A1 · 2008 [cited by applicant]
Chen, Yang, et al. “Driving control system of deep-sea in-situ test device.” 2018 IEEE International Conference on Mechatronics and Automation (ICMA). IEEE, Nov. 2018, <<https://www.researchgate.net/profile/Chen-Ming-44… [cited by applicant]
Yin, Leyi. Formal Verification and In-Situ Test of Analog and Mixed-SignalCircuits. Dissertation. Dec. 2012, <<https://oaktrust.library.tamu.edu/bitstream/handle/1969.1/151616/Yin,%20Leyi.pdf?sequence=1>>. [cited by applicant]
Hecker, Lori A., and Hugh J. Helbert. TMI-2 Cable/connection Program: a Look atin situ Test Data. No. GEND-INF-042. EG and G Idaho, Inc., Idaho Falls, ID (United States), Dec. 1983, <<https://www.osti.gov/servlets/purl/… [cited by applicant]
Zhu, Ying, Wenhua H. Zhu, and Bruce J. Tatarchuk. “In-Situ Dynamic Characterization of Energy Storage and Conversion Systems.” Chapter 10, Energy Storage-Technologies and Applications. IntechOpen, 2013, <<https://www.in… [cited by applicant]