IP Library Granted Patent US 12,655,322
Granted Patent B2
US 12,655,322 · App. 18/409,601 · Granted Jun 16, 2026

Functionalized carbon particle CMP slurry

Inventors: Arthur W. Martin (Hockessin, DE); Yi Guo (Newark, DE)
Assignee: DuPont Electronic Materials Holding, Inc.
C09G1/02C23F3/00
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Quick Facts
Patent No.
US 12,655,322
App. No.
18/409,601
Granted
Jun 16, 2026
Kind
B2
Abstract

The invention provides a chemical mechanical polishing solution for metal and metal nitride substrates. The polishing solution includes a solvent and functionalized carbon-based particles having oxygen-containing functional groups. The functionalized carbon-based particles having oxygen-containing functional groups react with a peroxy moiety to increase oxygen to carbon atomic ratio on the functionalized carbon-based particles. The functionalized carbon-based particles contain at least 10 weight percent of an sp3-containing structure, the functionalized carbon-based particles include at least 0.01 atomic percent oxygen and a surface of the functionalized carbon-based particles has an atomic oxygen to carbon ratio of at least 0.01.

Claims (12)

1 . A chemical mechanical polishing solution for metal and metal nitride substrates comprising:

a solvent; and

functionalized carbon-based particles having oxygen-containing functional groups, the functionalized carbon-based particles having oxygen-containing functional groups react with a peroxy moiety to increase oxygen to carbon atomic ratio on the functionalized carbon-based particles, the functionalized carbon-based particles containing at least 10 weight percent of an sp3-containing structure, wherein the functionalized carbon-based particles include at least 0.01 atomic percent oxygen and wherein a surface of the functionalized carbon-based particles has an atomic oxygen to carbon ratio of at least 0.01.

2 . The polishing solution of claim 1 wherein the polishing solution includes a corrosion inhibitor for the metal or the metal nitride.

3 . The polishing solution of claim 1 wherein the surface of the functionalized carbon-based particles includes a graphene, graphite, amorphous carbon or a mixture thereof.

4 . The polishing solution of claim 1 wherein the oxygen-containing functional group is a COOH and its salts, COOOH and its salts, OH—, ketone, oxirane or a combination thereof.

5 . The polishing solution of claim 4 wherein the functionalized carbon-based particles also include an amine (NH 2 ) group, sulfonate (SO 3 ) group or hydrocarbon (C—H) groups.

6 . The polishing solution of claim 1 wherein the metal and metal nitride is selected from the group consisting of cobalt, copper, molybdenum, tungsten, titanium nitride and tantalum nitride.

7 . The polishing solution of claim 1 wherein the polishing solution includes hydrogen peroxide as the peroxy moiety.

8 . The polishing solution of claim 1 wherein the polishing solution includes a Fenton's catalyst or reagent.

9 . The polishing solution of claim 1 wherein the polishing solution is iron free and contains less than contained less than 0.01 μM hydroxyl radical.

10 . The polishing solution of claim 1 wherein the functionalized carbon-based particles contain at least 30 weight percent sp3-containing structure.

Assignments (2)
CHANGE OF NAME Recorded Oct 29, 2024
From: ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC.
To: DUPONT ELECTRONIC MATERIALS HOLDING, INC.
Reel/Frame 069274/0160 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 20, 2024
From: MARTIN, ARTHUR W; GUO, YI
To: ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC.
Reel/Frame 066497/0413 →