IP Library Granted Patent US 12,532,594
Granted Patent B2
US 12,532,594 · App. 18/425,644 · Granted Jan 20, 2026

Monolithic segmented LED array architecture with islanded epitaxial growth

Inventors: Ashish Tandon (Sunnyvale, CA); Rajat Sharma (San Jose, CA); Joseph Flemish (Palo Alto, CA); Andrei Papou (San Jose, CA); Wen Yu (Pleasanton, CA); Erik William Young (San Jose, CA); Yu-Chen Shen (San Jose, CA); Luke Gordon (Santa Barbara, CA)
Assignee: Adeia Semiconductor Inc.
H10H29/142F21S41/153H01S5/00H10H20/01335H10H20/819H10H20/8242H10H20/8512H10H20/8514H10H20/8515H10H20/018H10H20/032H10H20/0361H10H20/813H10H20/825H10H20/83
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Quick Facts
Patent No.
US 12,532,594
App. No.
18/425,644
Granted
Jan 20, 2026
Kind
B2
Abstract

A device may include a metal contact between a first isolation region and a second isolation region on a first surface of an epitaxial layer. The device may include a first sidewall and a second sidewall on a second surface of the epitaxial layer distal to the first isolation region and the second isolation region. The device may include a wavelength converting layer on the epitaxial layer between the first sidewall and the second sidewall.

Claims (32)

1 . A light emitting diode device comprising:

a first semiconductor layer having a first surface and an opposing second surface, an active region on the first surface of the first semiconductor layer, and a second semiconductor layer on the active region;

a trench extending from a first surface of the second semiconductor layer, through the active region, and at least partially through the first semiconductor layer that electrically isolates a plurality of light emitting regions;

a first metal contact extending from the first surface of the second semiconductor layer to the first semiconductor layer and directly connecting to a sidewall of the first semiconductor layer;

a second metal contact to the second semiconductor layer;

a passivation layer that isolates the first metal contact from the second semiconductor layer, the active region, and the second metal contact; and

a wavelength converting layer on the second surface of the first semiconductor layer.

2 . The light emitting diode device of claim 1 , wherein the first metal contact is an n-type contact.

3 . The light emitting diode device of claim 1 , wherein the first semiconductor layer comprises an 9 -type semiconductor layer.

4 . The light emitting diode device of claim 1 , wherein the first semiconductor layer comprises an n-type semiconductor layer.

5 . The light emitting diode device of claim 1 , wherein the second semiconductor layer comprises a p-type semiconductor layer.

6 . The light emitting diode device of claim 1 , wherein the active region comprises a partially doped or undoped Type III-nitride material.

7 . The light emitting diode device of claim 1 , further comprising at least one dielectric layer on the second metal contact.

8 . The light emitting diode device of claim 7 , further comprising a metal layer on the at least one dielectric layer.

9 . The light emitting diode device of claim 8 , further comprising a reflective layer on the metal layer.

10 . The light emitting diode device of claim 9 , wherein the reflective layer is a contact.

11 . A light emitting diode device comprising;

a first semiconductor layer having a first surface and an opposing second surface, an active region on the first surface of the first semiconductor layer, and a second semiconductor layer on the active region;

a trench extending from a first surface of the second semiconductor layer, through the active region, and completely through the first semiconductor layer that electrically isolates a plurality of light emitting regions;

a first metal contact extending from the first surface of the second semiconductor layer to the first semiconductor layer and electrically connecting to a sidewall of the first semiconductor layer;

a second metal contact to the second semiconductor layer;

a passivation layer that isolates the first metal contact from the second semiconductor layer, the active region, and the second metal contact; and

a wavelength converting layer on the second surface of the first semiconductor layer.

12 . The light emitting diode device of claim 11 , wherein the first metal contact is an n-type contact and the second metal contact is a p-type contact.

13 . The light emitting diode device of claim 11 , wherein the first semiconductor layer comprises an n-type semiconductor layer.

14 . The light emitting diode device of claim 11 , wherein the second semiconductor layer comprises a p-type semiconductor layer.

15 . The light emitting diode device of claim 11 , wherein the active region comprises a partially doped or undoped Type III-nitride material.

16 . The light emitting diode device of claim 11 , further comprising at least one dielectric layer on the second metal contact.

17 . The light emitting diode device of claim 16 , further comprising a metal layer on the at least one dielectric layer.

18 . The light emitting diode device of claim 17 , further comprising a reflective layer on the metal layer.

19 . The light emitting diode device of claim 18 , wherein the reflective layer is a contact.

20 . The light emitting diode device of claim 11 , wherein the sidewall of the first semiconductor layer is at least partially free of a dielectric material.

Assignments (3)
PATENT SECURITY AGREEMENT SUPPLEMENT Recorded Jul 24, 2025
From: ADEIA SEMICONDUCTOR INC.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 072281/0565 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 24, 2025
From: LUMILEDS LLC
To: ADEIA SEMICONDUCTOR INC.
Reel/Frame 070936/0940 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 30, 2024
From: TANDON, ASHISH; SHARMA, RAJAT; FLEMISH, JOSEPH; PAPOU, ANDREI; YU, WEN; YOUNG, ERIK WILLIAM; SHEN, YU-CHEN; GORDON, LUKE
To: LUMILEDS LLC
Reel/Frame 066287/0739 →
Priority Claims (1)
EP 18159747 · Mar 2, 2018 · regional
Continuity (4)
Division 18156747 · Jan 19, 2023
Continuation 16226288 · Dec 19, 2018
Provisional Application 62608316 · Dec 20, 2017
Related Publication 20240194723A1 · Jun 13, 2024
References Cited (196)
US 6410942B1 · Thibeault et al. · 2002 [cited by applicant]
US 6657236B1 · Thibeault et al. · 2003 [cited by applicant]
US 6821804B2 · Thibeault et al. · 2004 [cited by applicant]
US 7943406B2 · Slater, Jr. et al. · 2011 [cited by applicant]
US 8222811B2 · Vaufrey et al. · 2012 [cited by applicant]
US 8258044B2 · Brun et al. · 2012 [cited by applicant]
US 8487340B2 · Gilet et al. · 2013 [cited by applicant]
US 8638032B2 · Maindron et al. · 2014 [cited by applicant]
US 8647957B2 · Borowik et al. · 2014 [cited by applicant]
US 8697548B2 · Borowik et al. · 2014 [cited by applicant]
US 8698396B2 · Maindron et al. · 2014 [cited by applicant]
US 8754426B2 · Marx et al. · 2014 [cited by applicant]
US 8890111B2 · Templier et al. · 2014 [cited by applicant]
US 8969900B2 · Sabathil et al. · 2015 [cited by applicant]
US 9093607B2 · Gilet et al. · 2015 [cited by applicant]
US 9109296B2 · Metaye et al. · 2015 [cited by applicant]
US 9112112B2 · Do et al. · 2015 [cited by applicant]
US 9192290B2 · Spinnler et al. · 2015 [cited by applicant]
US 9209366B2 · Maindron et al. · 2015 [cited by applicant]
US 9263633B2 · Gilet et al. · 2016 [cited by applicant]
US 9396970B2 · Gillot et al. · 2016 [cited by applicant]
US 9422628B2 · Simonato et al. · 2016 [cited by applicant]
US 9496465B2 · Sugimoto et al. · 2016 [cited by applicant]
US 9507204B2 · Pelka et al. · 2016 [cited by applicant]
US 9601542B2 · Robin et al. · 2017 [cited by applicant]
US 9722160B2 · Nakabayashi · 2017 [cited by applicant]
US 9768350B2 · Bavencove et al. · 2017 [cited by applicant]
US 9859330B2 · Von Malm et al. · 2018 [cited by applicant]
US 9887184B2 · Takeya et al. · 2018 [cited by applicant]
US 9945526B2 · Singer et al. · 2018 [cited by applicant]
US 9978727B2 · Takeya et al. · 2018 [cited by applicant]
US 9997688B2 · Takeya et al. · 2018 [cited by applicant]
US 10002928B1 · Raring et al. · 2018 [cited by applicant]
US 10018325B2 · Kim et al. · 2018 [cited by applicant]
US 10050026B2 · Takeya et al. · 2018 [cited by applicant]
US 10068884B2 · Takeya et al. · 2018 [cited by applicant]
US 10145518B2 · Do et al. · 2018 [cited by applicant]
US 11961875B2 · Tandon et al. · 2024 [cited by applicant]
US 20020139987A1 · Collins, III et al. · 2002 [cited by applicant]
US 20030127658A1 · Sheu et al. · 2003 [cited by applicant]
US 20070206130A1 · Wuu et al. · 2007 [cited by applicant]
US 20080099787A1 · Coolbaugh et al. · 2008 [cited by applicant]
US 20080173884A1 · Chitnis et al. · 2008 [cited by applicant]
US 20080179602A1 · Negley et al. · 2008 [cited by applicant]
US 20100078656A1 · Seo et al. · 2010 [cited by applicant]
US 20110151607A1 · Landis et al. · 2011 [cited by applicant]
US 20110180776A1 · Gilet et al. · 2011 [cited by applicant]
US 20110287606A1 · Brun et al. · 2011 [cited by applicant]
US 20120037885A1 · Schardt et al. · 2012 [cited by applicant]
US 20120050694A1 · Huang · 2012 [cited by examiner]
US 20120091481A1 · Sekine · 2012 [cited by examiner]
US 20120119237A1 · Leatherdale et al. · 2012 [cited by applicant]
US 20120205614A1 · Templier · 2012 [cited by examiner]
US 20130020115A1 · Mataye et al. · 2013 [cited by applicant]
US 20130112945A1 · Gilet et al. · 2013 [cited by applicant]
US 20130256708A1 · Jin et al. · 2013 [cited by applicant]
US 20140077156A1 · Bavencove et al. · 2014 [cited by applicant]
US 20140094878A1 · Gossler et al. · 2014 [cited by applicant]
US 20140138719A1 · Maindron et al. · 2014 [cited by applicant]
US 20140193931A1 · Basin et al. · 2014 [cited by applicant]
US 20150118544A1 · Oukassi · 2015 [cited by applicant]
US 20150144590A1 · Simonato et al. · 2015 [cited by applicant]
US 20150228873A1 · Gebuhr et al. · 2015 [cited by applicant]
US 20150280060A1 · Gilet et al. · 2015 [cited by applicant]
US 20150380461A1 · Robin et al. · 2015 [cited by applicant]
US 20160079565A1 · Maindron et al. · 2016 [cited by applicant]
US 20160190400A1 · Jung et al. · 2016 [cited by applicant]
US 20160218240A1 · Bouvier et al. · 2016 [cited by applicant]
US 20160240735A1 · Moran et al. · 2016 [cited by applicant]
US 20160293811A1 · Hussell et al. · 2016 [cited by applicant]
US 20160336483A1 · Shatalov et al. · 2016 [cited by applicant]
US 20170080457A1 · Eymery et al. · 2017 [cited by applicant]
US 20170098746A1 · Bergmann et al. · 2017 [cited by applicant]
US 20170137645A1 · Manceau et al. · 2017 [cited by applicant]
US 20170186612A1 · Almadori et al. · 2017 [cited by applicant]
US 20170243860A1 · Hong et al. · 2017 [cited by applicant]
US 20170250329A1 · Takeya et al. · 2017 [cited by applicant]
US 20170293065A1 · Kim · 2017 [cited by applicant]
US 20170294417A1 · Edmond et al. · 2017 [cited by applicant]
US 20170294418A1 · Edmond · 2017 [cited by examiner]
US 20170309794A1 · Von Malm · 2017 [cited by applicant]
US 20170358563A1 · Cho et al. · 2017 [cited by applicant]
US 20170358724A1 · Shichijo et al. · 2017 [cited by applicant]
US 20180017939A1 · Allier et al. · 2018 [cited by applicant]
US 20180019369A1 · Cho et al. · 2018 [cited by applicant]
US 20180019373A1 · Lehnhardt et al. · 2018 [cited by applicant]
US 20180061316A1 · Shin et al. · 2018 [cited by applicant]
US 20180074372A1 · Takeya et al. · 2018 [cited by applicant]
US 20180090540A1 · Von Malm et al. · 2018 [cited by applicant]
US 20180138157A1 · Im et al. · 2018 [cited by applicant]
US 20180145059A1 · Welch · 2018 [cited by examiner]
US 20180149328A1 · Cho et al. · 2018 [cited by applicant]
US 20180156406A1 · Feil et al. · 2018 [cited by applicant]
US 20180166470A1 · Chae · 2018 [cited by applicant]
US 20180174519A1 · Kim et al. · 2018 [cited by applicant]
US 20180174931A1 · Henley · 2018 [cited by applicant]
US 20180210282A1 · Song et al. · 2018 [cited by applicant]
US 20180238511A1 · Hartmann et al. · 2018 [cited by applicant]
US 20180259137A1 · Lee et al. · 2018 [cited by applicant]
US 20180259570A1 · Henley · 2018 [cited by applicant]
US 20180272605A1 · Gmeinwieser · 2018 [cited by examiner]
US 20180283642A1 · Liao · 2018 [cited by examiner]
US 20180297510A1 · Fiederling et al. · 2018 [cited by applicant]
US 20180339643A1 · Kim · 2018 [cited by applicant]
US 20180339644A1 · Kim · 2018 [cited by applicant]
US 20180354406A1 · Park · 2018 [cited by applicant]
US 20180371315A1 · Hofmann et al. · 2018 [cited by applicant]
US 20190189682A1 · Young · 2019 [cited by examiner]
US 20190198564A1 · Tandon · 2019 [cited by examiner]
US 20240194723A1 · Tandon · 2024 [cited by examiner]
DE 102010051286A1 · 2012 [cited by applicant]
DE 102012109460A1 · 2014 [cited by applicant]
DE 102014112551A1 · 2016 [cited by applicant]
EP 1378949A1 · 2004 [cited by applicant]
EP 2006921A1 · 2008 [cited by applicant]
EP 2027608A1 · 2009 [cited by applicant]
EP 2203939A1 · 2010 [cited by applicant]
EP 2211387A2 · 2010 [cited by applicant]
EP 2339658A2 · 2011 [cited by applicant]
EP 2491591A1 · 2012 [cited by applicant]
EP 2499958A1 · 2012 [cited by applicant]
EP 2521161A1 · 2012 [cited by applicant]
EP 2521162A1 · 2012 [cited by applicant]
EP 2553149A1 · 2013 [cited by applicant]
EP 2617069A1 · 2013 [cited by applicant]
EP 2674516A1 · 2013 [cited by applicant]
EP 2855744B1 · 2016 [cited by applicant]
EP 3053199A1 · 2016 [cited by applicant]
EP 3144272A1 · 2017 [cited by applicant]
EP 3410002A1 · 2018 [cited by applicant]
EP 3410003A1 · 2018 [cited by applicant]
EP 2710634B1 · 2020 [cited by applicant]
FR 2952366A1 · 2011 [cited by applicant]
FR 2964796A1 · 2012 [cited by applicant]
FR 2969995A1 · 2012 [cited by applicant]
FR 2972815A1 · 2012 [cited by applicant]
FR 2974940A1 · 2012 [cited by applicant]
FR 2974941A1 · 2012 [cited by applicant]
FR 2975532A1 · 2012 [cited by applicant]
FR 2991342A1 · 2013 [cited by applicant]
FR 2991999A1 · 2013 [cited by applicant]
FR 2998090A1 · 2014 [cited by applicant]
FR 3011383A1 · 2015 [cited by applicant]
FR 3041274A1 · 2017 [cited by applicant]
FR 3046155A1 · 2017 [cited by applicant]
FR 3052915A1 · 2017 [cited by applicant]
JP 2004505434A · 2004 [cited by applicant]
JP 2011501881A · 2011 [cited by applicant]
JP 4778107B1 · 2011 [cited by applicant]
JP 2012059824A · 2012 [cited by applicant]
JP 2013501357A · 2013 [cited by applicant]
JP 2013542616A · 2013 [cited by applicant]
JP 2015061010A · 2015 [cited by applicant]
JP 2015156431A · 2015 [cited by applicant]
JP 2016027637A · 2016 [cited by applicant]
JP 2016066765A · 2016 [cited by applicant]
JP 2016518713A · 2016 [cited by applicant]
JP 2016535434A · 2016 [cited by applicant]
JP 2017139481A · 2017 [cited by applicant]
JP 2017526180A · 2017 [cited by applicant]
KR 20140118466A · 2014 [cited by applicant]
KR 20170018687A · 2017 [cited by applicant]
KR 20180010670A · 2018 [cited by applicant]
KR 20180114413A · 2018 [cited by applicant]
TW 201417339A · 2014 [cited by applicant]
TW 201620163A · 2016 [cited by applicant]
WO 2010123809A2 · 2010 [cited by applicant]
WO 2011045289A1 · 2011 [cited by applicant]
WO 2011048318A1 · 2011 [cited by applicant]
WO 2012035243A1 · 2012 [cited by applicant]
WO 2012156620A2 · 2012 [cited by applicant]
WO 2013182969A1 · 2013 [cited by applicant]
WO 2015044620A1 · 2015 [cited by applicant]
WO 2016079505A1 · 2016 [cited by applicant]
WO 2017045995A1 · 2017 [cited by applicant]
WO 2017068029A1 · 2017 [cited by applicant]
WO 2017089676A1 · 2017 [cited by applicant]
WO 2017102708A1 · 2017 [cited by applicant]
WO WO2017184686A · 2017 [cited by applicant]
WO 2017216445A1 · 2017 [cited by applicant]
WO 2018091657A1 · 2018 [cited by applicant]
WO 2018139866A1 · 2018 [cited by applicant]
WO 2018143682A1 · 2018 [cited by applicant]
WO 2018159977A1 · 2018 [cited by applicant]
WO 2018169243A1 · 2018 [cited by applicant]
WO 2019126539A · 2019 [cited by applicant]
“European Search Report dated Aug. 29, 2018 from European Application No. 18159072, 14 pages.” [cited by applicant]
“European Search Report dated September 3, 208 from European Application No. 18159747, 7 pages.” [cited by applicant]
“Non-Final Office Action in U.S. Appl. No. 16/226,239, mailed on Aug. 3, 2020, 15 pages”. [cited by applicant]
“Office Action of the Intellectual Property Office of Taiwan in Application 107146241, mailed on Dec. 26, 2019, 4 pages (with English Translation)”. [cited by applicant]
“Office Action of the Intellectual Property Office of Taiwan in Application 107146268, mailed on Feb. 19, 2020, 2 pages (with English Translation)”. [cited by applicant]
“PCT International Search Report and Written Opinion in PCT/US2018/066862 dated Mar. 14, 2019, 15 pages”. [cited by applicant]
“PCT International Search Report and Written Opinion in PCT/US2018/066865 dated Mar. 11, 2019, 10 pages”. [cited by applicant]
“PCT PCT International Preliminary Report on Patentability in PCT/US2018/066862 dated Jul. 2, 2020, 10 pages”. [cited by applicant]
Chen et al., “Monolithic Red/Green/Blue Micro-LEDs With HBR and DBR Structures”, IEEE Pohotonics Technology Letters, vol. 30, No. 3, pp. 262-265. [cited by applicant]
Tao et al., “Hybrid Cyan Nitride/Red Phosphors White Light-Emitting Diodes With Micro-Hole Structures”, IEEE Photonics Journal, 2018, vol. 10, No. 5, pp. 8201608. [cited by applicant]